• Title/Summary/Keyword: 혼성신호 테스트

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Mixed-Signal Circuit Testing Using Digital Input and Frequency Analysis (디지털입력과 주파수 성분 분석을 통한 혼성신호 회로 테스트 방법)

  • 노정진
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.4
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    • pp.34-41
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    • 2003
  • A new technique for detecting parametric faults in mixed signal circuits is proposed Pseudo-random sequence from linear feedback shift register(LFSR) is fed to circuit-under-test (CUT) as stimulus and wavelets are used to compact the transient response under this stimulus into a small number of signature. Wavelet based scheme decomposes the transient response into a number of signal in different frequency bands. Each decomposed signal is compacted into a signature using digital integrator. The digital pulses from LFSR, owing to its pseudo-randomness property, are almost uniform in frequency domain, which generates multi-frequency response when passed through CUT. The effectiveness of this technique is demonstrated in our experimental results.

An BIST for Mixed Signal Circuits (혼성회로를 위한 BIST설계)

  • Bahng, Geum-Hwan;Kang, Sung-Ho;Lee, Young-Hee
    • Proceedings of the Korea Information Processing Society Conference
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    • 2001.10b
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    • pp.1459-1462
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    • 2001
  • 혼성 신호 회로의 설계에 있어 저비용의 고효율 테스트 효율을 보장하기 위해 테스트의 노력은 계속되어 왔다. 특히 테스트를 고려한 BIST(built-in-self-test)설계 방법으로 발전해가고 있는 추세인데, 회로상에서 전체적인 테스트 용이도와 분석에 있어 보다 향상된 방법으로 접근할 수 있고 이러한 시스템에 대해 분석하는데 수월하게 할 수도 있다. 이 논문에서는 효과적인 테스트를 위한 방법을 위해 전압 검출기를 이용한 기준 전압 DC 테스트로써 테스트시간을 감소시키고 효과적인 고장 검출률을 갖는 BIST를 구현하는 것을 제안하였다. 즉 정상적인 회로와 고장회로에서의 동작에서 전압의 파이를 검출하는 회로를 하드웨어상으로 구성함으로써 비용과 시간등을 효과적으로 줄이는 방법을 제안하였다. 실험 결과에서는 기존의 BIST와 비교하여 향상된 것을 나타낸다.

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An Efficient BIST for Mixed Signal Circuits (혼성 신호 회로에 대한 효과적인 BIST)

  • Bang, Geum-Hwan;Gang, Seong-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.39 no.8
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    • pp.24-33
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    • 2002
  • For mixed signal circuits that integrate both analog and digital blocks onto the same chip, testing the mixed circuits has become the bottleneck. Since most of mixed signal circuits are functionally tested, mixed signal testing needs expensive automatic test equipments for test input generation and response acquisition. In this paper, a new efficient BIST is developed which can be used for mixed signal circuits. In the new BIST, only faults on embedded resistances, capacitances and its combinations are considered. To guarantee the quality of chips, the new BIST performs both voltage testing and phase testing. Using these two testing modes, all the faults are detected. In order to support this technique, the voltage detector and the phase detector are developed. Experimental results prove the efficiency of the new BIST.

Time-division Multiplexing Scheme for Analog Response Analysis (시분할 멀티플렉싱 기법을 이용한 아날로그 회로응답 분석)

  • 노정진
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.2
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    • pp.126-136
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    • 2003
  • We propose a new technique to improve the parametric fault coverage of oscillation test method (OTM). The OTM has been popular as a vectorless scheme for analog circuit test, both as a general defect-oriented technique, as well as an oscillation built-in self- test (BIST) scheme. However, it still requires improvement in several aspects. This paper analyzes the limitation of OTM, and proposes new signature analysis scheme to improve its performance.

Trends of International Standardization on Semiconductor IP (반도체 IP의 국제 표준화 동향)

  • Lim, T.Y.;Eum, N.W.;Kim, D.Y.
    • Electronics and Telecommunications Trends
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    • v.16 no.2 s.68
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    • pp.40-52
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    • 2001
  • 본 논문은 반도체 공정이나 설계환경에 무관하게 재사용이 가능하면서 라이센스에 의해 보호되는 전자회로 설계 모듈 IP에 관한 세계적인 표준안들에 대하여 살펴본다. 현재 선진 외국의 반도체, 통신 관련 기업들은 자신들의 기능 모듈을 IP화 하는 데 있어서 1996년에 설립된 IP의 국제 표준화 단체인 VSIA의 표준안에 부합하도록 노력하고 있다. 현재까지 VSIA는 약 1,000페이지에 달하는 13종의 사양서와 표준안 및 기술문서를 개발하였으며, 전세계 200여 개의 회원기관에 공개하고 있다. 이와 같은 표준안들은 모든 회원사들이 제안하는 시스템 통합, 테스트, 혼성신호, 온칩버스, 검증, 보안 등의 표준관련 제안들을 8개의 VSIA DWG에서 심의하여 확정하며 계속적인 보완과 수정 및 추가가 진행되고 있다. 본 고는 가장 최신 버전들을 중심으로 IP의 표준화 동향을 파악 분석하고, 표준안들의 본질을 정의하였으며, VSIA 표준안에 부합 시킬 수 있는 절차를 체계화 함으로 국내의 IP 개발에 일조를 하고자 하였다.

A New Asynchronous Pipeline Architecture for CISC type Embedded Micro-Controller, A8051 (CISC 임베디드 컨트롤러를 위한 새로운 비동기 파이프라인 아키텍쳐, A8051)

  • 이제훈;조경록
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.40 no.4
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    • pp.85-94
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    • 2003
  • The asynchronous design methods proved to have the higher performance in power consumption and execution speed than synchronous ones because it just needs to activate the required module without feeding clock in the system. Despite the advantage of CISC machine providing the variable addressing modes and instructions, its execution scheme is hardly suited for a synchronous Pipeline architecture and incurs a lot of overhead. This paper proposes a novel asynchronous pipeline architecture, A80sl, whose instruction set is fully compatible with that of Intel 80C51, an embedded micro controller. We classify the instructions into the group keeping the same execution scheme for the asynchronous pipeline and optimize it eliminating the bubble stage that comes from the overhead of the multi-cycle execution. The new methodologies for branch and various instruction lengths are suggested to minimize the number of states required for instructions execution and to increase its parallelism. The proposed A80C51 architecture is synthesized with 0.35${\mu}{\textrm}{m}$ CMOS standard cell library. The simulation results show higher speed than that of Intel 80C51 with 36 MHz and other asynchronous counterparts by 24 times.

Silicon Substrate Coupling Modeling, Analysis, and Substrate Parameter Extraction Method for RF Circuit Design (RF 회로 설계를 위한 실리콘 기판 커플링 모델링, 해석 및 기판 파라미터 추출)

  • Jin, Woo-Jin;Eo, Yung-Seon;Shim, Jong-In
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.38 no.12
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    • pp.49-57
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    • 2001
  • In this paper, equivalent circuit model and novel model parameter extraction method of a silicon(Si) substrate are presented. Substrate coupling through Si-substrate is quantitatively investigated by analyzing equivalent circuit with operating frequency and characteristic frequencies (i.e., pole and zero frequency) of a system. For the experimental verification of the equivalent circuit and parameter extraction method, test patterns are designed and fabricated in standard CMOS technology with various isolation distances, substrate resistivity, and guard-ring structures. Then, these are measured in l00MHz-20GHz frequency range by using vector network analyzer. It is shown that the equivalent-circuit-based HSPICE simulation results using extracted parameters have excellent agreement with the experimental results. Thus, the proposed equivalent circuit and parameter extraction methodology can be usefully employed in mixed-signal circuit design and verification of a circuit performance.

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