Design of Vertical Type Probe Tip Using Finite Element Analysis
![]() |
Oh, Young-Ryun
(Dept. of Mechanical Engineering, Korea Univ.)
Kim, Yun-Jae (Dept. of Mechanical Engineering, Korea Univ.) Nam, Hyun-Suk (Dept. of Mechanical Engineering, Korea Univ.) Park, Ung-Gi (LEENO Industrial INC.) Lee, Hak-Joo (Korea institute of machinery & materials) Kim, Jung-Yub (Korea institute of machinery & materials) Park, Jun-Hyub (Dept. of Mechanical Engineering, Tongmung Univ.) |
1 | Bates, R. D., 1997, "The Search for the Universal Probe Card Solution," International Test Conference, Nov, pp.533-538 |
2 | Huang, J.-T., Hsu, H.-J., Chao, P.-S., Lee, K.-Y., Wu, C.-S., Shih, S.-H., Lin, M.-Z., Lee, F.-Y. and Lan, Z.- C., 2007, "Fabrication of a MEMS-Based Cobra Probe," IEEE |
3 | Park, J.-H. and Kim, Y.-J., 2007, " A novel Tensile Specimen and Tensile Tester for Mechanical Properties of Thin Films," Trans. Of the KSME(A), Vol. 31, No. 6, pp. 644-650 과학기술학회마을 |
4 | Shin, M.-s. and Park, J.-h., 2008, "Design of Probe Tip using Design of Experiment," Proceedings of the KSME Spring Annual Meeting 2008, 08RE003, pp. 7-8 |
5 | Weeden, O., "Probe Card Tutorial," Keithley Instruments, Inc. |
![]() |