• Journal of Sensor Science and Technology
• /
• v.3 no.2
• /
• pp.74-80
• /
• 1994

Silicon direct bonding technology is very attractive for both silicon-on-insulator devices and sensor fabrication because of its thermal stress free structure and stability. The process of SDB includes hydration of silicon wafer and heat treatment in a wet oxidation furnace. After hydration process, hydroxyl groups of silicon wafer were analyzed by using Fourier transformation-infrared spectroscopy. In case of hydrophilic treatment using a ($H_{2}O_{2}\;:\;H_{2}SO_{4}$) solution, hydroxyl groups are observed in a broad band around the 3474 $cm^{-1}$ region. However, hydroxyl groups do not appear in case of diluted HF solution. The bonded wafer was etched by using tetramethylammonium hydroxide etchant. The surface of the self etch-stopped silicon dioxide is completely flat, so that it can be used as sensor applications such as pressure, flow and acceleration, etc..

• Journal of the Korean Geographical Society
• /
• v.42 no.4
• /
• pp.506-525
• /
• 2007

Incision into bedrock channel is the primary control of landform evolution, but research into bedrock incision process stagnated for long time. Due to the scaling problem of the application of results from flume studies to bedrock channel, there is a strong need to simulate the bedrock incision process with more realistic models. As a part of investigation into controls of bedrock channel incision, three-dimensional changes of rock surface with abrasion was investigated with physical modelling. 18 rock plates were abraded with various sediment particle size and sediment load and abraded surfaces of the plates were scanned with high resolution 3-D scanner. To identify the spatial pattern of erosion of the rock plates, various methods were used. There was no synthetic or holistic method that showed all features of bedrock plate produced by abrasion, so each plate was analyzed using some available methods. Contour maps, shaded relief maps and profiles show that abrasion concentrated on the centre of plate (cross profile) and upstream and downstream edges (longitudinal profile) and eroded area extended inwards. It also found that the cracks and boundaries of forming materials easily eroded than other parts. Changing patterns of surface roughness were investigated with profiles, regression analysis and spectral analysis. Majority of plates showed decrease in small-scale roughness, but it depends on microstructures of the plates rather than general hardness or other factors. SEM inspection results supported this idea.

• Proceedings of the Korean Institute of Surface Engineering Conference
• /
• 2015.11a
• /
• pp.33-42
• /
• 2015

오늘날 연성회로기판(FCCL : Flexible Copper Clad Laminate)은 디스플레이, 스마트폰, 자동차, 항공, 의료 기기, 산업용 컨트롤 기기 등 거의 모든 고급 전자 제품들에 사용되고 있다. 특히 디스플레이 분야에서는 뛰어난 연성과 내구성을 바탕으로 경박단소화에 유리할 뿐만 아니라 구동부에 적용이 가능한 장점 등으로 그 적용처가 점점 늘어나고 있는 추세이다. 이 가운데서도 LCD와 OLED의 구동소자(Display Driver IC)를 장착하는 COF(Chip on Film)는 대표적인 연성회로기판(FCCL) 적용 부품으로서, 최근 인기를 끌고 있는 디스플레이의 제로-베젤(Zero-bezel)을 가능케 하는 핵심 부품이다. COF용 연성회로기판(FCCL) 소재로는 우수한 평탄도, 파인피치(Fine-pitch)구현성, 내굴곡성, 광투과성 등을 보유하고 있는 Sputtering Type FCCL이 사용되고 있다. 특히 최근 Display 분야의 화두가 되고 있는 POLED(Plastic-OLED) 패널을 장착한 Flexible Mobile 디스플레이의 경우, 기존의 COG(Chip on Glass) 접합방식이 아닌 COF 접합방식을 채택하고 있으며, 기존의 단면 COF보다 3배의 고해상도 구현이 가능한 양면 COF를 채택하기에 이르렀다. 기존의 COF 제작공정과 달리 Semi Additive 공정으로 제작되는 양면 COF 시장의 태동으로 양면 연성회로기판(FCCL)의 수요 증가가 예상되는 등 최근 디스플레이 기술 발전은 소재 분야에도 큰 변화를 잉태하고 있다. 이러한 최근 디스플레이 업계의 고해상도, 고속 신호 전송, 슬림화, Flexible 추세에 대응 가능한 최적의 특성을 보유하고 있는 Sputtering Type FCCL을 중심으로 디스플레이의 발전에 대응하는 소재의 기술 개발 동향을 살펴보고자 한다.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2011.02a
• /
• pp.417-419
• /
• 2011

태양전지 모듈은 back sheet, 후면 충진재, 태양전지 cell, 전면 충진재, 전면 보호유리의 구성으로 되어 있다. back sheet는 유리 또는 금속을 사용하는데 사용 재료에 따라 각각 유리봉입방식, 슈퍼스트레이트방식으로 구분된다[1]. 태양전지를 보호하기 위한 충진재는 빛의 투과율 저하가 적은 PVB(Poly Vinyl Butylo)나 내습성이 뛰어난 EVA(Ethylene Vinyl Acetate) 등이 주로 이용된다. 유리봉입방식과 슈퍼스트레이트 방식의 공통점은 모듈 전면에 투과율과 내?충격 강도가 좋은 강화 유리를 사용하는 것이다. 하지만 현재 모듈의 전면 유리는 평탄한 표면 때문에 태양고도가 낮을 때 상대적으로 반사율이 높은 단점을 가지고 있다[2]. 이러한 문제점을 해결하기 위한 방안으로 표면 유리에 요철(anti-glare) 구조를 형성하면 평면 구조의 표면에서 반사되는 태양광이 일부 태양전지 내부로 재입사가 일어나게 되어 표면 반사율이 낮아지게 되고, 이로 인하여 태양전지의 효율이 증가하게 된다. 특히 이러한 효과는 태양고도가 낮아졌을 때 요철(anti-glare) 구조에 의한 반사율의 감소가 증가하기 때문에 평면 구조보다 요철(anti-glare) 구조의 태양전지 모듈 효율이 향상될 것이다. 본 논문에서는 요철(anti-glare) 구조를 만들기 위해서 유리와 평면 구조의 유리에서의 반사율과 투과율을 측정하여 비교 분석하였고, 특히 태양고도의 고도가 변할 때를 비교하기 위하여 반사율 및 투과율을 측정 할 때 입사광의 각도를 변화시켰다. 그리고 태양전지 cell 위에 요철(anti-glare) 구조의 유리와 평명 구조의 유리를 각각 위치시킨 후 태양전지 cell의 효율변화를 확인하였다. 이때 태양전지 cell의 표면은 이방성 식각 용액을 이용하여 역피라미드 구조의 텍스쳐링 태양전지 cell과 평면 구조의 태양전지 cell을 각각 사용하여 비교하였다.

• Korean Journal of Materials Research
• /
• v.9 no.11
• /
• pp.1049-1054
• /
• 1999

Two-step growth method is suggested to enhance the alignment of highly oriented diamond films. (100) Si wafers are pretreated with negative biasing of - 200 V at $850^{\circ}C$ for 20 min with 4 % methane in hydrogen plasma. The pretreated wafers are grown under the lst-step growth conditions(2 % CH$_4$ in H$_2$, $810^{\circ}C$) from 2 hr to 35 hr, in order to obtain <100> textured films. The 2nd-step growth(2 % CH$_4$ in H$_2$, $850^{\circ}C$) is carried out to make diamond films having (100) growth planes, which are parallel to the substrate. The alignment of the films after the 1st-step growth, has been analyzed by {111} X-ray pole figure, which is improved abruptly with increasing film thickness. However, the pyramidal surface morphology is inevitable. These morphology is flattened after the 2nd-step growth by developing the (100) facets parallel to the substrate. The alignment of the highly oriented textured films after the two-step growth depends on the thickness of the 1st-step growth film.

• Tribology and Lubricants
• /
• v.35 no.6
• /
• pp.330-336
• /
• 2019

Conditioning is a process involving pad surface scraping by a moving metallic disk that is electrodeposited with diamond abrasives. It is an indispensable process in chemical-mechanical planarization, which regulates the pad roughness by removing the surface residues. Additionally, conditioning maintains the material removal rates and increases the pad lifetime. As the conditioning continues, the pad profile becomes unevenly to be deformed, which causes poor polishing quality. Simulation calculates the density at which the diamond abrasives on the conditioner scratch the unit area on the pad. It can predict the profile deformation through the control of conditioner dwell time. Previously, this effect of the diamond shape on conditioning has been investigated with regard to microscopic areas, such as surface roughness, rather than global pad-profile deformation. In this study, the effect of diamond shape on the pad profile is evaluated by comparing the simulated and experimental conditioning using two conditioners: a) random-shaped abrasive conditioner (RSC) and b) uniform-shaped abrasive conditioner (USC). Consequently, it is confirmed that the USC is incapable of controlling the pad profile, which is consistent with the simulation results.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2002.07a
• /
• pp.232-235
• /
• 2002

An 150 kV gas cluster ion accelerator was fabricated and assessed. The change of surface morphology and surface roughness were examined by an atom force microscope (AFM) after irradiation of $CO_2$ gas clusters on Si (100) surfaces at the acceleration voltages of 50 kV. The density of hillocks induced by cluster ion impact was gradually increased with the dosage up to 5$\times$10$^{11}$ ions/$\textrm{cm}^2$. At the boundary of the ion dosage of 10$^{12}$ ions/$\textrm{cm}^2$, the density of the induced hillocks was decreased and RMS (root mean square) surface roughness was not deteriorated further. At the dosage of 5x10$^{13}$ ions/$\textrm{cm}^2$, the induced hillocks completely disappeared and the surface became very flat. In addition, the irradiated region was sputtered. $CO_2$ cluster ions are irradiated at the acceleration voltage of 25 kV to remove hillocks on indium tin oxide (ITO) surface and thus to attain highly smooth surfaces. $CO_2$ monomer ions are also bombarded on the ITO surface at the same acceleration voltage to compare sputtering phenomena. From the AFM results, the irradiation of monomer ions make the hillocks sharper and the surfaces rougher On the other hand, the irradiation of $CO_2$ cluster ions reduces the hight of hillocks and planarize the ITO surfaces. From the experiment of isolated cluster ion impact on the Si surfaces, the induced hillocks m high had the surfaces embossed at the lower ion dosages. The surface roughness was slightly increased with the hillock density and the ion dosage. At higher than a critical ion dosage, the induced hillocks were sputtered and the sputtered particles migrated in order to fill valleys among the hillocks. After prolonged irradiation of cluster ions, the irradiated region was very flat and etched.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.48 no.6
• /
• pp.7-14
• /
• 2011

This paper is related to a roll-type micro-contact printing process. The proper parameters such as coating velocity, inking velocity, printing velocity and printing pressure as well as Ag contents of Ag ink were extracted to perform the fine patterning of Ag electrodes. Additionally we developed a process for PDMS with high uniform thickness. Finally, we obtained the Ag fine electrodes on $4.5cm\;{\times}\;4.5cm$ plastic substrate with the line width of 10 um, thickness less than 300 nm, surface roughness less than 40 nm, and the specific resistance of $2.08\;{\times}\;10^{-5}{\Omega}{\cdot}cm$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2007.06a
• /
• pp.85-85
• /
• 2007

최근 귀금속중의 하나인 Ruthenium(Ru)은 높은 일함수, 누설전류에 대한 높은 저항성등의 톡성으로 인해 캐패시터의 하부전극으로 각광받고 있다. 하부전극으로 증착된 Ru은 일반적으로 각 캐패시터의 분리와 평탄화를 위해 건식식각이 이루어진다. 하지만, 건식식각 공정중 유독한 $RUO_4$ 가스가 발생할 수 있으며, 불균일한 캐패시터 표면을 유발할 수 있다. 이러한 문제점들을 해결하기 위해 CMP 공정이 필요하게 되었다. 하지만, Ru은 화학적으로 매우 안정하기 때문에 Ru CMP 슬러리에 대한 연구가 필요하게 되었으며, 이에 대한 연구가 활발히 진행되고 있다. 본 연구에서는 Ru CMP 공정에서 Chemical A가 에칭제 및 산화제로 사용된 슬러리의 pH 변화와 pH 적정제에 따른 영향을 살펴보았다. Ru wafer를 이용하여 static etch rate, passivation film thickness와 wettability를 pH와 pH 적정제에 따라 비교해 보았다. 또한, pH 적정제로 $NH_4OH$와 TMAH를 이용하여 pH별 슬러리를 제작하고 CMP 공정을 실시하여 Ru의 removal rate을 측정하였다. $NH_4OH$와 TMAH의 경우 각각 130. 100 nm/min의 연마율이 측정된 pH 6에서 가장 높은 연마률을 보였으며, TMAH의 경우가 pH 전 구간에서 $NH_4OH$에 비해 낮은 연마율이 측정되었다. TEOS 에 대한 Ru의 선택비를 측정해 본 결과, $NH_4OH$의 경우 pH 8~9. TMAH의 경우 pH 6~7에서 높은 selectivity를 얻을 수 있었다.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.7 no.6
• /
• pp.1313-1318
• /
• 2006

The mechanism fur the surface film formation was studied by in situ Atomic Force Microscopy (AFM) observation of a highly oriented pyrolytic graphite (HOPG) basal plane surface during cyclic voltammetry at a slow scan-rate of 0.5 mV $s^{-1}$ in 1 moi $dm^{-3}$ (M) $LiPF_6$ dissolved in a mixture of ethylene carbonate (EC) and diethyl carbonate (DEC). Decomposition of the electrolyte solution began at a potential around 2.15 V vs. $Li^+$/Li on step edges. In the potential range 0.95-0.8 V vs. $Li^+$/Li, flat areas (hill-like structures) and large swelling appeared on the surface. It is considered that these two features were formed by the intercalation of solvated lithium ions and their decomposition beneath the surface, respectively. At potentials more negative than 0.80 V vs. $Li^+$/Li, particle-like precipitates appeared on the basal plane surface. After the first cycle, the thickness of the precipitate layer was 30 nm. The precipitates were considered to be decomposition of the lithium salt ($LiPF_6$) and solvent molecules (EC and DEC), and to have an important role in suppressing further solvent decomposition on the basal plane.