• Journal of Applied Reliability
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• v.11 no.2
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• pp.127-140
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• 2011

This paper presents an accelerated life test of aviation taxiway lights installed in the airport to help safe navigation of airplanes at night or in bad weather. Recently halogen lamps of taxiway lights are replaced by LED ones and their reliability needs yet to be verified. Thus, effective test conditions are designed reflecting the failure modes and mechanisms from the previous studies on LED, which include the accelerated degradation process. The test is performed under the temperature $70^{\circ}C$ and $90^{\circ}C$ for two types of LED lights, taxiway center line lights(TCLL) and taxiway edge lights (TEDL). The failure time data were analyzed using lognormal distribution and Arrhenius model to find the life-stress relationship, acceleration factor and life characteristics under the normal condition temperature $30^{\circ}C$.

• Journal of Applied Reliability
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• v.5 no.4
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• pp.413-425
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• 2005

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents an accelerated degradation testing for vacuum fluorescent displays (VFDs). The accelerated degradation model is based on Arrhenius-lifetime relationship for cathode temperatures. We compare the results between accelerated degradation test and test at normal use condition. Accelerated degradation test for display devices is observed as an efficient method to warrantee product reliability to customers, as well as a tool to save time and costs.

• International Journal of Reliability and Applications
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• v.7 no.1
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• pp.27-39
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• 2006

Many real world cases in material failure analysis do not follow perfectly the normal distribution. Forcing of the normality assumption may lead to inaccurate predictions and poor product quality. We examine the failure process of the internal bond (IB or tensile strength) of medium density fiberboard (MDF). We propose a forced censoring technique that closer fits the lower tails of strength distributions and better estimates extremely smaller percentiles, which may be valuable to continuous quality improvement initiatives. Further analyses are performed to build an accelerated common-shaped Weibull model for different product types using the $JMP^{(R)}$ Survival and Reliability platform. In this paper, a forced censoring technique is implemented for the first time as a software module, using $JMP^{(R)}$ Scripting Language (JSL) to expedite data processing, which is crucial for real-time manufacturing settings. Also, we use JSL to automate the task of fitting an accelerated Weibull model and testing model homogeneity in the shape parameter. Finally, a package script is written to readily provide field engineers customized reporting for model visualization, parameter estimation, and percentile forecasting. Our approach may be more accurate for product conformance evaluation, plus help reduce the cost of destructive testing and data management due to reduced frequency of testing. It may also be valuable for preventing field failure and improved product safety even when destructive testing is not reduced by yielding higher precision intervals at the same confidence level.

• Journal of the Korean Data and Information Science Society
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• v.20 no.6
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• pp.1169-1175
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• 2009

In this paper, the inferences of data obtained from periodic inspection and type I censoring for the step-stress accelerated life test are studied. The exponential distribution with a failure rate function that a log-linear function of stress and the tampered failure rate model are considered. The maximum likelihood estimators of the model parameters are estimated and also the optimal stress change time which minimize the asymptotic variance of maximum likelihood estimators of parameters is determined. A numerical example will be given to illustrate the proposed inferential procedures and the sensitivity of the asymptotic variance of the estimated mean by the guessed parameters is investigated.

• Journal of Applied Reliability
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• v.15 no.3
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• pp.139-144
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• 2015

Track drive unit adopted in the small sized excavator generally have been used in the construction equipment under the 10 tons as the driving device with forwarding and reversing of excavator. It is required to study the accelerated life test applied by over torque and speed to test the durability life test reflected the many driving modes of small sized excavator and also need to equip the comprehensive performance and life test equipments to do the various performance tests. This study had analyzed the failure modes of the components, and calculated the equivalent loads investigated the used loads in the real field conditions and elicits the acceleration factor adopted in the inverse power model. Also, this study have considered the changes of the acceleration factor and the durability test time in the case of the rotary group and the bearing through analyzing the main failure modes. It was calculated the no failure test time about 2 samples and confidence level 90% and elicited the accelerated life time 720 hours.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
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• v.17 no.12
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• pp.1169-1176
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• 2005

In this paper, thermal reliability of a closed type BLDC (Brushless DC) motor for high speed axial fan was analyzed by the accelerated life test. The closed type BLDC (Model No. MB1-8855-J01) motor was controlled by PCB module, which was composed of various electrical components. The failure of the closed type BLDC motor happened in PCB module due to high temperature. Failure mechanism of the closed type BLDC motor appears to be electrolyte dry out of capacitor. The accelerate life test was performed in temperature stress of $85^{\circ}C\;and\;105^{\circ}C$, respectively The failure data from the accelerated life test were analyzed and the life in each stress level was estimated with 960h and 261 h. At last, both life expression according to operating temperature of PCB module and life of the closed type BLBC motor in normal condition $(50^{\circ}C)$ were suggested.

• International Journal of Reliability and Applications
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• v.17 no.1
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• pp.85-105
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• 2016

In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

• Communications for Statistical Applications and Methods
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• v.24 no.1
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• pp.29-41
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• 2017

The estimation problem of expected time to failure of units is studied in a discrete set up. A simple step-stress accelerated life testing is considered with a Type-I censored sample from geometric distribution that is a commonly used distribution to model the lifetime of a device in discrete case. Maximum likelihood estimators as well as the associated distributions are derived. Exact, approximate and bootstrap approaches construct confidence intervals that are compared via a simulation study. Optimal confidence intervals are suggested in view of the expected width and coverage probability criteria. An illustrative example is also presented to explain the results of the paper. Finally, some conclusions are stated.

• Journal of Korean Society for Quality Management
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• v.38 no.4
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• pp.504-511
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• 2010

A fuze detonator comprising star shells is an important device so that its failure usually leads to failure of the shells. In this paper, accelerated degradation tests of RD1333 (lead azide) using temperature stress were performed, and then degradation data of explosive power for the detonator were analyzed to predict the storage lifetime of detonator. Degradation data analysis to estimate the storage lifetime is based on a distribution-based degradation process. Statistical distribution parameters of explosive power degradation measures at each time were estimated for each temperature level, and then reliability of the detonator for each accelerated temperature level was estimated using both time-varying distribution parameters and critical level of explosive power. Arrhenius model was applied to estimate storage lifetime of the detonator under the field temperature condition. Accelerated distribution-based degradation analysis to estimate storage lifetime is explained in detail, and estimation results are compared to field data of storage lifetime in this paper.

• Journal of the Korea Safety Management & Science
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• v.15 no.1
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• pp.109-120
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• 2013

As information-oriented industry has been developed and electronic devices has come to be smaller, lighter, multifunctional, and high speed, the components used to the devices need to be much high density and should have find pattern due to high integration. Also, diverse reliability problems happen as user environment is getting harsher. For this reasons, establishing and securing products and components reliability comes to key factor in company's competitiveness. It makes accelerated test important to check product reliability in fast way. Out of fine pattern failure modes, failure of Electrochemical Migration(ECM) is kind of degradation of insulation resistance by electro-chemical reaction, which it comes to be accelerated by biased voltage in high temperature and high humidity environment. In this thesis, the accelerated life test for failure caused by ECM on fine pattern substrate, $20/20{\mu}m$ pattern width/space applied by Semi Additive Process, was performed, and through this test, the investigation of failure mechanism and the life-time prediction evaluation under actual user environment was implemented. The result of accelerated test has been compared and estimated with life distribution and life stress relatively by using Minitab software and its acceleration rate was also tested. Through estimated weibull distribution, B10 life has been estimated under 95% confidence level of failure data happened in each test conditions. And the life in actual usage environment has been predicted by using generalized Eyring model considering temperature and humidity by developing Arrhenius reaction rate theory, and acceleration factors by test conditions have been calculated.