• 제목/요약/키워드: Accelerated stress-test

검색결과 294건 처리시간 0.023초

PEMFC에서 전극과 전해질 막의 열화 가속 시험 (Degradation Accelerated Stress Test of Electrode and Membrane in PEMFC)

  • 송진훈;김세훈;안병기;고재준;박권필
    • Korean Chemical Engineering Research
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    • 제50권5호
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    • pp.778-782
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    • 2012
  • 최근까지 대부분의 PEMFC MEA (Membrane and Electrode Assembly) 열화 연구는 전극과 전해질막 각각 분리되어 연구되었다. 그런데 실재 PEMFC 운전조건에서는 전극과 막은 동시에 열화된다. 그래서 본 연구에서는 전극과 막열화가 동시에 일어나는 조건에서 열화 가속시험을 하였다. 실험결과 전극과 막 열화가 서로 상호작용함을 보였다. 막열화는 촉매의 활성면적 감소폭을 줄였고, 전극열화는 막의 수소투과 전류와 불소유출속도(FER) 증가폭을 감소시켰다.

SP-SSRT법에 의한 TMCP강 용접부의 응력부식균열 평가에 관한 연구 (A Study on the Stress Corrosion Cracking Evaluation for Weld Joint of TMCP steel by SP-SSRT Method)

  • 유효선;정희돈;정세희
    • Journal of Welding and Joining
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    • 제15권1호
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    • pp.46-54
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    • 1997
  • The object of this paper is to evaluate SCC(stress corrosion cracking) susceptibility for parent metal and bond line region of weld joints which have the various weld heat input condtions in TMCP(thermo-mechanical control process) steel by SP-SSRT(small punch-slow strain rate test) method. And the SCC test results of TMCP steel are compared with those of the conventional HT50 steel which has te almost same tensile strength level like TMCP steel. The loading rate used was $3\times10^{-4}$mm/min and the corrosive environment was synthetic sea water. According to the test results, in the case of parent metal, TMCP steel showed higher SCC susceptibility than HT50 steel because of the high plastic strain level of ferrite microstructure obtained by accelerated cooling. And in the case of bond line, the both TMCP steel and HT50 steel showed low load-displacement behaviors and higher SCC susceptibility above 0.6. These results may be caused by theembrittled martensite structure on HT50 steel and by the coarsened grain and the proeutectoid ferrite structure obtained by the impart of accelerated cooling effect on TMCP steel.

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연계모수를 이용한 가속수명시험 통합모형의 개발 (Development of Integrated Model for Accelerated Life Test Using Linkage Parameter)

  • 최성운
    • 대한안전경영과학회지
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    • 제9권5호
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    • pp.43-48
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    • 2007
  • This paper is to present linkage parameter to integrate statistical models and physical models for accelerated life test. Statistical models represent the relationship of probability distribution and life. Physical models show the relationship of life and stress. Moreover, this study proposes the four steps for construction of integrated models for accelerated life test using linkage parameter. Finally, this paper develops new integrated models such as extreme value distribution-general Eyring, linearly increasing failure rate function-general Eyring, etc., and estimates various reliability measures.

가속수명시험을 통한 자동차용 파일럿램프의 비교평가 (Comparison to Automobile Pilot Lamp by Accelerated Life Test)

  • 신민경;위신환;김형민
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제8권2호
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    • pp.75-85
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    • 2008
  • In this paper, we compared domestic with foreign pilot lamps installed on the instrument board or electronic modules (car audio, air-conditional system, etc.) of an automotive vehicle by an accelerated life test in order to estimate the life of domestic pilot lamps. An accelerated life test method was developed and the relation of the life and voltage stress was analyzed. The main results are as follows; i) $B_{10}$ life of pilot lamp is above 5,000 hours, vehicle travel time for 10 years. ii) the life of domestic pilot lamp is longer than that of foreign thing. iii) the life distribution of domestic pilot lamp is wider than that of foreign thing. iv) it is possible to promote import replacement of automobile pilot lamp.

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Analysis the Reliability of Multilayer Ceramic Capacitor with inner Ni Electrode under highly Accelerated Life Test Conditions

  • Yoon, Jung-Rag;Lee, Kyung-Min;Lee, Serk-Won
    • Transactions on Electrical and Electronic Materials
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    • 제10권1호
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    • pp.5-8
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    • 2009
  • The reliability of multilayer ceramic capacitor with active thin dielectric layer was investigated by highly accelerated life test at various stress condition. The distribution of multilayer ceramic capacitor failure times is plotted as a function of time from Weibull distribution function. According to the test result, voltage acceleration factor is obtained from 2.24 to 2.96. The acceleration by temperature is much higher than other values of active thick dielectric layer. It is clear that median time to failure is affected by the stress voltage for high volumetric efficiency ceramic capacitors with active thin dielectric layer. The degradation under stress of voltage involves electromigration and accumulation of oxygen vacancy at Ni electrode interface of cathode.

The Method of Determining Stress Levels Regarding the Electrical ALT through Optical Temperature Sensor

  • Ryu, Haeng-Soo;Han, Gyu-Hwan;Yoon, Nam-Sik
    • Journal of Electrical Engineering and Technology
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    • 제3권2호
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    • pp.184-191
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    • 2008
  • Electrical endurance is the critical characteristic of Magnetic contactors(MCs), which are widely used in such power equipment as elevators, cranes, and factory control rooms in order to close and open control circuits. Testing time, however, is not short in typical cases in which some method of reducing the testing period is required. This study shows the method of determining the stress level of electrical ALT(Accelerated Life Test) through optical temperature sensor and the relationship between 0.05 s and 0.1 s for on-time. The tool used for analyzing the test result is MINITAB. I will propose the method of determining the optimized stress level through optical temperature sensor, which will contribute to minimize the testing time and development period and also raise the product reliability.

가속 열 노화시험을 이용한 침매터널용 고무 씰 소재의 사용수명 예측 (Service life prediction of rubber seal materials for immersion tunnel by accelerated thermal degradation tests)

  • 박준형;박광화;박형근;권영일;김종호;성일경
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제9권4호
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    • pp.275-290
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    • 2009
  • This paper considers accelerated thermal degradation tests which are performed for rubber seal materials used for undersea tunnels constructed by immersion method. Three types of rubber seals are tested; rubber expansion seal, omega seal, and shock absorber hose. Main ingredient of rubber expansion seal is EPDM(Ethylene Propylene Diene Monomer) and that of both omega seal and shock absorber hose is SBR(Styrene Butadiene Rubber). The accelerated stress is temperature and an Arrhenius model is introduced to describe the relationship between the lifetime and the stress. From the accelerated degradation tests, dominant failure mode of the rubber seals is found to be the loss of elongation. The lifetime distribution and the service life of the rubber seals at use condition are estimated from the test results. The acceleration factor for three types of rubber seals are also investigated.

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폴리머 현수애자의 복합가속열화 평가기술 (Multi-Stress Aging Test Technology for Suspension Polymer Insulator)

  • 박효열;강동필;김익수;신영준
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.1
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    • pp.481-484
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    • 2003
  • Recently polymer insulators are being used for outdoor high voltage applications. Polymer insulators have significant advantages over porcelain and glass insulators. With the gradual improvement of their design and material, their reliability has also increased. It is however difficult to establish how they will perform after several years of service. Aging of the insulator weathershed may lead to damages such as excessive chalking and crazing, erosion and tracking which affect the insulator performance. In service insulator are subjected to aging stresses such as humidity, pollution and electrical field which act singly or in combination. There have been numerous accelerated laboratory tests developed with the intention of evaluating suitability of polymeric materials. Some of these are strictly material tests, where as, others evaluate full scale devices. Service experience plays a key role in the utility selection of polymer insulator, but is time consuming, and may not always be available. Hence there is a need for a meaningful and reliable accelerated aging test for polymer insulator. This paper describes multi-stress aging test for reliability of polymer insulator This paper presents the rule of multi-stress aging test and test chamber for polymer insulator in korea electrotechnology research institute.

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고무시트 버터플라이밸브의 가속수명시험을 통한 수명특성 연구 (A Study of Life Characteristics of Butterfly Valve Seated Rubber by Accelerated Life Test)

  • 이기천;이용범
    • 한국유체기계학회 논문집
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    • 제16권5호
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    • pp.29-35
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    • 2013
  • Butterfly valve seated rubber has been widely used in water works and industrial fields because it has advantages which are small installation area and low weight. The size and material of butterfly valve have been selected by service environments and purposes. But there are out of the ordinary to find papers for the life characteristics of the butterfly valve. So, this study carries out the accelerated life test, which has an acceleration factor with pressure, using performance and life test equipment. Accelerated model is adopted with 3 stress level and the inverse power law model to estimate the life of the test samples. After the analysis of the test result, accelerated index has 7.0 and the acceleration factor has 208 which is applied with field condition with the pressure 6.3 bar.

태양전지 신뢰성 정보은행 (Solar Cell Reliability Data Bank)

  • 소원섭;오수영
    • Current Photovoltaic Research
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    • 제2권3호
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    • pp.140-145
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    • 2014
  • The globally used PV qualification tests and reports the pass/fail only. Therefore, the reliability of new PV materials and parts can't be compared quantitatively with the reliability of the PV parts and materials in the market. Global PV materials and parts companies test and compare their materials, parts, and modules using the failure-to-test (FTT). However, it takes a long accelerated stress test (AST) until failure. It also needs to test the new and existing materials and parts. Therefore, it requires excessive equipment time and cost. In order to reduce the time and cost, a new reliability enhancement methodology has been developed. It tests the PV materials, parts, and modules in the global market and stores them in the PV reliability database. It reduces the time and cost of the comparison and enhancement of PV reliability. An example of the reliability enhancement of the PV encapsulant, EVA is presented.