• Journal of the Microelectronics and Packaging Society
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• v.15 no.2
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• pp.55-61
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• 2008

This paper shows quantitative reliability evaluations of a Bluetooth module through extending previous qualitative methods limited to structure reliability tests and solder joint reliability tests for Bluetooth modules. Accelerated Life Testing (ALT) of the modules using temperature difference in temperature cycling as an accelerated stress was conducted for quantitative reliability evaluation under field environment conditions. Lifetime distribution parameters were estimated using the failure times obtained through the ALT, and then Coffin-Manson model was implemented. Results of the ALT showed that the failure mode of the modules was open and the failure mechanisms are both crack and delamination. The ALT reproduced the failure mode and mechanisms of failed Bluetooth modules collected from the field. Further, a quantitative reliability evaluation method with respect to various temperature differences in temperature cycling was proposed in this paper. $B_{10}$ lifetime of the module for the temperature difference $70^{\circ}C$ using the proposed method would be estimated as about 4 years.

• Journal of Korean Institute of Industrial Engineers
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• v.23 no.1
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• pp.177-196
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• 1997

In this paper, statistically optimal accelerated life test(ALT) plans considering statistical efficiency only and new compromise ALT plans to sacrifice some statistical efficiency in return for improved overall properties including estimobility probability and robustness for the model assumptions are developed under the assumptions of constant stress, intermittent inspection, Type I censoring and lognormal failure distribution which has been one of the popular choices of failure distributions in the extensive engineering applications of ALT. Computational experiments are conducted to compare with four ALT plans including two proposed ones under continuous and intermittent inspections over a range of parameter values in terms of asymptotic variance, sensitivities for guessed input values, and proportion of estimable samples, etc. The small and moderate sample properties for the proposed ALT plans designed under asymptotic criterion are also investigated by Monte Carlo simulation.

• Journal of Applied Reliability
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• v.5 no.2
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• pp.221-239
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• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide used electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mode caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.51-67
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• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide sed electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mope caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.30 no.12 s.255
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• pp.1534-1542
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• 2006

In this paper, the concept of accelerated life test, which is a popular research field nowadays, is applied to the shot peened material. To predict the efficient and exact room temperature fatigue characteristics from the high temperature fatigue data, the adequate accelerated model is investigated. Ono type rotary bending fatigue tester and high temperature chamber were used for the experiment. Room temperature fatigue lives were predicted by applying accelerated models and doing reliability evaluation. Room temperature fatigue tests were accomplished to check the effectiveness of predicted data and the adequate accelerated life test models were presented by considering errors. Experimental result using Arrhenius model, fatigue limit obtain almost 5.45% of error, inverse power law has about 1.36% of error, so we found that inverse power law is applied well to temperature-life relative of shot peened material.

• Proceedings of the Korean Reliability Society Conference
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• 2006.05a
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• pp.48-54
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• 2006

In this thesis, accelerated life test (ALT) method and procedure for rubber O-ring are applied to assure specified reliability of the products at guaranteeing the life of the products. Rubber O-ring is parts that keep intensity or make machine operation smoothly on attrition portion of machine and is used to prevent that oil is leaked. Usually. Rubber O-ring used NBR that is copolymer of acrylonitrile and butadiene. this are superior oil resistance, heat resistance, durability of abrasion, cold resistance, chemical resistance etc. The accelerated life test model for rubber O-ring are developed using the relationship between stresses and life characteristics of products. Using the accelerated life test method and the acceleration life test equipment which is developed, we performed life test, collected life data and analyzed the results of tests. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.327-337
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• 2005

Accelerated life test models and procedure are developed to assess the reliability of Door switch. The main function of door switch is to operate bulb lamp and fan motor. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

• Journal of Applied Reliability
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• v.14 no.2
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• pp.93-96
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• 2014

RFID (Radio Frequency IDentification) system is recognition technology which can maintain various object's information. Reliability of RFID tags is the most important factor in RFID system. In this paper, we proposed ALT (Accelerated Life Test) method for UHF RFID tags. Temperature and humidity were adopted as stress factors and the accelerated life tests were conducted in three different conditions. We performed failure analysis for identifying failure mechanism and statistical analysis of test data. In the statistical analysis, we employed Inverse Power law for relationship between tag's life and stress. Through the statistical analysis, we proposed acceleration factor for several levels of temperature-humidity. The reliability qualification test plans were also designed for the tag's target reliability.

• Journal of Applied Reliability
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• v.18 no.1
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• pp.8-19
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• 2018

Purpose: This study has developed the accelerated lifetime test method for smps for outdoor lighting LED through two factors of temperature and humidity. Methods: Acceleration condition was confirmed for each stress and model, and acceleration life test model was estimated according to acceleration condition. Results: As a result of confirming the accelerated life test model, in the case of humidity, acceleration was established only in the foreign products. Therefore, it is confirmed that the acceleration condition is insufficient. However, the estimated parameters for temperature are relatively constant. It is therefore suitable for power supply acceleration tests for outdoor lighting LEDs. Conclusion: The SMPS acceleration test for outdoor lighting LED can improve the availability of the product by developing an accelerated life test method that guarantees the reliability of the product.

• Journal of Applied Reliability
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• v.5 no.2
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• pp.273-287
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• 2005

Accelerated life test models and procedure are developed to assess the reliability of Refrigerator door switch. The main function of door switch is to operate bulb lamp and fan motor in the refrigerating room. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.