Damage Effect and Delay Time of CMOS Integrated Circuits Device with Coupling Caused by High Power Microwave (도선에 커플링 되는 고출력 전자파에 의한 CMOS IC의 피해 효과 및 회복 시간)
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- The Journal of Korean Institute of Electromagnetic Engineering and Science
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- v.19 no.6
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- pp.597-602
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- 2008