• Journal of Korea Society of Industrial Information Systems
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• v.25 no.4
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• pp.17-27
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• 2020

In this paper, we proposed verification methods to prove the effectiveness of automatic test equipment (ATE) for weapon systems. Since the test results from the unproven ATE is not reliable and its use is limited as objective data, it is essential to verify the test equipment in order to guarantee the quality level of the unit under test (UUT). Through the suggested methods, it is applied to the ATE of the tactical information communications network (TICN) system to confirm the verification results and to describe the validation results.

• Journal of the Korea Society of Computer and Information
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• v.22 no.8
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• pp.1-7
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• 2017

In this paper, we proposed the test equipment that can perform separate performance tests to mass-produce the Automatic Test Equipment. Until now, the performance test of the ATE has been performed after it has been assembled perfectly. It is possible to perform the performance test only when the external device manufacturing and setting of measurement resources and the internal wiring work have been completed. So we have been studying test equipment that separately tested the switching devices that played a key role in the performance of the ATE. To build the test equipment, we reviewed the circuit card assemblies that make up the switching devices. We designed a test equipment that satisfies the performance test and apply the completed test equipment to the actual production process to analyze whether it was effective in improving the time and workability of the performance test. The test equipment has the advantage that it can be used universally in the mass production process of ATE with the same type of switching device.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.21 no.9
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• pp.144-150
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• 2020

This study examined the current status of ATE in the development stage of the domestic guided weapons field, including the re-establishment of automatic test equipment (ATE), and attempted to develop methods to verify the validity of ATE in the defense sector. This study includes methods for confirming the repeatability and reproducibility of newly manufactured or replaced ATE. An error injection test is required for validation in the development phase. And pre-inspection steps are required for validation. When developing ATE, the use of an international standard testing script language ensures efficient validation and SW reliability. This ensures interoperability between the main and test equipment, and the tester can secure a test system platform that supports standardized testing methods, which is considered to be effective in validating specific ATE for each weapon system.

• Journal of the Korea Society of Computer and Information
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• v.23 no.3
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• pp.9-16
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• 2018

In this paper, I purpose one of the development methods for portable Automatic field Test Equipment(ATE) with VME form factor. Almost portable ATE have not used to standards form factor and they are connected by mechanical non-rigid general connectors and wire harnesses among the components. Furthermore, it is hard to reuse developed board. So, it decreases to reusability of developed board and it is hard to maintenance of ATE. Even those things have weakness for vibration and drop test especially in portable ATE. The XK9A1 ATE using VME form factor has environmental reliability through vibration, drop, temperature test. It consists of 5 developed board called the control board, the wire & wireless communication board, the power supply board, the load board and the mother board. It is connected by two wire harnesses between mother board and extern circular connectors. The control board send the data and address to other board though each 16-bit data and 20-bit address line. You can develop the function board what you want to using those data & address line when it comes to needing other function board.

• Journal of Advanced Navigation Technology
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• v.21 no.5
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• pp.508-513
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• 2017

Maintainability in engineering terms means ease of maintenance / management of the product. Aircraft automatic test equipment (ATE) is heavily influenced by the design changes of the unit under test(UUT) since the test procedure is developed according to the function / performance characteristics of the UUT. Moreover, if the integrated ATE is an environment that checks more than one UUT, it is not easy to maintain the ATE for the UUT design changes. Developers should be able to flexibly cope with the change of development staff by selecting an easy and clear development method to improve the maintainability of ATE. It is also necessary to limit the area affected by the UUT design change to a specific range to minimize the area to be modified. In this paper, we propose ATE development method which focuses on maintenance improvement based on the aircraft ATE development process.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.49 no.1
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• pp.80-87
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• 2012

We have developed the ATE(Automatic Test Equipment) system for the performance test of pre-amplifier of thermal imaging devices. The device regenerates the electronic signals of photon detection module which is normally in weak energy, for the image signals processing. Previous ATE system was primarily and actively developed in the field of semiconductor devices quality parts inspection. Recently, it has been studied in the field of performance testing of equipment. In the field of thermal performance test equipment, however, it lacks the study of ATE compared to other areas, which causes the maintenance related to the core of military thermal imaging system maintenance to be limited. In this paper, a new study of ATE in the field of thermal imaging system is done. It is designed to be used universally for the ATE system with different types of circuit card of thermal imaging system by adopting matrix relays. Using the developed ATE measuring the pre-amplifier amplitude, an average amplified amplitude of 2.71Vpp was measured which confirms that it is within the range of theoretical analysis and also verifies the good performance of the developed ATE.

• Journal of the Semiconductor & Display Technology
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• v.5 no.4 s.17
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• pp.17-22
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• 2006

In the manufacturing processes of semiconductor, test process is important for quality of products. In the manufacturing process of dynamic memory, memory test is more important. So, automatic test equipment(ATE) is used necessarily. But, according to increase of speed of dynamic memory operation, the rapid test equipment is needed. Impedance matching between ATE and dynamic memory is expected to be an important problem for making a rapid test equipment over 1Gbps. According to increase of speed, inner impedance of ATE also works on important parameter for test. This paper is about the method that is for impedance matching of inner impedance and coaxial cable occurring in manufacturing of ATE. We proved effects of inner impedance by electric theory and verified the method of impedance matching using computer simulation.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.3
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• pp.259-262
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• 2013

Multi-site testing is considered as a solution to reduce test costs. This paper presents a new channel sharing architecture that enables I/O pins to share automatic test equipment (ATE) channels using simple circuitry such as tri-state buffers, AND gates, and multiple-input signature registers (MISR). The main advantage of the proposed architecture is that it is implemented on probe cards and does not require any additional circuitry on a target device under test (DUT). In addition, the proposed architecture can perform DC parametric testing of the DUT such as leakage testing, even if the different DUTs share the same ATE channels. The simulation results show that the proposed architecture is very efficient and is applicable to both wafer testing and package testing.

• Journal of the Korea Society of Computer and Information
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• v.22 no.7
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• pp.9-16
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• 2017

In this paper, we propose a development method of portable Automatic Test Equipment based on PXIe platform. Legacy VME form factor structured test equipment has limited reuse and expansion of modules due to unapplied bus specification. In particular, these limitations can cause development periods and costs to increase, and the reliability of environmental conditions is lacking due to non-standard modules. The test equipment of the proposed PXIe platform can use diverse COTS modules to shorten the development period and minimize the instability between developments. The PXIe development module works with standard Xilinx FPGAs, PXIe Windows device drivers, and applications on standard PXIe buses. The use of standard bus and COTS modules increases scalability and reusability, enabling rapid development and excellent maintenance. Through the test, we show the proposed test equipments can be implemented efficiently between the development processes and proved their reliability through function tests and environmental tests.

• Journal of the Korea Society of Computer and Information
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• v.27 no.1
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• pp.51-59
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• 2022

As the weapon system's dependence on software functions increased, software became a key factor in controlling the weapon system. In addition, as software development becomes more important domestically and internationally, software verification becomes an issue. The recent defense market has recognized this point and is demanding a plan for weapon system software maintenance. In this paper, we propose a weapon system software maintenance plan using Automatic Test Equipment. The specific method is to use a simulator to check the software function and identify failure cases. This is an effective way for developers to reduce the Total Corrective Maintenance Time(TCM) of the weapon system by reducing the time it takes to identify failure cases. It has been proven that the proposed Automatic Test Equipment can achieve software maintenance and excellent Maintainability and Operational Availability compared to the existing ones.