• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1303-1308
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• 2008

In this study, we researched how to estimate life-stress relationship and acceleration factor through performing accelerated life test and analyzing it. The purpose of this study is to predict life of pneumatic cylinder within short time which is widely used in automation manufacturing line. In design of accelerated life test, we selected operating pressure and load that have the most influence on main failure mode of pneumatic cylinder as accelerated factor. We used two-way factorial design for arranging of test condition to accelerated factor and accelerated level.

• Journal of Applied Reliability
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• v.10 no.1
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• pp.25-38
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• 2010

In this paper, an accelerated degradation test procedure for an electronic appliance compressor is proposed. We investigate the amount of wear of the compressor and consider several factors as accelerating factors. Finally we select the operating pressure as a main accelerating factor. The test condition of accelerated degradation test is determined. The modified accelerating test reduces the test time in design phase by using the suggested accelerating factor.

• Journal of Korean Institute of Industrial Engineers
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• v.29 no.2
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• pp.145-149
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• 2003

We consider the estimation of failure rate and acceleration factor under type-I censoring without using acceleration model when testing is conducted in only one highly accelerated condition. Failure times of an item are assumed to be exponentially distributed. It is also assumed that the uncertainty about the acceleration factor, the failure time contraction ratio between accelerated condition and use condition, can be modeled by the uniform or gamma prior distribution of appropriate parameters. We respectively use Bayes and maximum likelihood approaches to estimate acceleration factor and failure rate in the use condition. An example is given to show how the method can be applied.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.36 no.7
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• pp.751-757
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• 2012

An accelerated life test (ALT) is a test method that forces components to fail more quickly than they would under use conditions by applying higher overstresses. When two or more accelerating stresses are involved in an ALT, an interaction effect may occur. In previous studies, mostly ALTs without considering an interaction of accelerated stresses and accelerated life models were proposed. The life data obtained are extrapolated using a life-stress relationship to estimate the life distribution at use conditions. We use the general log-linear relationship to model the dependence of life in the Weibull distribution on stress. Therefore, this study suggests the acceleration factor model between the lives at use conditions and accelerated conditions by using mechanical component life data considering an interaction effect. Further, the accelerated life test method and acceleration factor model proposed in this paper will be the basis for adopting an accelerated life test with accelerated stress interactions.

• Journal of Applied Reliability
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• v.2 no.1
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• pp.15-22
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• 2002

This paper is concerned about an Accelerated Life Test for Micro Display Device which is being used in a Projection TV, in order to find a failure mode occurred in field in a short time, to identify a major factor to affect a life, and to estimate a mean life. For this purpose, we selected a temperature as a accelerated factor to perform a test and measured degradation of display device using visual inspection and chromaticity table. In the result of Accelerated Life Test, it is confirmed that failure mode is equal to the degradation of display device by vendor and the Temperature is a major factor to affect a failure. Besides, according as the display device is turned to green as degraded, it is identified that the change of the chromaticity value is one method to measure the degree of the degradation . So, we applied the optimal condition, which consider a cost and life to lower the Temperature which is a major factor acquired by the result of ALT, to PTV design

• Journal of Applied Reliability
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• v.14 no.2
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• pp.93-96
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• 2014

RFID (Radio Frequency IDentification) system is recognition technology which can maintain various object's information. Reliability of RFID tags is the most important factor in RFID system. In this paper, we proposed ALT (Accelerated Life Test) method for UHF RFID tags. Temperature and humidity were adopted as stress factors and the accelerated life tests were conducted in three different conditions. We performed failure analysis for identifying failure mechanism and statistical analysis of test data. In the statistical analysis, we employed Inverse Power law for relationship between tag's life and stress. Through the statistical analysis, we proposed acceleration factor for several levels of temperature-humidity. The reliability qualification test plans were also designed for the tag's target reliability.

• Journal of Applied Reliability
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• v.9 no.1
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• pp.47-58
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• 2009

In this paper, an accelerated life test procedure for a vacuum cleaner motor is proposed. We investigate the failure mechanism of the motor and select some accelerating factors and determine the orifice size as a key accelerating factor. Three stress levels of orifice size are tested and the failure data with censored data are analyzed. The modified accelerating test will reduce the test time in design phase by using the accelerating factor.

• Journal of Applied Reliability
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• v.17 no.1
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• pp.22-27
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• 2017

Purpose: The purpose of this study is to estimate the life time of OLED TV panel through electric current ADT(Accelerated Degradation Test). Methods: We performed accelerated degradation test for OLED TV Panel at the room temperature to avoid high temperature impact on the luminance. Results: we got more accurately the life time of the OLED TV when we applied ADT without temperature factor than including both current and temperature. Conclusion: Until now, the ADT of the OLED TV has been conducted with temperature and current at the same time for reducing test time and costs. We estimate incorrect life time when the temperature is adopted as an accelerated factor. Due to the high temperature impact on the luminance of the OLED TV panel. So as to solve this problem, we discard temperature and use electric current only.

• Journal of Korean Institute of Industrial Engineers
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• v.24 no.3
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• pp.367-379
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• 1998

This paper considers two modes of partially accelerated life tests for items having Weibull lifetime distributions. In a use-to-acclerated mode each item is first run at use condition and, if it does not fail for a specified time, then it is run at accelerated condition until a predetermined censoring time. In an accelerated-to-use mode each one is first run at accelerated condition and, if it does not fail for a specified time, then it is run at use condition. Maximum likelihood estimators of the parameters of the lifetime distribution at use condition, and the 'acceleration factor' are obtained. The stress change time for each mode is determined to minimize the asymptotic variance of the acceleration factor, and the two modes are compared. For selected values of the design parameters the optimum plans are obtained, and the effects of the incorrect pre-estimates of the design parameters are investigated. Minimizing the generalized asymptotic variance of the estimators of the model parameters is also considered as an optimality criterion.

• Journal of Applied Reliability
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• v.7 no.3
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• pp.127-136
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• 2007

The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. The accelerated life tests were carried out at $5{\times}10^5\;fc-40^{\circ}C,\;10{\times}10^5\;fc-40^{\circ}C,\;5{\times}10^5\;fc-50^{\circ}C,\;10{\times}10^5\;fc-50^{\circ}C$ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[6] was used to calculate an acceleration factor and the test of life distribution fit, and estimate three parameters of an life test model. To sum up, MTTF 10,000 h at $5{\times}10^{-5}\;fc-40^{\circ}C$ of image intensifier assembly was certificated.