• 한국신뢰성학회지:신뢰성응용연구
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• 제17권1호
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• pp.22-27
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• 2017

Purpose: The purpose of this study is to estimate the life time of OLED TV panel through electric current ADT(Accelerated Degradation Test). Methods: We performed accelerated degradation test for OLED TV Panel at the room temperature to avoid high temperature impact on the luminance. Results: we got more accurately the life time of the OLED TV when we applied ADT without temperature factor than including both current and temperature. Conclusion: Until now, the ADT of the OLED TV has been conducted with temperature and current at the same time for reducing test time and costs. We estimate incorrect life time when the temperature is adopted as an accelerated factor. Due to the high temperature impact on the luminance of the OLED TV panel. So as to solve this problem, we discard temperature and use electric current only.

• 품질경영학회지
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• 제43권2호
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• pp.169-184
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• 2015

Purpose: This paper is concerned with optimally designing accelerated degradation test (ADT) plans based on a gamma process for the degradation model. Methods: By minimizing the asymptotic variance of the MLE of the q-th quantile of the lifetime distribution at the use condition, the test stress levels and the proportion of test units allocated to each stress level are optimally determined. Results: The optimal plans of ADT are developed for various combination of parameters. In addition, a method for determining the sample size is developed, and sensitivity analysis procedures are illustrated with an example. Conclusion: It is important to optimally design ADT based on a gamma process under the condition that a degradation process should be always nonnegative and strictly increasing over time.

• 한국신뢰성학회지:신뢰성응용연구
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• 제17권2호
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• pp.129-135
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• 2017

Purpose: This article provides step-stress accelerated degradation test (ADT) plans based on the Wiener process. Method: Step-stress levels and the stress change times are determined based on the D-optimality criteria to develop test plans. Further, a simple grid search method is provided for obtaining the optimal test plan. Results: Based on the solution procedure, ADT plans which include the stress levels and change times are developed for conducting the reliability test. Conclusion: Optimal step-stress ADT plans are provided for the case where the number of measurements is small.

• 품질경영학회지
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• 제40권2호
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• pp.117-125
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• 2012

For the highly reliable products, an accelerated degradation test (ADT) is a useful tool which has been employed in industry to obtain reliability-related information within an affordable amount of time and cost. In an ADT, as all other reliability tests, it is important to carefully design the ADT beforehand to obtain estimates of the quantities of interest as precisely as possible. In this paper, optimal ADTs are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Under the constraint that the total cost does not exceed a pre-specified budget, the stress levels, the number of test units allocated to each stress level and the number of measurement (termination time) are determined such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

• Korean Chemical Engineering Research
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• 제54권1호
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• pp.6-10
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• 2016

최근까지 고분자전해질 연료전지(PEMFC)의 열화연구는 대부분 단위전지에서 연구되었다. 그런데 실제 PEMFC의 구동과 열화는 PEMFC 스택에서 이루어진다. 그래서 본 연구에서는 스택에서 열화가속 시험을 진행하여 단위전지의 결과와 비교하였다. 여러 종류의 열화 가속 시험 중에서 전기화학적 열화와 기계적 열화를 반복해 고분자전해질 막을 열화시키는 방법을 사용했다. 312시간 동안 전해질막을 열화시킨 후 0.6V에서 전류밀도는 스택과 단위전지에서 각각 28.4%, 27.8% 감소했다. 수소 투과 전류밀도는 스택은 16.8% 단위전지는 15.2% 증가했다. 스택과 단위전지에서의 열화 가속 시험 결과가 비슷해 단위전지의 가속 시험 방법을 스택에 적용해도 됨을 확인하였다.

• 한국신뢰성학회지:신뢰성응용연구
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• 제3권2호
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• 한국신뢰성학회지:신뢰성응용연구
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• 제11권3호
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• pp.267-279
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• 2011

LEDs have been used extensively in the mobile device, automobile, and general lighting because they are semi-permanent, long life, less power consumption, reliable and environmentally friendly. In this paper, the accelerated degradation test(ADT) for a general lighting 4W LED Lamp using external converter is considered. The conditions of ADT are high temperature and high humidity. We show that its life time is log-normally distributed with same parameters under both a normal condition and an accelerated condition, and also derive an accelerated factor.

• 한국신뢰성학회지:신뢰성응용연구
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• 제13권2호
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• pp.87-98
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• 2013

Accelerated degradation tests (ADTs) measuring failure-related degradation characteristic at the accelerated condition are widely used to assess the reliability of highly reliable products. Often, however, little degradation could be observed even in single-stress ADTs due to the high reliability of test unit, and as a result poor estimate of the reliability may be obtained. ADTs with multiple stress variables can be employed to overcome such difficulties. In this paper, optimal ADT plans with two stress variables are developed assuming that the degradation characteristic follows Weibull distribution by determining the stress levels, the proportion of test units allocated to each stress level such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

• 폴리머
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• 제29권5호
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• pp.508-517
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• 2005

가전제품용 플라스틱 재료의 열화 거동과 신뢰성을 고찰하기 위해 열분해에 따른 동역학적 매개변수를 결정하기 위하여 동역학적 열중량 분석기법을 사용하였고, 촉진 열화시험을 수행하였다. 또한, 플라스틱 재료의 내후성을 고찰하고자 제논 아크 광원을 사용하여 촉진 열화시험을 하였고, 가속 열화시험후 시료의 색차를 컬러 아이 3010 색차분석기를 이용하여 측정하였다. 재료는 중량감소율이 증가함에 따라 열분해 활성화 에너지도 증가하는 경향을 보였다. 플라스틱 재료의 열분해에 관한 기술은 Kim-Park법이 가장 효과적인 분석법으로 나타났다. 플라스틱 재료는 빠른 열화를 진행시키는 자외선에 아주 민감하게 반응하였다.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2011년도 춘계학술대회
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• pp.407-417
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• 2011

기술 발전 속도가 빨라짐에 따라 부품의 개발기간이 단축되고 있다. 더욱이 최근에는 제품들의 신뢰성이 향상되어 가속수명시험을 실시하더라도 규정된 시험 시간 동안 고장을 발견할 수 없는 경우가 많이 발생하고 있다. 또한 현업에서는 성능열화에 대한 관심이 높아지고 있으며 특히 친환경차에 대한 관심이 많아지면서 연료전지 및 납-배터리의 가속열화시험법개발에 많은 관심이 증대되고 있다. 만약 고장이 발생하지 않는다고 해서 더 가혹한 스트레스를 인가하면 전혀 다른 고장 메커니즘이 나타날 수 있기 때문에 시험의 목적을 달성하기 곤란해진다. 따라서 이런 단점을 보완하기 위해 시간에 따라 정해진 시간마다 열화 특성을 갖는 특성치를 측정하여 수명을 예측하거나 신뢰성을 평가하는 열화시험, 가속열화시험을 이용한다. 본 연구는 열화데이터 분석 방법을 정리하여 현업에 적용 가능한 분석 과정을 제안하고 향후 연료전지 및 납-배터리 가속열화시험 적용방향을 제시하고자 한다.