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http://dx.doi.org/10.5370/JEET.2008.3.2.184

The Method of Determining Stress Levels Regarding the Electrical ALT through Optical Temperature Sensor  

Ryu, Haeng-Soo (LS Industrial Systems, Co, Ltd)
Han, Gyu-Hwan (LS Industrial Systems, Co, Ltd)
Yoon, Nam-Sik (Dept. of Electrical and Electronic Engineering, Chungbuk National University)
Publication Information
Journal of Electrical Engineering and Technology / v.3, no.2, 2008 , pp. 184-191 More about this Journal
Abstract
Electrical endurance is the critical characteristic of Magnetic contactors(MCs), which are widely used in such power equipment as elevators, cranes, and factory control rooms in order to close and open control circuits. Testing time, however, is not short in typical cases in which some method of reducing the testing period is required. This study shows the method of determining the stress level of electrical ALT(Accelerated Life Test) through optical temperature sensor and the relationship between 0.05 s and 0.1 s for on-time. The tool used for analyzing the test result is MINITAB. I will propose the method of determining the optimized stress level through optical temperature sensor, which will contribute to minimize the testing time and development period and also raise the product reliability.
Keywords
Accelerated Life Test; Magnetic Contactor; MINITAB; Optical Temperature Sensor;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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