Journal of Applied Reliability (한국신뢰성학회지:신뢰성응용연구)

The Korean Reliability Society (한국신뢰성학회)
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Planning of Accelerated Degradation Tests: In the Case Where the Performance Degradation Characteristic Follows the Lognormal Distribution

성능특성치의 열화가 대수정규분포를 따를 때의 가속열화시험 모형 개발

  • Lim, Heonsang (Memory Business, Samsung Electronics) ;
  • Sung, Si-Il (Department of Industrial and Management Engineering, Kyonggi University)
  • 임헌상 (삼성전자 메모리사업부) ;
  • 성시일 (경기대학교 창의공과대학 산업경영공학과)
  • Received : 2018.03.12
  • Accepted : 2018.03.20
  • Published : 2018.03.25
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Abstract

Purpose: This article provides a mathematical model for the accelerated degradation test when the performance degradation characteristic follows the lognormal distribution. Method: For developing test plans, the total number of test units and the test time are determined based on the minimization of the asymptotic variance of the q-th quantile of the lifetime distribution at the use condition. Results: The mathematical model for the accelerated degradation test is provided. Conclusion: Accelerated degradation test method is widely used to evaluate the product lifetime within a resonable amount of cost and time. In this article. a mathematical model for the accelerated degradation test method is newly developed for this purposes.

Keywords

References

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