• Title/Summary/Keyword: Accelerated life testing

Search Result 192, Processing Time 0.027 seconds

The Study based on Accelerated Degradation Test of General Lighting 4W LED Lamp using External Converter (조명용 4W 컨버터 외장형 LED램프의 가속열화시험평가)

  • Park, Chang-Kyu;Oh, Geun-Tae
    • Journal of Applied Reliability
    • /
    • v.11 no.3
    • /
    • pp.267-279
    • /
    • 2011
  • LEDs have been used extensively in the mobile device, automobile, and general lighting because they are semi-permanent, long life, less power consumption, reliable and environmentally friendly. In this paper, the accelerated degradation test(ADT) for a general lighting 4W LED Lamp using external converter is considered. The conditions of ADT are high temperature and high humidity. We show that its life time is log-normally distributed with same parameters under both a normal condition and an accelerated condition, and also derive an accelerated factor.

Reliability Assessment and Improvement of MEMS Vacuum Package with Accelerated Degradation Test (ADT) (가속열화시험을 적용한 MEMS 진공패키지의 신뢰성 분석 및 개선)

  • 최민석;김운배;정병길;좌성훈;송기무
    • Journal of Applied Reliability
    • /
    • v.3 no.2
    • /
    • pp.103-116
    • /
    • 2003
  • We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

  • PDF

Development of Accelerated Life Test Method for Constant Electrical Potential Electrolysis Gas Sensor (정전위 전해식 가스센서의 가속수명시험법 개발)

  • Yang, Il Young;Kang, Jun Gu;Yu, Sang Woo;Oh, Geun Tae;Na, Yoon Gyoon
    • Journal of Applied Reliability
    • /
    • v.16 no.3
    • /
    • pp.180-191
    • /
    • 2016
  • Purpose: The purpose of this study was to develop the accelerated life test method for Constant Electrical Potential Electrolysis gas sensor (CEPE gas sensor). Methods: The parts and modules of CEPE gas sensor were analyzed by using Reliability Block Diagram (RBD). Failure Mode and Effect Analysis (FMEA) and Quality Function Deployment (QFD) methods were performed for each part to determine the most affecting stress factor in its life cycle. The long term testing was conducted at three different dry heat levels and the acceleration factor was developed by using Arrhenius relationship. Conclusion: The acceleration factor for CEPE gas sensor was developed by using FMEA, QFD, and statistical analysis for its failure data. Also qualification tests were designed to meet the target life.

An Accelerated Life Test for Burnout of Tungsten Filament of Incandescent Lamp (텅스텐 백열전구의 필라멘트 단선에 대한 가속수명시험)

  • Kim Jin-Woo;Shin Jae-Chul;Kim Myung-Soo;Lee Jae-Kook
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.29 no.7 s.238
    • /
    • pp.921-929
    • /
    • 2005
  • This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot spots in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.

Reliability Analysis of the Spur Gear with Accelerated Life Testing Model (가속수명시험 모델에 따른 평기어의 신뢰성 해석)

  • Kim, Chul-Su;Kwon, Yeo-Hyoun;Kim, Joo-Hyung;Kim, Jung-Kyu
    • Proceedings of the KSME Conference
    • /
    • 2004.11a
    • /
    • pp.136-141
    • /
    • 2004
  • The gear in various mechanical components easily occurs at damages by the external torque. The main failure modes of the gear are surface pitting with the tooth surface and breakage with tooth root by caused fatigue. Therefore, the gear is very important role in the reliability research since it may cause fatal damage of entire system such as the gear box in automobile transmission. In this study, the failure mode of the gear was analyzed and accelerated durability analysis was employed for the life estimation of spur gears. In the case of assumed load spectrums, the reliability of spur gears was evaluated by inverse power law-Weibull accelerated life test model with cumulative damage exposure.

  • PDF

Accelerated Life Test for Door Switch of Refrigerator (냉장고 도어스위치의 가속수명시험)

  • Ryu Dong Su;Kim Sang Uk;Jang Young Kee;Moon Chul Hui
    • Journal of Applied Reliability
    • /
    • v.5 no.2
    • /
    • pp.273-287
    • /
    • 2005
  • Accelerated life test models and procedure are developed to assess the reliability of Refrigerator door switch. The main function of door switch is to operate bulb lamp and fan motor in the refrigerating room. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

  • PDF

Conditional Confidence Intervals for Accelerated Life Testing in Modified Arrhenius Model (수정 아레니우스 모형에서 가족수명시험에 대한 조건부 신뢰구간)

  • 박병구
    • Journal of Korean Society for Quality Management
    • /
    • v.25 no.3
    • /
    • pp.1-10
    • /
    • 1997
  • In the context of accelerated life tests, procedures are given for estimating the parameters in the modified Arrhenius model and for estimating mean life at a given future stress level. The conditional confidence intervals are obtained by conditioning on ancillary statistics and pivotal quantity. Using the data of Tobias and Trindada(1986), we illustrate conditional confidence interval for parameters under use condition in the modified Arrhenius model.

  • PDF

Accelerated Life Testings for System based on a Bivariate Exponential Model

  • Park, Byung-Gu;Yoon, Sang-Chul
    • Communications for Statistical Applications and Methods
    • /
    • v.6 no.2
    • /
    • pp.423-432
    • /
    • 1999
  • Accelerated life testing of product is commonly used to reduced test time and costs. In this papers is considered when the product is a two component system with lifetimes following the bivariate exponential distribution of Sarkar(1987) using inverse power rule model. Also we derived the maximum likelihood estimators of parameters for asymptotic normality. We compare the mean square error of the proposed estimator for the life distribution under use conditions stree through Monte Carlo simulation.

  • PDF

An Experimental Study on Accelerated Life Testing for Aluminum Electrolytic Capacitors (알루미늄전해콘덴서의 가속수명시험에 관한 실험연구)

  • Kim, Heung-Jin;Cheon, Ho-Sung;Kim, Seong-Deuk;Park, Young-Taek;Jin, Hong-Gee;Park, Chan-Woong
    • Journal of Korean Society for Quality Management
    • /
    • v.23 no.4
    • /
    • pp.128-147
    • /
    • 1995
  • An accelerated life testing(ALT) for aluminum electrolytic capacitors is conducted and analyzed. A testing equipment, which consists of part fixtures, relay board, controller, video bridge and microcomputer, is made for the ALT. Load factors are temperature with four levels and voltage with three levels. Base on 'optimized 4:2:1 plan', 2,000 electrolytic capacitors are allocated at 12 experimental conditions(; 4 levels of temperature ${\times}3$ levels of voltage), and the ALT is conducted. From the experimental results, an acceleration model is derived and acceleration factors are estimated. A discussion on the experimental results is included.

  • PDF