• Journal of Applied Reliability
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• v.3 no.2
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• Journal of Applied Reliability
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• v.11 no.3
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• pp.267-279
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• 2011

LEDs have been used extensively in the mobile device, automobile, and general lighting because they are semi-permanent, long life, less power consumption, reliable and environmentally friendly. In this paper, the accelerated degradation test(ADT) for a general lighting 4W LED Lamp using external converter is considered. The conditions of ADT are high temperature and high humidity. We show that its life time is log-normally distributed with same parameters under both a normal condition and an accelerated condition, and also derive an accelerated factor.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.30 no.10
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• pp.631-636
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• 2017

The degradation mechanism of $Mo_xW_{1-x}Si_2$ ultrahigh-temperature heating elements fabricated by self-propagating high-temperature synthesiswas investigated. The $Mo_xW_{1-x}Si_2$ specimens (with and without post-annealing) were subjected to ADTs (accelerated degradation tests) at temperatures up to $1,700^{\circ}C$ at heating rates of 3, 4, 5, 7, and $14^{\circ}C/min$. The surface loads of all the specimen heaters were increased with the increase in the target temperature. For the $Mo_xW_{1-x}Si_2$ specimens without annealing, many pores and secondary-phase particles were observed in the microstructure; the surface load increased to $23.9W/cm^2$ at $1,700^{\circ}C$, while the bending strength drastically reduced to 242 MPa. In contrast, the $Mo_xW_{1-x}Si_2$ specimens after post-annealing retained $single-Mo_xW_{1-x}Si_2$ phases and showed superior durability after the ADT. Consequently, it is thought that the formation of microcracks and coarse secondary phases during the ADT are the main causes for the degraded performance of the $Mo_xW_{1-x}Si_2$ heating elements without post-annealing.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.41 no.10
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• pp.997-1004
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• 2017

The life of elevator wire ropes is one of the most important characteristics of an elevator, which is closely related to the safety of users and its maintenance policy. It is not cost effective to measure the lifetime of elevator wire ropes during their use. In this study, the life estimation of elevator wire ropes (8x19W-IWRC) is considered using accelerated degradation test data. A bending fatigue tester is used to perform the accelerated degradation tests, incorporating the acceleration factor of tensile force. Assuming that the life of wire ropes is log-normally distributed, two life estimation methods are suggested and their results are compared. The first method estimates the life of wire ropes utilizing the accelerated life model with pseudo lives obtained from a linear regression model. The second method estimates the life using a logistic model based on failure probability.

• Macromolecular Research
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• v.17 no.3
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• pp.149-155
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• 2009

The thermal decomposition behavior and degradation characteristics off our different thermotropic liquid crystalline polymers (TLCPs) were studied. The thermal decomposition behavior was determined by means of thermogravimetric analysis (TGA) at different heating rates in nitrogen and air. The order of the thermal stability was as follows: multi-aromatic polyester > hydroxybenzoic acid (HBA)/hydroxynaphthoic acid (HNA) copolyester > HNA/hydroxyl acetaniline (HAA)/terephthalic acid (TA) copolyester > HBA/Poly(ethylene terephthalate) (PET) copolyester. The activation energies of the thermal degradation were calculated by four multiple heating rate methods: Flynn-Wall, Friedman, Kissinger, and Kim-Park. The Flynn-Wall and Kim-Park methods were the most suitable methods to calculate the activation energy. Samples were exposed to an accelerated degradation test (ADT), under fixed conditions of heat ($63{\pm}3^{\circ}C$), humidity ($30{\pm}4%$) and Xenon arc radiation ($1.10\;W/m^2$), and the changes in surface morphology and color difference with time were determined. The TLCPs decomposed, discolored and cracked upon exposure to ultraviolet radiation.

• Journal of Applied Reliability
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• v.17 no.1
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• pp.66-71
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• 2017

Purpose: Polymer capacitors are known to have very high reliability as compared with liquid electrolytic capacitors, but their capacity has been reported to decrease in charge and discharge at low temperature. The purpose of this study to clarify these characteristics. Methods: In order to clarify these characteristics, charging-discharging tests were carried out for 200 hours with three different capacities and at 5 different temperature from $5^{\circ}C$ to $100^{\circ}C$. Results: As a result of the test, it was confirmed that the capacity of the polymer capacitor was decreased with higher capacity and lower temperature. Conclusion: Such a failure phenomenon was caused by the shrinkage and expansion characteristics of the polymer used therein, it is presumed that this failure phenomenon is due to the complex pore structure made by etching.