• Title/Summary/Keyword: 전자선증착

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ZnO thin film on PMMA substrate by Pulse Laser Deposition (펄스레이저증착에 의한 PMMA기판상의 ZnO박막형성)

  • Choi, Young-Jin;Lee, Cheon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.23-24
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    • 2008
  • 본 논문에서는 폴리머(Polymer)기판에서의 레이저의 조사밀도와 기판의 온도 변화에 따라서 성장하는 ZnO박막의 구조적 특성을 알아보기위해 펄스 레이저 증착 법으로 PMMA(Polymethly Methacrylate)기판상에 ZnO박막을 형성하였다. 레이저의 조사 밀도는 2 J/$cm^2$에서 3 J/$cm^2$까지 기판의 온도는 상온에서부터 $50^{\circ}C$까지 변화시켰고 박막의 구조적 특성을 X-선 회절법(XRD)과 주사 전자 현미경(SEM)으로 관찰하였다.

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Properties of Au Clusters Supported on $TiO_2$ Studied by XPS, ISS, AES, and TPD (XPS, ISS, AES, TPD를 이용한 $TiO_2$ 위에 지지된 Au 클러스터의 특성 연구)

  • Kim, Dae Young
    • Journal of the Korean Chemical Society
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    • v.42 no.6
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    • pp.607-617
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    • 1998
  • Au was dosed on $TiO_2(001)$ film grown epitaxially on Mo(100) surface in about 90 ${\AA}$ thickness. The growth mode of Au, thermal behavior and stability of the Au clusters, and the binding energy shift of Au 4f with the change in the amount of Au loading were studied by Auger Electron Spectroscopy (AES), Temperature Programmed Desorption (TPD) spectroscopy, Ion Scattering Spectroscopy (ISS), and X-ray Photoelectron Spectroscopy (XPS). Au grows three dimensionally on $TiO_2(001)$ film and the average size of Au clusters prepared at low temperature is smaller than those at higher temperature and the size increases with temperature irreversibly. Au clusters on $TiO_2(001)/Mo(100)$ start evaporation at 1000 K. TPD spectra of Au show very asymmetric peaks with the same leading edges irrespective of the amount of Au loading. The temperature at the peak maximum increases with the amount of Au. The desorption energy of Au obtained from the leading edge analysis of the TPD spectra is about 50 kcal/mol. The initial sticking coefficient of Au on $TiO_2(001)$ is constant in the temperature range of 200-600 K. The binding energy of Au 4f for the Au loaded on the film less than 2.0 MLE shifts to higher energy compared with the bulk Au. The shift is +0.3 eV at 0.1 MLE Au amount.

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Microstructures and electron mobilities of $Si/Si_{1-x}Ge_x$ MODFET structures grown by gas-source MBE (가스원 분자선 에피택시 증착법에 의한 $Si/Si_{1-x}Ge_x$ MODFET 구조의 미세조직과 전기이동도에 관한 연구)

  • 이원재
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.9 no.2
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    • pp.207-211
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    • 1999
  • $Si/Si_{1-x}Ge_x$ MODFET structures, incorporating linearly-graded buffer layers have been grown by GaS Source Molecular Beam Epitaxy. The growth temperature of the graded layers has not significantly changed the distribution of misfit dislocation. However, the surface undulation and surface defects were increased with increasing growth temperature. In $Si/Si_{1-x}Ge_x$ MODFET structures, the densities of misfit dislocations near the Si-active layers were considerably reduced in comparison with the region of graded layers. The electron mobility of $Si/Si_{1-x}Ge_x$ MODFET structure has increased with lowering the growth temperature.

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Characteristics of Transparent and Conducting Tin Oxide Film (투명전도성 Tin Oxide Film의 특성)

  • Chang Sup Ji;Tak Jin Moon;In Hoon Choi;Dok Yol Lee
    • Journal of the Korean Chemical Society
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    • v.31 no.1
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    • pp.102-109
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    • 1987
  • Some characteristics of $SnO_2$ film which was deposited on a slide glass substrate, using dibutyl tin diacetate and oxygen, by the chemical vapor deposition were observed. The optimum condition for the preparation of the film was found to be at 420$^{\circ}C$ of substrate temperature for 20 min of deposition. Important optical, electrical, and structural features of the film were examined. It was found that the typical $SnO_2$ film on the untreated substrate was 4000${\AA}$ in thickness, transmitted 90% of the visible liglit, and provided 5800 ohms/${\square}$ of the sheet resistance. It was also found that the surface treatments of the slide glass by acid leaching were beneficial. The film structure was found to be a mixture of polycrystalline tetragonal stannic oxide confirmed by the X-ray diffraction and to be spherical fine grains concluded by the scanning electron microscopy.

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Studies of the Interface between the High Indium Content InGaAs QW and GaAs Layers (고 indium 농도 InGaAs와 GaAs 박막간 계면에 관한 연구)

  • Kim, Sam-Dong
    • Korean Journal of Materials Research
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    • v.6 no.1
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    • pp.84-89
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    • 1996
  • 분자선 증착법(Molecular Beam Epitaxy)에 의하여 성장시킨 고농도 InGaAs layer에서 성장중지법이 계면 거칠기에 미치는 영향이 연구되었다. 계면을 평활화하기 위하여 단원자층의 GaAs 또는 AIAs를 InGaAs alyer 양쪽 계면에 증착한 뒤 뒤이어 성장중지를 실시하였다. Photoluminescence(PL) 측정에 의하면, 단원자 GaAs층 증착을 통한 평활화법보다 상당히 향상된 계면조건을 보여졌다. 고 분해능 단면 전자현미경법(Cross-section high resolution transmission electron microscopy, XHRTEM)에 의해 관찰되어진바, 계면 평활화법에 의해 계면의 평활성, 연속성 및 결정결함 밀도등에서 현저한 향상이 얻어졌다.

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The protection effects from water vapor permeation of inorganic films prepared by electron-beam evaporation technique (전자-선 증착 기술에 의해 성막된 다양한 무기 박막들의 투습 방지 특성)

  • Ryu, Sung-Won;Rhee, Byung-Roh;Kim, Hwa-Min
    • Journal of the Korean Vacuum Society
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    • v.17 no.1
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    • pp.9-15
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    • 2008
  • Various diatomic inorganic films and their composite films are packed as passivation films covering Ca cells on glass substrates by using an electron-beam evaporation technique. When these Ca cells are exposed to an ambient atmosphere, the water vapor penetrating through the passivation layers is absorbed in the Ca cells, resulting in a gradual progress of transparency in the Ca cells, which can be represented by changes of the optical transmittance in the visible range. Compared with the saturation times for the Ca cells to become completely transparent in the atmosphere, the protection effects of water vapor are estimated for various passivation films. The composite films consisting silicon oxide($SiO_2$) and tin oxide($SnO_2$) or zinc oxide(ZnO) are found to show a superior protection effect of water vapor as compared with diatomic inorganic films. Also, the main factors affecting the permeation of water vapor through the oxide films are found to be the polarizability and the packing density.

Study on the Properties of TiO2 Film Deposited by ALD at Low Temperature (ALD로 저온에서 증착된 TiO2 박막의 막질에 대한 연구)

  • Park, Won Hee;Shin, Jeong Woo;Yang, Byung Chan;Park, Man-Jin;Jang, Dong Young;An, Jihwan
    • Journal of the Microelectronics and Packaging Society
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    • v.23 no.2
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    • pp.43-47
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    • 2016
  • This paper covers the study on the properties of $TiO_2$ film deposited by atomic layer deposition (ALD) using TTIP and water at various temperatures including the low temperature range of <$150^{\circ}C$. At low deposition temperature, ALD $TiO_2$ films showed uniform growth rate per cycle ($0.3{\AA}/cycle$), good uniformity, smooth surface, and homogenous amorphicity. They also showed good conformality of >80% on the trench structure with the high aspect ratio of up to 75. However, relatively high concentration of impurities (C~4-7 at%) in the film was observed due to low deposition temperature.