• 제목/요약/키워드: Accelerated testing

검색결과 371건 처리시간 0.033초

산업용 인버터의 가속 피로수명 평가에 관한 연구 (A Study on Accelerated Fatigue Life Testing for Industrial Inverter)

  • 이상훈;김원진
    • 한국기계가공학회지
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    • 제21권6호
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    • pp.67-73
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    • 2022
  • Industrial inverters are used in a variety of fields for electric power supply. They may be exposed to vibration and heat once they are installed. This study focused on a framework of accelerated life testing of an industrial inverter considering fatigue damage as the primary source of deterioration. Instead of analyzing detailed failure mechanisms and the product's vulnerability to them, the potential of fatigue failure is considered using the fatigue damage spectrum calculated from the environmental vibration signals. The acceleration and temperature data were gathered using field measurement and spectral analysis was conducted to calculate the vibration signal's power spectral density (PSD). The fatigue damage spectrum is then calculated from the input PSD data and is used to design an accelerated fatigue life testing. The PSD for the shaker table test is derived that has the equivalent fatigue damage to the original input signal. The tests were performed considering the combined effect of random vibration and elevated temperature, and the product passed all the planned tests. It was successfully demonstrated that the inverter used in this study could survive environmental vibration up to its guarantee period. The fatigue damage spectrum can effectively be used to design accelerated fatigue life testing.

전기기기 신뢰성 보증을 위한 가속수명시험 설계 (Design of Accelerated Life Testing for Reliability Assurance of Electrical Apparatus)

  • 김민규;이정기;김익수;정주영
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2007년도 제38회 하계학술대회
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    • pp.1498-1499
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    • 2007
  • In general, ALT can be used to expect the lifetime of electric machines and accelerated stress testing(AST) is used to evaluate the residual life of insulation system. In this paper, a method to design the accelerated life testing(ALT) for reliability qualification of electrical apparatus is represented.

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병렬형 시스템의 부분적 가속수명검사를 위한 최적계획 (Optimal design of Partially Accelerated Life Testing for the Parallel Systems)

  • 박희창;이석훈
    • 품질경영학회지
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    • 제24권4호
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    • pp.14-28
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    • 1996
  • We consider optimal designs of partially accelerated life testing which is deviced for parallel systems with the considerably long life time. In partially step-stress life testing, test items are first run simultaneously at use condition for a specified time, and the surviving items are then run at accelerated condition until a predetermined censoring time. In partially constant-stress life testing, test items are run at either use or accelerated condition only until a specified censoring time. The optimal criterion for each test is to minimize either the generalized asymptotic variance of maximum likelihood(ML) estimators of the hazard rates at use condition and the acceleration factors or the asymptotic variance of the ML estimators of the acceleration factors.

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Parametric inference on step-stress accelerated life testing for the extension of exponential distribution under progressive type-II censoring

  • El-Dina, M.M. Mohie;Abu-Youssef, S.E.;Ali, Nahed S.A.;Abd El-Raheem, A.M.
    • Communications for Statistical Applications and Methods
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    • 제23권4호
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    • pp.269-285
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    • 2016
  • In this paper, a simple step-stress accelerated life test (ALT) under progressive type-II censoring is considered. Progressive type-II censoring and accelerated life testing are provided to decrease the lifetime of testing and lower test expenses. The cumulative exposure model is assumed when the lifetime of test units follows an extension of the exponential distribution. Maximum likelihood estimates (MLEs) and Bayes estimates (BEs) of the model parameters are also obtained. In addition, a real dataset is analyzed to illustrate the proposed procedures. Approximate, bootstrap and credible confidence intervals (CIs) of the estimators are then derived. Finally, the accuracy of the MLEs and BEs for the model parameters is investigated through simulation studies.

의약품 유통 관리용으로 사용되는 UHF 대역 RFID Tag의 가속수명시험법 개발 (Development of Accelerated Life Test Method for UHF RFID Tags for Medicine Supply Management)

  • 양일영;유상우;박정원;조원서
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제14권2호
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    • pp.93-96
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    • 2014
  • RFID (Radio Frequency IDentification) system is recognition technology which can maintain various object's information. Reliability of RFID tags is the most important factor in RFID system. In this paper, we proposed ALT (Accelerated Life Test) method for UHF RFID tags. Temperature and humidity were adopted as stress factors and the accelerated life tests were conducted in three different conditions. We performed failure analysis for identifying failure mechanism and statistical analysis of test data. In the statistical analysis, we employed Inverse Power law for relationship between tag's life and stress. Through the statistical analysis, we proposed acceleration factor for several levels of temperature-humidity. The reliability qualification test plans were also designed for the tag's target reliability.

고 신뢰성 확보를 위한 가속시험의 연구동향 분석 (Research Results and Trends Analysis on Accelerated Testing for Ensuring High Reliability)

  • 김종걸;송정무
    • 대한안전경영과학회:학술대회논문집
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    • 대한안전경영과학회 2011년도 춘계학술대회
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    • pp.419-432
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    • 2011
  • 제품의 신뢰성에 대한 소비자의 인식이 높아짐에 따라 기업에서는 높은 품질과 신뢰성 있는 제품을 만들기 위해 많은 노력을 하고 있다. 신뢰성은 기기, 부품, 재료 등 시스템이 규정된 조건하에서, 의도하는 기간 동안 규정된 기능을 고장 없이 수행할 수 있는 성질로 규정된다. 높은 신뢰성의 확보를 위한 제품의 신뢰성 시험은 많은 시간과 비용이 소모되기 때문에 현대의 빠른 시장 흐름에 따라가지 못한다. 특히, 최근 기술발전 속도가 빨라지고 제품 수명주기(Life Cycle)와 개발 기간이 짧아지고 있는 추세에 있으므로 이에 대응할 수 있는 신속한 시험방법의 실시가 반드시 필요한 시점이다. 위와 같은 신뢰성을 갖는 제품의 시험의 한계를 극복하고 시험시간을 단축하기 위한 여러 가지 방법이 연구되어 왔고, 그 중 가속 시험(Accelerated Test)에 대한 필요성과 요구가 계속 증가하고 있는 추세다. 본 연구에서는 단순부품과 재료의 신뢰도 정보를 신속하게 얻는데 매우 유용한 신뢰성 시험방법 중에 하나인 가속시험의 연구동향과 적용 현황을 분석하고 이의 효과적인 적용과 활용방안을 모색 하고자 한다.

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야간투시경용 영상증폭관(KIT-7)의 가속수명시험에 관한 연구 (A STUDY ON THE ACCELERATED LIFE TESTS OF IMAGE INTENSIFIER ASSEMBLY(KIT-7))

  • 김성민;박정원;함중걸;김광연
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제7권3호
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    • pp.127-136
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    • 2007
  • The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. The accelerated life tests were carried out at $5{\times}10^5\;fc-40^{\circ}C,\;10{\times}10^5\;fc-40^{\circ}C,\;5{\times}10^5\;fc-50^{\circ}C,\;10{\times}10^5\;fc-50^{\circ}C$ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[6] was used to calculate an acceleration factor and the test of life distribution fit, and estimate three parameters of an life test model. To sum up, MTTF 10,000 h at $5{\times}10^{-5}\;fc-40^{\circ}C$ of image intensifier assembly was certificated.

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0.5wt% 탄소강을 이용한 해안 야외부식시험과 염수분무시험, 가속부식시험의 가속계수에 대한 연구 (The Study on the Acceleration Factor of Coastal Outdoor Corrosion test, Salt Spray Test and Accelerated Corrosion Test using 0.5wt% carbon steel)

  • 조의열;권기봉;조대형;김종렬
    • Corrosion Science and Technology
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    • 제12권5호
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    • pp.209-214
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    • 2013
  • In the industry, accelerated corrosion test is used for the life time prediction. When anti-corrosion test proceeds in real environments, it is difficult that we predict and evaluate the corrosion life time because of the long test time such as 10 years or more time. Accelerated corrosion test and Salt spray test are able to test corrosion life time of products in the laboratory instead of outdoor corrosion test. Experimental procedure is selected for the corrosion standard specimen, exposure of the specimens, measurements of the mass loss and evaluating the mass loss data. As a result, the acceleration factor of the accelerated corrosion test to the outdoor corrosion test is 414.8. Therefore we can predict the corrosion life time of carbon steel during a short time period.

Accelerated Stress Testing of a-Si:H Pixel Circuits for AMOLED Displays

  • Sakariya, Kapil;Sultana, Afrin;Ng, Clement K.M.;Nathan, Arokia
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.749-752
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    • 2004
  • Unlike OLEDs, there is no lifetime testing procedure for TFTs. In this work, we have defined such a procedure and developed a method for the accelerated stress testing of TFT pixel circuits in a-Si AMOLED displays. The acceleration factors derived are based on high current and temperature stress, and can be used to significantly reduce the testing time required to guarantee a 20000-hour display backplane lifespan.

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가진 시험 방법을 활용한 자동차 도어 플레이트 모듈 슬램 내구 평가 (Evaluation on Slam Resistance of Door Plate Module Using Vibration Testing Method)

  • 김찬중;손태관
    • 한국소음진동공학회논문집
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    • 제22권10호
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    • pp.968-973
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    • 2012
  • Slam testing is a mandatory testing process to evaluate the fatigue resistance of a door plate module before delivering it to car makers. This process is very hard job to complete it since the testing facilities are considerably expensive and the required testing time is relatively very long, i.e. more than eight days for a single specimen. In this paper, an accelerated testing method of a door plate module is proposed using vibration test equipment instead of the current one by exposing to the critical excitation of a door glass. Under the proposed excitation method, the similar testing result can be evaluated within less than two hours. The suitability of the proposed testing method was demonstrated by comparing failure modes of both the current testing method and the proposed one.