• Journal of the Korean Institute of Telematics and Electronics B
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• v.31B no.7
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• pp.42-48
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• 1994

In this paper, a low power and high speed flash Analog-to-Digital Converter using current-mode concept is proposed. Current-mode approach offers a number of advantages over conventional voltage-mode approach, such as lower power consumption small chip area improved accuracy etc. Rescently this concept was applied to algorithmic A/D Converter. But, its conversion speed is limited to medium speed. Consequently this converter is not applicable to the high speed signal processing system. This ADC is fabricated in 1.2um double metal CMOS standard process. This ADC's conversion time is measured to be 7MHz, and power consumption is 2.0mW, and differential nonlinearity is less than 1.14LSB and total harmonic distortion is -50dB. The active area of analog chip is about 350 x 550u$m^2$. The proposed ADC seems suitable for a single chip design of digital signal processing system required high conversion speed, high resolution small chip area and low power consumption.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.15 no.6
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• pp.567-572
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• 2004

This paper shudies an automatic gain control(AGC) algorithm used in wireless communication cellular systems. The AGC design includes the selection of the appropriate analog-to-digital converter(ADC) and keeping the input power to the ADC constant to minimize the quantization noise generated from the analog-to-digital conversion process. In this paper the process to determine the required precision or the An is illustrated and the method to set the design parameters of the AGC is proposed. And the validity of the proposed algorithm is verified by computer simulation.

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.8
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• pp.1255-1259
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• 1990

A new ripple analog-to-digital converter (ADC) has been developed. It consists of two parallel ADCs and a switching network. The circuit operates on the analog input signal in two serial steps. First, a coarse conversion is made to determine the most significant bits by the first parallel ADC. The resultant bits control the switching network to connect a series resistor segment, within which the analog signal is contained, to the second parallel ADC. At second step, a fine conversion is made to determine the least significant bits by the second parallel ADC. The circuit requires 2(2\ulcorner\ulcorner1) comparators, 2(2\ulcorner\ulcorner resistors, and 2(2\ulcorner\ulcorner swithches for N-bit resolution.

• Proceedings of the KIEE Conference
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• 1988.07a
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• pp.571-573
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• 1988

A new ripple analog-to-digital converter(ADC) has been developed. It consists of two parallel ADCs and a switching network. The circuit operates on the input signal in two serial steps. First a coarse conversion is made to determine the most significant bits by the first parallel ADC. The results control a switching network to connect the series resistor segment, the analog signal is contained within, to the second parallel ADC. At second step, a fine conversion is made to determine the least signification bits by the second parallel ADC. The circuit requires 2(2$\frac{N}{2}$) comparators, 2(2$\frac{N}{2}$) resistors, and 2(2$\frac{N}{2}$) switches for N-bit resolution.

• Journal of IKEEE
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• v.9 no.1 s.16
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• pp.65-71
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• 2005

Physical signals generated in the real world are transformed into electrical signals through sensors and fed into electronic circuits. The electrical signals input to electronic circuits are in analog form, thus they must be converted to digital signals using an ADC(Analog-Digital Converter) for digital processing. Signal processing circuits and ADCs that are to be integrated on a single chip together with silicon micro sensors should be designed to have less silicon area and less power consumption. This paper proposed a charge redistribution ADC which reduces silicon area considerably. The proposed method achieves 8 bit conversion by performing 4-bit conversion twice. It reduced the area of capacitor array, which takes most of the ADC area, by 1/16 when compared to a conventional method. Though it uses twice the number of clocks as a conventional method, it would be appropriate to be integrated with a silicon pressure sensor on a single chip since it does not demand high conversion rate.

• JSTS:Journal of Semiconductor Technology and Science
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• v.17 no.3
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• pp.387-400
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• 2017

A new junction-splitting based SAR ADC with a redundant searching capacitor array structure in $0.13{\mu}m$ CMOS process to alleviate capacitor mismatch effects, is presented. The normalized average power has a factor of 0.35 to the conventional SAR ADC at 10-bit conversion accuracy. Statistical experiments show the number of missing codes resulting from the mismatch reduces by 95% for 3% unit-capacitor mismatch ratio, while keeping the conversion energy to that of the conventional JS capacitor array.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.88-90
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• 2012

This paper describes a 10-bit 10-MS/s asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) with a rail-to-rail input range. The proposed SAR ADC consists of a capacitor digital-analog converter (DAC), a SAR logic and a comparator. To reduce the frequency of an external clock, the internal clock which is asynchronously generated by the SAR logic and the comparator is used. The time-domain comparator with a offset calibration technique is used to achieve a high resolution. To reduce the power consumption and area, a split capacitor-based differential DAC is used. The designed asynchronous SAR ADC is fabricated by using a 0.18 um CMOS process, and the active area is $420{\times}140{\mu}m^2$. It consumes the power of 0.818 mW with a 1.8 V supply and the FoM is 91.8 fJ/conversion-step.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.19 no.9
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• pp.800-807
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• 2006

To enhance the conversion speed more fast, we separate the determination process of MSB and LSB with the two independent ADC circuits of the Incremental Sigma Delta ADC. After the 1st Incremental Sigma Delta ADC conversion finished, the 2nd Incremental Sigma Delta ADC conversion start while the 1st Incremental Sigma Delta ADC work on the next input. By determining the MSB and the LSB independently, the ADC conversion speed is improved by two times better than the conventional Extended Counting Incremental Sigma Delta ADC. In processing the 2nd Incremental Sigma Delta ADC, the inverting sample/hold circuit inverts the input the 2nd Incremental Sigma Delta ADC, which is the output of switched capacitor integrator within the 1st Incremental Sigma Delta ADC block. The increased active area is relatively small by the added analog circuit, because the digital circuit area is more large than analog. In this paper, a 14 bit Extended Counting Incremental Sigma-Delta ADC is implemented in $0.25{\mu}m$ CMOS process with a single 2.5 V supply voltage. The conversion speed is about 150 Ksamples/sec at a clock rate of 25 MHz. The 1 MSB is 0.02 V. The active area is $0.50\;x\;0.35mm^{2}$. The averaged power consumption is 1.7 mW.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.1 s.343
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• pp.65-70
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• 2006

An image sensor has limited dynamic range while the human eye has logarithmic response over wide range of light intensity. Although the sensor gain can be set high to identify details in darker area on the image, this results in saturation in brighter area. The gamma correction is essential to fit the human eye response. However, the digital gamma correction degrades image quality especially for darker area on the image due to the limited ADC resolution and the dynamic range. This Paper proposes a CMOS image sensor (CIS) with a nonlinear analog-to-digital converter (AU) which performs analog gamma correction. The CIS with the proposed nonlinear analog-to-digital conversion scheme was fabricated with a $0.35{\mu}m$ CMOS process. The analog gamma correction using the proposed nonlinear ADC CIS provides the 2.2dB peak-signal-to-noise-ratio(PSM) improved image qualify than conventional digital gamma correction. The PSNR of the image obtain from the digital gamma correction is 25.6dB while it is 27.8dB for analog gamma correction. The PSNR improvement over digital gamma correction is about $28.8\%$.

• Journal of the Korea Society of Computer and Information
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• v.7 no.4
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• pp.115-120
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• 2002

This paper presents the implementation of IS-95 CDMA signal processor, baseband and Intermediate Frequency(IF) digital converter using Field Programmable Gate Array(FPGA) and ADC/DAC and frequency up/down converter IS-95 CDMA channel processor is generated the pilot channel signal with short PN code and Walsh-code generator. The digital If is composed of FPGA. digital transmit/receive signal processor and high speed analog-to-digital converter(ADC) and digital-to-analog converter(DAC). The frequency up/down converter consisted of filter, mixer, digital attenuator and PLL is analog conversion between intermediate frequency(IF) and baseband. This implemented system can be deployed in the IS-95 CDMA base station device etc.