Browse > Article

Analysis of Luminance Degradation characteristics of OLED using the Hotplate  

Kim, Yun-Cheol (Department of Industrial Engineering, Ajou University)
Lee, Duek-Jung (Quality Center, LG display)
Jang, Joong-Soon (Department of Industrial Engineering, Ajou University)
Publication Information
Journal of Applied Reliability / v.16, no.4, 2016 , pp. 356-363 More about this Journal
Abstract
Purpose: The purpose of this study is to propose efficiency of equipment testing the luminance degradation of OLED. Methods: The degradation model of Exponential model and Stretched exponential model is analyzed by goodness of fit test using calculated R-square. The degradation model having the higher R-square is finally selected. Scale parameter and Shape parameter using the selected degradation model is estimated. The activation energy and current density n using peck model among the accelerated model is estimated. the estimated parameters are analyzed by t-test. Results: The results of t-test show that the estimated parameters on chamber and hotplate are equal statistically. we can know the similarity of the luminance degradation rate and degradation pattern on chamber and hotplate. Conclusion: The result of the degradation test on chamber and hotplate is similar. when the accelerated degradation test on the panel of the OLED TV is performed, hotplate is requiring less samples, time and cost than chamber. so the accelerated degradation test on the panel of the OLED TV using the hoplate is efficient of time and cost.
Keywords
OLED TV Panel; Chamber; Hotplate; Luminance Degradation Rate;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
1 Shin, H. J. (2015). "Compensation and Driving Technology for OLED TV Implementation". Information display, Vol. 16, No. 3, pp. 3-10.
2 Kim, K. D., Jang, S. H., Kim, J. M. and Jang, S. M. (2012). "Characterization of Thin Film Passivation for OLED by PECVD". Korean Chemical Engeering Research, Vol. 50, No. 3, pp. 574-581.   DOI
3 Park, D. H., Park, J. W. and Song, B. S. (2009), "Reliability Engineering". EnstaKorea, pp. 100-110.
4 Seo, S. K., Kim, H. G., Gwon, H. M., Cha, M. S. and Yoon, W. Y. (2015), "Reliability Engineering". Kyobobook, pp. 407-431.
5 Yu, K. H., Lee, J. H., Kim, D. S., Lee, M. S., Yoon, Y. G., Han, J. H. and Jang, J. S. (2011) . "Life Prediction System Implementation based on degradation model for LED chip degradation characterization". The Korean Reliability Society, Vol. 2011, No. 6, pp. 79-85.
6 Lee, S. K. (2016). "A study on the performance changes of organic light-emitting diodes according to eternal stress". Hongik University, pp. 18-25.
7 Lee, M. G., Seo, I. W., Jung, H. S., Lee, J. H. and Jwa, S. H. (2016). "Warpage of Flexible OLED under High Temperature Reliability Test". The International Microelectronics and Packaging, Vol. 23, No. 1, pp. 17-22.   DOI
8 Sugimoto, K., Yoshioka, T., Kijima, H., Ohata, H., Miyaguchi, S., Tsutsui, T., Takada, N. and Murata, H. (2016). "Accelerated Lifetime Testing of White OLED Panels for Lighting". Symposium Digest of Technical Papers, Vol. 47, No. 1, pp. 1730-1733.
9 Ishii, M. and Taga, Y. (2002). "Influence of temperature and drive current on degradation mechanisms in organic light-emitting diodes". Applied Physics Letters, Vol. 80, No. 18, pp. 3430-3432.   DOI
10 Lee, S. H. (2015). "The relationship between solution-processed phosphorescent OLED materials and device performance". University of Seoul, pp. 4-5.
11 Kim, M. S., Im, H. W. and Lee, C. H. (2015). "An Accelerated Degradation Test for PMOLED". Journal of the Korea Institute of plant Engineering, Vol. 20, No. 3, pp. 51-59.
12 Fery, C., Racine, B., Vaufrey, D., Doyeux, H. and Cina, S. (2005). "Physical mechanism responsible for the Stretched exponential decay behavior of aging organic light-emitting diodes". Applied Physics Letters, Vol. 87, No. 21, pp. 213502.   DOI