• 한국신뢰성학회지:신뢰성응용연구
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• 제18권1호
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• pp.80-86
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• 2018

Purpose: This article provides a mathematical model for the accelerated degradation test when the performance degradation characteristic follows the lognormal distribution. Method: For developing test plans, the total number of test units and the test time are determined based on the minimization of the asymptotic variance of the q-th quantile of the lifetime distribution at the use condition. Results: The mathematical model for the accelerated degradation test is provided. Conclusion: Accelerated degradation test method is widely used to evaluate the product lifetime within a resonable amount of cost and time. In this article. a mathematical model for the accelerated degradation test method is newly developed for this purposes.

• 한국신뢰성학회지:신뢰성응용연구
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• 제18권1호
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• pp.33-39
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• 2018

Purpose: Accelerated degradation tests can be effective in assessing product reliability when degradation leading to failure can be observed. This article proposes an accelerated degradation test model for highly reliable solid state drives (SSDs). Methods: We suggest a nonlinear mixed-effects (NLME) model to degradation data for SSDs. A Monte Carlo simulation is used to estimate lifetime distribution in accelerated degradation testing data. This simulation is performed by generating random samples from the assumed NLME model. Conclusion: We apply the proposed method to degradation data collected from SSDs. The derived power model is shown to be much better at fitting the degradation data than other existing models. Finally, the Monte Carlo simulation based on the NLME model provides reasonable results in lifetime estimation.

• 한국신뢰성학회지:신뢰성응용연구
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• 제5권4호
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• pp.413-425
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• 2005

As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents an accelerated degradation testing for vacuum fluorescent displays (VFDs). The accelerated degradation model is based on Arrhenius-lifetime relationship for cathode temperatures. We compare the results between accelerated degradation test and test at normal use condition. Accelerated degradation test for display devices is observed as an efficient method to warrantee product reliability to customers, as well as a tool to save time and costs.

• 한국신뢰성학회지:신뢰성응용연구
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• 제17권2호
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• pp.103-111
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• 2017

Purpose: Accelerated degradation tests can speed time to market and reduce the test time and costs associated with long term reliability tests to verify the required service life of a product or material. This paper proposes a service life prediction method for components or materials using an accelerated degradation tests based on the relationships between temperature and the rate of failure-causing chemical reaction. Methods: The relationship between performance degradation and the rate of a failure-causing chemical reaction is assumed and least square estimation is used to estimate model parameters from the degradation model. Results: Methods of obtaining acceleration factors and predicting service life using the degradation model are presented and a numerical example is provided. Conclusion: Service life prediction of a component or material is possible at an early stage of the degradation test by using the proposed method.

• 한국신뢰성학회지:신뢰성응용연구
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• 제16권4호
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• pp.356-363
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• 2016

Purpose: The purpose of this study is to propose efficiency of equipment testing the luminance degradation of OLED. Methods: The degradation model of Exponential model and Stretched exponential model is analyzed by goodness of fit test using calculated R-square. The degradation model having the higher R-square is finally selected. Scale parameter and Shape parameter using the selected degradation model is estimated. The activation energy and current density n using peck model among the accelerated model is estimated. the estimated parameters are analyzed by t-test. Results: The results of t-test show that the estimated parameters on chamber and hotplate are equal statistically. we can know the similarity of the luminance degradation rate and degradation pattern on chamber and hotplate. Conclusion: The result of the degradation test on chamber and hotplate is similar. when the accelerated degradation test on the panel of the OLED TV is performed, hotplate is requiring less samples, time and cost than chamber. so the accelerated degradation test on the panel of the OLED TV using the hoplate is efficient of time and cost.

• 대한산업공학회지
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• 제34권1호
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• pp.23-31
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• 2008

This paper presents accelerated degradation test plans considering adoption of tightened critical values. Under arandom coefficient degradation rate and log-linear acceleration models, the asymptotic variance of an estimatorfor a lifetime quantile at the use condition as the optimization criterion is derived where the degradation ratefollows a lognormal and Reciprocal Weibull distributions, respectively and then the low stress level andproportions ofunits allocated to each stress level are determined. We also show that the developed test plans canbe applied to the multiplicative model with measurement error.

• 품질경영학회지
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• 제43권3호
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• pp.409-420
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• 2015

Purpose: This study is to estimate the life of elevator wire rope by using the accelerated degradation test with two accelerating variables of applied load and corrosion. Methods: Linear regression method is used to find the pseudo life of elevator wire rope at each combination of accelerating variables and the median life of elevator wire rope at use condition is estimated under the assumption that the life of elevator wire rope follows lognormal distribution. Results: The particular case study demonstrated that the results of the elevator wire life estimation by using the proposed method can provide the better solutions than existing methods. Conclusion: It can be economical to use accelerated degradation model for estimating the life of elevator wire rope.

• 한국신뢰성학회지:신뢰성응용연구
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• 제3권2호
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• 한국신뢰성학회지:신뢰성응용연구
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• 제9권4호
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• pp.291-302
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• 2009

Accelerated and field degradation tests are performed for reliability assessment of an anticorrosive paint for steel structures. Test data were analyzed to obtain the degradation model and the life time distributions of the paint. A power law degradation model and lognormal performance distribution were used to predict the lifetime of the anticorrosive paint and the method of finding an acceleration factor is provided.

• 한국신뢰성학회지:신뢰성응용연구
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• 제9권2호
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• pp.71-80
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• 2009

This paper discusses the service life prediction methods for CFRP bar for concrete reinforcement using accelerated degradation tests. The relationship between performance degradation and the rate of a failure-causing chemical reaction is assumed for the temperature accelerated degradation tests. Methods of obtaining acceleration factors and predicting service life of the CFRP bar using the degradation model are presented.