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Modeling and Analysis of Accelerated Degradation Testing Data for a Solid State Drive (SSD)  

Mun, Byeong Min (Department of Industrial Engineering, Hanyang University)
Choi, Young Jin (Department of Industrial Engineering, Hanyang University)
Ji, You Min (NAND&Solution Development, SK Hynix)
Lee, Yong Jung (NAND&Solution Development, SK Hynix)
Lee, Keun Woo (NAND&Solution Development, SK Hynix)
Na, Han Joo (NAND&Solution Development, SK Hynix)
Yang, Joong Seob (NAND&Solution Development, SK Hynix)
Bae, Suk Joo (Department of Industrial Engineering, Hanyang University)
Publication Information
Journal of Applied Reliability / v.18, no.1, 2018 , pp. 33-39 More about this Journal
Abstract
Purpose: Accelerated degradation tests can be effective in assessing product reliability when degradation leading to failure can be observed. This article proposes an accelerated degradation test model for highly reliable solid state drives (SSDs). Methods: We suggest a nonlinear mixed-effects (NLME) model to degradation data for SSDs. A Monte Carlo simulation is used to estimate lifetime distribution in accelerated degradation testing data. This simulation is performed by generating random samples from the assumed NLME model. Conclusion: We apply the proposed method to degradation data collected from SSDs. The derived power model is shown to be much better at fitting the degradation data than other existing models. Finally, the Monte Carlo simulation based on the NLME model provides reasonable results in lifetime estimation.
Keywords
Accelerated Degradation Test; Degradation Model; Non-Linear Mixed-Effects Model; Raw Bit Error Rate; Solid State Drive;
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