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Time-division Multiplexing Scheme for Analog Response Analysis  

노정진 (한양대학교 전자컴퓨터공학부)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.40, no.2, 2003 , pp. 126-136 More about this Journal
Abstract
We propose a new technique to improve the parametric fault coverage of oscillation test method (OTM). The OTM has been popular as a vectorless scheme for analog circuit test, both as a general defect-oriented technique, as well as an oscillation built-in self- test (BIST) scheme. However, it still requires improvement in several aspects. This paper analyzes the limitation of OTM, and proposes new signature analysis scheme to improve its performance.
Keywords
BIST; OTM;
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1 K. Arabi and B. Kaminska, 'Testing analog and mixed-signal integrated circuits using oscillation-test method', IEEE Trans. on Computer-Aided Design, Vol. 16, No. 7, pp. 745-753, July 1997   DOI   ScienceOn
2 N. Nagi, A. Chatterjee, H. Yoon and J. A. Abraham, 'Signature analysis for analog and mixed-signal circuit test response compaction', IEEE Trans. on Computer Aided Design of Integrated Circuits and Systems, Vol. 17, No. 6, pp. 540-546, June 1998   DOI   ScienceOn
3 J. Roh and J. A. Abraham, 'Subband Filtering scheme for analog and mixed-signal circuittesting', Proc. Int. Test. Conf., pp. 221-229, 1999   DOI
4 J. Roh and J. A. Abraham, 'A comprehensive TDM comparator scheme for effective analysis of oscillation-based test', IEEE Proc. VLSI Test Symposium, pp. 143-148, 2000   DOI
5 A. G. F. Dingwall, 'Monolithic expandable 6bit 20MHz CMOS/SOS A/D converter', IEEE J. of Solid-State Circuits, Vol. SC-14, No. 6, pp. 926-932, December 1979
6 K. K. Clarke and D. T. Hess, Communication Circuits: analysis and design, Addison-Wesley, 1978
7 K. Arabi, and B. Kaminska, 'Oscillation built-in self-test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits', IEEE Proc. IEEE Int. Test Conf., pp. 786-795, 1997
8 K. Arabi, and B. Kaminska, 'Parametric and catastrophic fault coverage of analog circuits in oscillation-test methodology', Proc. IEEE VLSI Test Symposium, pp. 166-171   DOI
9 K. Arabi, and B. Kaminska, 'Oscillation-test methodology for low-cost testing of active analog filters', IEEE Trans. Instrumentation and Measurement, Vol. 48, No. 4, pp. 798-806, August 1999   DOI   ScienceOn
10 K. Arabi, and B. Kaminska, 'Design for testability of embedded integrated operational amplifiers', IEEE J. of Solid-State Circuits, Vol. 33, No. 4, pp. 573-581, April 1998   DOI   ScienceOn
11 M. W.-T. Wong, 'On the issues of oscillation test methodology', IEEE Trans. Instrumentation and Measurement, Vol. 49, pp. 240-245, April 2000   DOI   ScienceOn
12 D. Vazquez, A. Rueda, J. L. Huertas, and E. Peralias, 'A high-Q bandpass fully differential SC filter ith enhanced testability', IEEE J. of Solid-State Circuits, Vol. 33, No. 7, pp. 976-986, July 1998   DOI   ScienceOn
13 G. Huertas, D. Vazquez, A. Rueda, and J. L. Huertas, 'Effective oscillation-based test for application to a DTMF filter bank', Proc. IEEE Int. Test Conf., pp. 549-555, 1999   DOI
14 M. S. Zarnik, F. Novak, and S. Macek, 'Design of osillation-based test structure for active RC filters', IEE Proceedings-Circuits Devices and Systems, Vol. 147, pp. 297-302, October 2000   DOI   ScienceOn