Study of plasma induced charging damage and febrication of$0.18\mu\textrm{m}$ dual polysilicon gate using dry etch
(건식각을 이용한 $0.18\mu\textrm{m}$ dual polysilicon gate 형성 및 plasma damage 특성 평가)
-
- Journal of the Korean Vacuum Society
- /
- v.8 no.4A
- /
- pp.490-495
- /
- 1999