• The Journal of Korean Academy of Prosthodontics
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• v.59 no.1
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• pp.27-35
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• 2021

Purpose: The purpose of this study is to compare the accuracy of digital scans of implants according to different shapes of scanbodies, and to compare the accuracy of library merging according to different oral exposure height. Materials and methods: A master model with a single tooth edentulous site was prepared. For the first experiment, three types of intraoral scanbodies were prepared, divided into three groups, and the following experiments were conducted for each group: An internal hex implant was placed. The master model with the scanbody connected was scanned with a model scanner, and a master reference file (control group) was created. 10 files (experimental group) were created by performing 10 consecutive scans with an intraoral scanner. After superimposing the control and experimental groups, the following values were calculated: 1) Distance deviation of a designated point on the scanbody 2) Angle deviation of the major axis of the scanbody. For the second experiment, the scanbody scan data were prepared in 6 different heights. Library files were merged with each of the scan data. The distance and angular deviation were calculated using the 7 mm scan data as control group. Results: In the first experiment, there were no significant differences between A and B (P=.278), B and C (P=.568), and C and A (P=.711) in the distance deviations. There were no significant differences between A and B (P=.568), B and C (P=.546), and C and A (P=.112) in the angular deviations. Also, the scanbody showed significantly higher library merging accuracy in the groups with high oral exposure height (P<.5). Conclusion: There were no significant differences in scan accuracy according to the different shapes of scanbodies, and the accuracy of library merging increased according to exposure height of the scanbody in the oral cavity.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.12
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• pp.49-58
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• 1998

In this paper, we report new algorithms to select scan flip-flops for the no holding partial scan test method. The no holding partial scan test method is identical to the full scan test method except that some flip-flops are left unscanned. This test method does not hold scanned or unscanned flip-flops while shifting in test vectors, or applying them, or shifting out test results. The proposed algorithm allows a large number of flip-flops to be left unscanned while maintaining almost the complete full scan fault coverage.

• Journal of the Korean Society of Radiology
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• v.7 no.2
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• pp.137-143
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• 2013

This study presents comparison results between axial and spiral scanning in the head and chest region with 64 MDCT to evaluate organ doses in infants and toddlers, who are more radiosensitive to radiation than adults and rise in the number of CT examinations, during CT scanning. Organ doses were significantly lower in spiral scanning than axial scanning regardless of scanned regions. The average organ dose for the chest scan using pitch of 1.355 was found to be significantly higher(average -12.03%) than for the other two pitch settings(0.525 and 0.988) in the spiral scanning mode compared with the axial one. Organ doses in the spiral scanning mode were lower by average 20.54% than the axial scanning mode. The results of the study that evaluated organ doses with an anthropomorphic phantom will help to demonstrate the result values of Monte Carlo simulations and make a contribution to more accurate evaluations of organ doses in toddlers undergoing a CT examination.

• Journal of the Korea Society of Computer and Information
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• v.3 no.2
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• pp.105-112
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• 1998

In this paper, we propose a ESP(Extended Scan Path) architecture for multi-board testing. The conventional architectures for board testing are single scan path and multi-scan path. In the single scan path architecture, the scan path for test data is just one chain. If the scan path is faulty due to short or open, the test data is not valid. In the multi-scan path architecture, there are additional signals in multi-board testing. So conventional architectures are not adopted to multi-board testing. In the case of the ESP architecture, even though scan path is either short or open, it doesn't affect remaining other scan paths. As a result of executing parallel BIST and IEEE 1149.1 boundary scan test by using the proposed ESP architecture, we observed that the test time is short compared with the single scan path architecture. By comparing the ESP architecture with single scan path responding to independency of scan path, test time and with multi-scan path responding to signal, synchronization, we showed that the architecture has improved results.

• Journal of the Korea Society for Simulation
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• v.21 no.4
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• pp.91-102
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• 2012

Network port scan attack is the method for finding ports opening in a local network. Most existing IDSs(intrusion detection system) record the number of packets sent to a system per unit time. If port scan count from a source IP address is higher than certain threshold, it is regarded as a port scan attack. The degree of risk about source IP address performing network port scan attack depends on attack count recorded by IDS. However, the measurement of risk based on the attack count may reduce port scan detection rates due to the increased false negative for slow port scan. This paper proposes a method of summarizing 4 types of information to differentiate network port scan attack more precisely and comprehensively. To integrate the riskiness, we present a risk index that quantifies the risk of port scan attack by using PCA. The proposed detection method using risk index shows superior performance than Snort for the detection of network port scan.

• The Korean Journal of Nuclear Medicine
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• v.33 no.6
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• pp.493-501
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• 1999

Purpose: We conducted a comparative study to evaluate the diagnostic values of T1-201, Tc-99m MIBI and I-131 scans in the follow-up assessment after ablative I-131 therapy in differentiated thyroid cancer. Materials and Methods: The study population consisted of 20 patients who underwent surgical removal of thyroid cancer and ablative radioactive iodine therapy, and followed by one or mote times of I-131 retreatments (33 cases). In all patients, T1-201, Tc-99m MIBI, diagnostic and therapeutic I-131 scans were performed and the results were analyzed retrospectively. Also serum thyroglobulin levels were measured in all patients. The final diagnosis of recurrent or metastatic thyroid cancer was determined by clinical, biochemical, radiologic and/or biopsy findings. Results: Positive rates (PR) of Tc-99m MIBI, T1-201, diagnostic and therapeutic I-131 scans in detecting malignant thyroid tissue lesions were 70% (19/27), 54% (15/28), 35% (17/48) and 63% (30/48), respectively. The PR in the group of 20 cases (28 lesions) who underwent concomitant T1-201 and I-131 scans were in the order of therapeutic 131 scan 71%, T1-201 scan 54% and diagnostic I-131 scan 36%. There was no statistically significant difference between T1-201 and diagnostic I-131 scans (p>0.05). In the group of 20 cases (27 lesions) who underwent concomitant Tc-99m MIBI and I-131 scans, the PR were in the order of Tc-99m MIBI scan 70%, I-131 therapeutic scan 52% and I-131 diagnostic scan 33%. The PR of Tc-99m MIBI was significantly higher than that of diagnostic I-131 scan (p<0.05). Conclusion: Tc-99m MIBI scan is superior to diagnostic I-131 scan in detecting recurrent or metastatic thyroid cancer following ablation therapy in patients with differentiated thyroid cancer. T1-201 scan did not showed significantly higher positive rate than diagnostic I-131 scan. Instead of diagnostic I-131 scan before the I-131 retreatment, Tc-99m MIBI scan without discontinuing thyroid hormone replacement would be a prudent and effective approach in the management of these patients.

• The Journal of the Korea Contents Association
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• v.5 no.1
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• pp.229-236
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• 2005

Testing time and power consumption during testing System-On-a-Chip (SOC) are becoming increasingly important as the IP core increases in a SOC. We present a new algorithm to reduce the scan-in power and test data volume using the modified scan latch reordering. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.20 no.8
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• pp.1-7
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• 2019

When using conventional 3D image scanning methods, it is common for image scanning to be done manually, which is labor-intensive. Scanning a space made up of complicated equipment or scanning a narrow space that is difficult for the user to enter, is problematic, resulting in quality degradation due to the presence of shadow areas. This paper proposes a method to scan an image using a rover equipped with a scanner in areas where it is difficult for a person to enter. To control the scan path precisely, the 3D image remote scan automation method based on the rover move rule definition is described. Through the study, the user can automate the 3D scan plan in a desired manner by defining the rover scan path as the rule base.

• Proceedings of the IEEK Conference
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• 2003.07b
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• pp.1205-1208
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• 2003

본 논문에서는 분할된 스캔을 이용한 저전력 BIST 구조를 제안한다. 제안하는 BIST는 내부 스캔 패스를 회로의 구조적인 정보와 테스트 패턴 집합의 특성에 따라 4개의 스캔 패스로 분할하고 일부 스캔 패스에만 입력패턴이 인가되도록 설계하였다. 따라서 테스트 패턴 입력 시에 스캔 패스로의 쉬프트 동작 수를 줄임으로써 회로 내부의 전체 상태천이 수를 줄일 수 있다. 또한 4개로 분할되는 스캔패스의 길이를 고려하여 각 스캔 패스에 대해 1/4의 속도로 낮춰진 테스트 클럭을 인가함으로써 전체 회로의 전력 소모를 줄일 수 있도록 하였다. ISCAS89 벤치마크 회로에 대한 실험을 통하여 제안하는 BIST 구조가 기존 BIST 구조에 비해 최대 21%까지 전력소모를 줄일 수 있음을 확인하였다.

• Journal of KIISE:Computer Systems and Theory
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• v.26 no.9
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• pp.1177-1184
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• 1999

본 논문에서는 스캔플립프롭 선택 시간이 짧고 높은 고장 검출률(fault coverage)을 얻을 수 있는 새로운 부분스캔 설계 기술을 제안한다. 순차회로에서 테스트패턴 생성을 용이하게 하기 위하여 완전스캔 및 부분스캔 설계 기술이 널리 이용되고 있다. 스캔 설계로 인한 추가영역을 최소화 하고 최대의 고장 검출률을 목표로 하는 부분스캔 기술은 크게 구조분석과 테스트 가능도(testability)에 의한 설계 기술로 나누어 볼 수 있다. 구조분석에 의한 부분스캔은 짧은 시간에 스캔플립프롭을 선택할 수 있지만 고장 검출률은 낮다. 반면 테스트 가능도에 의한 부분스캔은 구조분석에 의한 부분스캔보다 스캔플립프롭의 선택 시간이 많이 걸리는 단점이 있지만 높은 고장 검출률을 나타낸다. 본 논문에서는 구조분석에 의한 부분스캔과 테스트 가능도에 의한 부분스캔 설계 기술의 장단점을 비교.분석하여 통합함으로써 스캔플립프롭 선택 시간을 단축하고 고장 검출률을 높일 수 있는 새로운 부분스캔 설계 기술을 제안한다. 실험결과 대부분의 ISCAS89 벤치마크 회로에서 스캔플립프롭 선택 시간은 현격히 감소하였고 비교적 높은 고장 검출률을 나타내었다.Abstract This paper provides a new partial scan design technique which not only reduces the time for selecting scan flip-flops but also improves fault coverage. To simplify the problem of the test pattern generation in the sequential circuits, full scan and partial scan design techniques have been widely adopted. The partial scan techniques which aim at minimizing the area overhead while maximizing the fault coverage, can be classified into the techniques based on structural analysis and testabilities. In case of the partial scan by structural analysis, it does not take much time to select scan flip-flops, but fault coverage is low. On the other hand, although the partial scan by testabilities generally results in high fault coverage, it requires more time to select scan flip-flops than the former method. In this paper, we analyzed and unified the strengths of the techniques by structural analysis and by testabilities. The new partial scan design technique not only reduces the time for selecting scan flip-flops but also improves fault coverage. Test results demonstrate the remarkable reduction of the time to select the scan flip-flops and high fault coverage in most ISCAS89 benchmark circuits.