• Transactions of the Korean Society of Mechanical Engineers A
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• v.36 no.8
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• pp.851-856
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• 2012

The design process of a micro-probe tip is very complicated and expensive. To avoid these problems, in this study, we used element (FE) analysis. To simplify design process. A new pre-probe tip (cobra-needle type) made of Ni and Co was designed by FE analysis. Experimental results were compared with those obtained by FE analysis to verify the reliability of the analysis. The contact force and over drive were respectively found to be 12.5 gf(Contact Force) and $100{\mu}m$(Over drive). We propose the new designed probe tip. Material of new designed probe tip is NiCo. Values of Property are 1~2 gf(Contact Force) and $100{\mu}m$(Over drive).

• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.4
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• pp.1210-1215
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• 2010

The probe card are test modules which are to classify the good semiconductor chips and thin film before the packaging process. In the rapid growth a technology of semiconductor, the number of pads per unit area is increasing and pad arrays are becoming irregular. Therefore, the technology of probe card needs narrow width and lots of probe tip. In this paper, the probe tip based on the MEMS(Micro Electro Mechanical System)technology was developed a new MEMS probe tip for vertical probe card applications. For the structural designs of probe tip were performed to mechanical characteristics and structural analysis using FEM(Finite Element Method). Also, the contact force of MEMS probe tip compared with FEM results and experimental results. Finally, the MEMS probe card was developed a fine pitch smaller than $50{\mu}m$.

• Journal of the Microelectronics and Packaging Society
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• v.24 no.4
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• pp.73-77
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• 2017

Recently, fingerprint sensors have widely used for personal information security, and require quality evaluation to reduce an error of their recognition rate. Quality of fingerprint sensors is evaluated by variation of their electrical resistance introducing by contacts between a probe tip and a sensor electrode, Investigation on the materials compatability and structure optimization of probe is required to reduce deformation of sensor electrode for repeatability of quality testing. Nickel, steel(SK4), beryllium copper, and phosphor bronze were considered as probe materials, and beryllium copper was the most appropriate for materials of probe tips, considering indentation and contact resistance while being contacted probe tips on electrodes. Probes of an inspection part were manufactured with the single-unit structure for physical damage prevention and parallel processing capability. Inspection repeatability was evaluated by voltage variation of fingerprint sensors when the specific current was applied. A single-unit inspection part with beryllium copper probe tips showed excellent repeatability within ${\pm}0.003V$ of its voltage variation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.1
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• pp.1-6
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• 2011

We have developed the process of forming one body S-type cantilever probe in the recessed trench for fine-pitched MEMS probe card. The probe (cantilever beam and pyramid tip) was formed using Deep RIE etching and wet etching. The pyramid tip was formed by the wet etching using KOH and TMAH. The process of forming the curved probe was also developed by the wet etching. Therefore, the fabricated probe is applicable for the probe card for DRAM, Flash memory and RF devices tests and probe tip for IC test socket.

• Journal of the Korean Society for Aviation and Aeronautics
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• v.14 no.1
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• pp.43-48
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• 2006

The present study was carried out in order to develope a seven-hole pressure probe which is able to measure high flow angles. The seven-hole pressure probe is a non-nulling, directional velocity probe used for measuring three dimensional flow that having high flow angles. A 4 mm diameter seven-hole conical pressure probe was manufactured with a cone angle of 70$^{\circ}$. The probe was comprised of seven 1 mm diameter stainless steel tubes packed close together and fitted into an outer stainless steel sleeve. The calibration procedure is based on the use of the Callington's polynomial curve-fit method. The validity of the seven-hole conical pressure probe is demonstrated by comparisons with hot-wire data.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.3 no.3
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• pp.661-669
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• 1999

A probe card is one of the most important pan of test systems as testing IC(integrated circuit) chips. This work was related to bump-type silicon vertical probe card which enabled simultaneous tests for multiple semiconductor chips. The probe consists of silicon cantilever with bump tip. In order to obtain optimum size of the cantilever, the dimensions were determined by FEM(finite element method) analysis. The probe was fabricated by RIE(reactive ion etching), isotropic etching, and bulk-micromachining using SDB(silicon direct bonding) wafer. The optimum height of the bump of the probe detemimed by FEM simulation was 30um. The optimum thickness, width, and length of the cantilever were 20 $\mum$, 100 $\mum$,and 400 $\mum$,respectively. Contact resistance of the fabricated probe card measured at contact resistance testing was less than $2\Omega$. It was also confirmed that its life time was more than 20,000 contacts because there was no change of contact resistance after 20,000 contacts.

• Journal of Advanced Marine Engineering and Technology
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• v.26 no.3
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• pp.353-361
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• 2002

The tip leakage flow passing through the clearance between rotor blade tip and casing shroud has been known to occupy an important portion of the rotor overall loss. In this study, flow characteristics in axial flow rotors with different tip clearances is investigated by experimental and numerical methods. The experimental study was carried out to measure static pressure and velocity profiles at the real rotating test rig. The axial flow rotors used for the experiments have ten blades and three different rotor diameter. The tip clearance heights are 1mm, 3mm, and 4.5mm. Measurements were done using spherical type five-hole probe by non-nulling method. The numerical study was carried out to calculate pressure distributions and velocity vectors at the same condition as the experiments in the flow fields of axial flow rotors using Phoenics code.

• Journal of the Korean Society for Precision Engineering
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• v.23 no.12 s.189
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• pp.122-127
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• 2006

This paper reports on the development of carbon nanotube tip modified with focused ion beam(FIB). We used an electric field which causes dielectrophoresis, to align and deposit CNTs on a metal-coated canning Probe Microscope (SPM) tip. Using the CNT attached SPM tip, we have obtained an enhanced resolution and wear property compared to that from the bare silicon tip through the scanning of the surface of the bio materials. The carbon nanotube tip was aligned toward the source of the ion beam allowing their orientation to be changed at precise angles. By this technique, metal coated carbon nanotube tips that are several micrometer in length are prepared for SPM.

• The KSFM Journal of Fluid Machinery
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• v.12 no.2
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• pp.39-45
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• 2009

Leakage flow through turbine blade tip gap causes strong leakage vortex near the blade suction side and induces large aerodynamic losses. In this study, the conventional plane tip and various squealer tip blades were tested in a linear cascade in order to measure the effect of the tip shape on the total pressure loss. Three tip gap clearances of 0.6%, 1.3%, and 2.0% of blade span were tested. Flow measurement was conducted at one chord downstream from the trailing edge with a five-hole probe. Results showed that the leakage vortex was stronger than passage vortex and the mass averaged overall total pressure loss through the cascade was the lowest for suction side blade tip case. For all tested cases, the area averaged overall total pressure loss was increased as the tip clearance increased.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2013.05a
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• pp.137-137
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• 2013

본 연구에서는 반도체 검사 장비인 프로브 카드의 핵심 부품인 프로브 니들의 팁 부분의 내마모성을 향상시키기 위하여 무전해 Ni-B-W 합금 도금 실험을 실시하였다. 무전해 Ni-B-W 합금 도금 실험에서 여러 가지 제어인자 중 도금욕의 pH와 온도 그리고 환원제의 농도 등을 변수로 하였다. 도금욕 pH와 온도에 따른 전착속도 및 물성 변화를 관찰하였으며, 환원제 농도 변화에 의한 open circuit potential의 변화를 측정하였다.