• 한국신뢰성학회지:신뢰성응용연구
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• 제3권2호
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• 한국신뢰성학회지:신뢰성응용연구
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• 제11권3호
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• pp.267-279
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• 2011

LEDs have been used extensively in the mobile device, automobile, and general lighting because they are semi-permanent, long life, less power consumption, reliable and environmentally friendly. In this paper, the accelerated degradation test(ADT) for a general lighting 4W LED Lamp using external converter is considered. The conditions of ADT are high temperature and high humidity. We show that its life time is log-normally distributed with same parameters under both a normal condition and an accelerated condition, and also derive an accelerated factor.

• 한국전기전자재료학회논문지
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• 제30권10호
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• pp.631-636
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• 2017

The degradation mechanism of $Mo_xW_{1-x}Si_2$ ultrahigh-temperature heating elements fabricated by self-propagating high-temperature synthesiswas investigated. The $Mo_xW_{1-x}Si_2$ specimens (with and without post-annealing) were subjected to ADTs (accelerated degradation tests) at temperatures up to $1,700^{\circ}C$ at heating rates of 3, 4, 5, 7, and $14^{\circ}C/min$. The surface loads of all the specimen heaters were increased with the increase in the target temperature. For the $Mo_xW_{1-x}Si_2$ specimens without annealing, many pores and secondary-phase particles were observed in the microstructure; the surface load increased to $23.9W/cm^2$ at $1,700^{\circ}C$, while the bending strength drastically reduced to 242 MPa. In contrast, the $Mo_xW_{1-x}Si_2$ specimens after post-annealing retained $single-Mo_xW_{1-x}Si_2$ phases and showed superior durability after the ADT. Consequently, it is thought that the formation of microcracks and coarse secondary phases during the ADT are the main causes for the degraded performance of the $Mo_xW_{1-x}Si_2$ heating elements without post-annealing.

• 대한기계학회논문집A
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• 제41권10호
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• pp.997-1004
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• 2017

엘리베이터 와이어로프의 수명은 제품의 매우 중요한 특성 가운데 하나로서 사용자의 안전 및 장비의 정비 정책과 밀접한 관계가 있다. 엘리베이터 와이어로프의 수명을 사용조건에서 측정하는 것은 매우 비경제적이다. 이 연구에서는 엘리베이터 와이어로프 (8x19W-IWRC)의 가속열화시험 데이터를 활용하여 와이어로프의 수명을 추정하는 방법을 다루었다. 굽힘피로시험기를 이용하여 가속열화시험을 진행하였으며 가속변수로는 인장하중을 사용하였다. 와이어로프의 수명은 대수정규분포를 가정하였고, 선형회귀모형을 이용하여 가수명을 구한 후 가속수명모형을 이용하여 와이어로프의 수명을 추정하는 방법과 고장 확률에 대한 로지스틱 회귀모형을 이용하여 추정하는 방법을 제시하고 두 모형의 수명 추정결과를 비교하였다.

• Macromolecular Research
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• 제17권3호
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• pp.149-155
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• 2009

The thermal decomposition behavior and degradation characteristics off our different thermotropic liquid crystalline polymers (TLCPs) were studied. The thermal decomposition behavior was determined by means of thermogravimetric analysis (TGA) at different heating rates in nitrogen and air. The order of the thermal stability was as follows: multi-aromatic polyester > hydroxybenzoic acid (HBA)/hydroxynaphthoic acid (HNA) copolyester > HNA/hydroxyl acetaniline (HAA)/terephthalic acid (TA) copolyester > HBA/Poly(ethylene terephthalate) (PET) copolyester. The activation energies of the thermal degradation were calculated by four multiple heating rate methods: Flynn-Wall, Friedman, Kissinger, and Kim-Park. The Flynn-Wall and Kim-Park methods were the most suitable methods to calculate the activation energy. Samples were exposed to an accelerated degradation test (ADT), under fixed conditions of heat ($63{\pm}3^{\circ}C$), humidity ($30{\pm}4%$) and Xenon arc radiation ($1.10\;W/m^2$), and the changes in surface morphology and color difference with time were determined. The TLCPs decomposed, discolored and cracked upon exposure to ultraviolet radiation.

• 한국신뢰성학회지:신뢰성응용연구
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• 제17권1호
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• pp.66-71
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• 2017

Purpose: Polymer capacitors are known to have very high reliability as compared with liquid electrolytic capacitors, but their capacity has been reported to decrease in charge and discharge at low temperature. The purpose of this study to clarify these characteristics. Methods: In order to clarify these characteristics, charging-discharging tests were carried out for 200 hours with three different capacities and at 5 different temperature from $5^{\circ}C$ to $100^{\circ}C$. Results: As a result of the test, it was confirmed that the capacity of the polymer capacitor was decreased with higher capacity and lower temperature. Conclusion: Such a failure phenomenon was caused by the shrinkage and expansion characteristics of the polymer used therein, it is presumed that this failure phenomenon is due to the complex pore structure made by etching.