• 제목/요약/키워드: Atomic Resolution

검색결과 372건 처리시간 0.029초

고분해능 전자현미경법을 이용한 (Bi, La)4Ti3O12 박막의 결정학적 특성 평가 (Crystallographic Characterization of the (Bi, La)4Ti3O12 Film by High-Resolution Electron Microscopy)

  • 이덕원;양준모;박태수;김남경;염승진;박주철;이순영;박성욱
    • 한국재료학회지
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    • 제13권7호
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    • pp.478-483
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    • 2003
  • The crystallographic characteristics of the $(Bi, La)_4$$Ti_3$$O_{12}$ thin film, which is considered as an applicable dielectrics in the ferroelectric RAM device due to a low crystallization temperature and a good fatigue property, were investigated at the atomic scale by high resolution transmission electron microscopy and the high resolution Z-contrast technique. The analysis showed that a (00c) preferred orientation and a crystallization of the film were enhanced with the diffraction intensity increase of the (006) and (008) plane as the annealing temperature increased. It indicated a change of the atomic arrangement in the (00c) plane. Stacking faults on the (00c) plane were also observed. Through the comparison of the high-resolution Z-contrast image and the $Bi_4$$Ti_3$$O_{12}$ atomic model, it was evaluated that the intensity of the Bi atom was different according to the atomic plane, and it was attributed to a substitution of La atom for Bi at the specific atom position.

원자 현미경 장비의 바닥 진동(정상 상태) 허용 기준 결정 (Determination of the Allowable Vibration Level of the Atomic Force Microscope Equipment)

  • 이동연
    • 한국소음진동공학회:학술대회논문집
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    • 한국소음진동공학회 2000년도 추계학술대회논문집
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    • pp.161-164
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    • 2000
  • Currently, Atomic Force Microscope(AFM) has been widely used to measure the surface topography of a sample by detecting interaction force between atoms on the sample and extremely sharp probe tip. The vertical resolution of AFM is mainly determined by external vibration noise. The resolution of AFM shows different values for the different environment, thus it is necessary to determine relationship between the criteria and the resolution of AFM regardless of environment. In this paper, we discuss the allowable level of floor vibration for AFM equipment at given resolution. The vibration criteria can be used as reference data to design mechanical structure and to analyze the structural dynamics of AFM equipment.

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AFM용 수정진동자 진동폭의 직접 측정 기술 (Direct measurement technique of the oscillation amplitude of a quartz tuning fork in atomic force microscopy)

  • 김정회;한해욱
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2006년도 하계종합학술대회
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    • pp.645-646
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    • 2006
  • The oscillation amplitude of a probe tip is an important parameter to determine the resolution of atomic force microscopy (AFM) techniques. In this work, we introduce a new method for the measurement of the oscillation amplitude of a quartz tuning fork tip sub-nanometer resolution.

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The design of a scintillation system based on SiPMs integrated with gain correction functionality

  • Lin, Zhenhua;Hautefeuille, Benoit;Jung, Sung-Hee;Moon, Jinho;Park, Jang-Guen
    • Nuclear Engineering and Technology
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    • 제52권1호
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    • pp.164-169
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    • 2020
  • Use of SiPM has been considered as an alternative to PMT, because of its compact size, low-operating voltage, non-sensitive to electromagnetic, low costs and so on. The main limitation for the use of SiPM is due to its small sensitive area compared to PMT that limits the light collection, and therefore the sensor energy resolution. In this article we studied the effect of increasing the number of SiPM by connecting them in parallel to increase the active detection area. This allowed us to compare the different energy resolution measurements. 137Cs has been selected as reference to study the energy resolution for 662 keV gamma-rays. Another investigation was to compare the minimum detectable gamma energy under various SiPM configurations. It has been found that the use of 4 SiPM arrays can greatly improve the energy resolution up to 4% than only one SiPM array, meanwhile use of more than 2 SiPM arrays does not increase the energy resolution significantly. Thus we can conclude that for a large area of cylindrical scintillator (3 × 3 inches), the use of SiPMs are limited to a certain number or certai active area depending on the commercial SiPMs, and its cost should be less than traditional PMT for the cost-effective and compact size considerations. It is well known that the gain of SiPM varies with temperature. In this article, we also calibrated gain to guarantee the same position of photoelectric peak in response of different temperatures.

DEVELOPMENT OF LEAD SLOWING DOWN SPECTROMETER FOR ISOTOPIC FISSILE ASSAY

  • Lee, YongDeok;Park, Chang Je;Ahn, Sang Joon;Kim, Ho-Dong
    • Nuclear Engineering and Technology
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    • 제46권6호
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    • pp.837-846
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    • 2014
  • A lead slowing down spectrometer (LSDS) is under development for analysis of isotopic fissile material contents in pyro-processed material, or spent fuel. Many current commercial fissile assay technologies have a limitation in accurate and direct assay of fissile content. However, LSDS is very sensitive in distinguishing fissile fission signals from each isotope. A neutron spectrum analysis was conducted in the spectrometer and the energy resolution was investigated from 0.1eV to 100keV. The spectrum was well shaped in the slowing down energy. The resolution was enough to obtain each fissile from 0.2eV to 1keV. The detector existence in the lead will disturb the source neutron spectrum. It causes a change in resolution and peak amplitude. The intense source neutron production was designed for ~E12 n's/sec to overcome spent fuel background. The detection sensitivity of U238 and Th232 fission chamber was investigated. The first and second layer detectors increase detection efficiency. Thorium also has a threshold property to detect the fast fission neutrons from fissile fission. However, the detection of Th232 is about 76% of that of U238. A linear detection model was set up over the slowing down neutron energy to obtain each fissile material content. The isotopic fissile assay using LSDS is applicable for the optimum design of spent fuel storage to maximize burnup credit and quality assurance of the recycled nuclear material for safety and economics. LSDS technology will contribute to the transparency and credibility of pyro-process using spent fuel, as internationally demanded.

산업용 SPECT의 검출기 개수가 영상 해상도에 미치는 영향 평가 (Effect of the Number of Detectors on Performance of Industrial SPECT)

  • 박장근;김찬형;김종범;문진호;정성희
    • 방사선산업학회지
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    • 제5권4호
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    • pp.325-330
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    • 2011
  • To predict the details of flow in industrial process unit, single photon emission computed tomography (SPECT) is a promising technique. Recently, industrial SPECT based on medical system has developed by researchers of the Korea Atomic Energy Research Institute (KAERI) and Hanyang University. In the present study, to confirm the effect of the number of detectors on image quality, and determine the optimal number of detectors in industrial SPECT, industrial SPECT system with various geometries were evaluated by the Monte Carlo simulation. CsI(Tl) detectors ($12mm{\times}12mm{\times}20mm$) with collimators (the geometric resolution of collimator $R_g$ was 4 cm at the center of the 30 cm diameter cylindrical vessel object) were modeled in a hexagonal array, and the point sources of $^{99m}Tc$, $^{68}Ga$, and $^{137}Cs$ were simulated at the center of the cylindrical vessel object using the MCNPX code. Then, the reconstruction images of each geometry were reconstructed using the expectation maximization (EM) algorithm. In this study, the reciprocity theorem was used to improve computation time required for system matrix of the EM algorithm. The result shows that the resolution of the reconstructed image was significantly improved by increasing the number of detectors in industrial SPECT system and more than 60 detectors will be required for the resolution of the reconstructed image.

후집속 방법을 이용한 에어로졸 TOF 질량분석기의 질량분해능 향상 연구 (Study on increasing the mass resolution in aerosol TOF mass spectrometer by using post focusing method)

  • 김덕현;양기호;차형기;김도훈;이상천
    • 분석과학
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    • 제18권6호
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    • pp.483-490
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    • 2005
  • TOF 비행시간을 이용한 에어로졸 질량분석기에서 질량분석기의 분해능은 발생하는 이온의 초기에너지와 이온이 움직이는 진행방향에 따라 달라진다. 고출력 펄스형 레이저에 의하여 에어로졸로부터 용발되어 이온화된 원소들은 다른 속도로 사방으로 퍼져 나가게 되어 분해능 저하를 초래하는데 이를 방지하기 위해서 1차 가속된 이온들을 서로 다른 에너지로 후집속하여 같은 시간에 이온센서에 도달하도록 하는 장치에 대하여 연구를 수행하였다. 후집속 전위를 $90^{\circ}$ 방향으로 진행하는 이온을 중심으로 서로 다른 방향으로 걸어 줌으로써 TOF 영역을 지나 센서로 도입되는 이온의 도착 시간이 크게 개선되었음을 알 수 있었으며, 이를 실증하기 위하여 레이저 유도 이온을 만들고 후집속 장치를 구성하여 최적의 시간지연시간 및 전압 조건을 도출하여 그 성능을 증가시켰다.

Applications of Scanning Electrochemical Microscopy (SECM) Coupled to Atomic Force Microscopy with Sub-Micrometer Spatial Resolution to the Development and Discovery of Electrocatalysts

  • Park, Hyun S.;Jang, Jong Hyun
    • Journal of Electrochemical Science and Technology
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    • 제7권4호
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    • pp.316-326
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    • 2016
  • Development and discovery of efficient, cost-effective, and robust electrocatalysts are imperative for practical and widespread implementation of water electrolysis and fuel cell techniques in the anticipated hydrogen economy. The electrochemical reactions involved in water electrolysis, i.e., hydrogen and oxygen evolution reactions, are complex inner-sphere reactions with slow multi-electron transfer kinetics. To develop active electrocatalysts for water electrolysis, the physicochemical properties of the electrode surfaces in electrolyte solutions should be investigated and understood in detail. When electrocatalysis is conducted using nanoparticles with large surface areas and active surface states, analytical techniques with sub-nanometer resolution are required, along with material development. Scanning electrochemical microscopy (SECM) is an electrochemical technique for studying the surface reactions and properties of various types of electrodes using a very small tip electrode. Recently, the morphological and chemical characteristics of single nanoparticles and bio-enzymes for catalytic reactions were studied with nanometer resolution by combining SECM with atomic force microscopy (AFM). Herein, SECM techniques are briefly reviewed, including the AFM-SECM technique, to facilitate further development and discovery of highly active, cost-effective, and robust electrode materials for efficient electrolysis and photolysis.