• Title/Summary/Keyword: 저에너지 엑스선

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Radiation Damage of Semiconductor Device by X-ray (엑스선에 의한 반도체 소자의 방사선 손상)

  • Kim, D.S.;Hong, H.S.;Park, H.M.;Kim, J.H.;Joo, K.S.
    • Journal of Radiation Protection and Research
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    • v.40 no.2
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    • pp.110-117
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    • 2015
  • Recently, Due to the increased industry using radiation inspection equipment in the semiconductor, this demand of technology research is increasing. Although semiconductor inspection equipment is using low energy X-ray from 40 keV to 120 keV, Studies of radiation damage about the low energy X-ray are lacking circumstance in our country. Therefore, It is study that BJT (bipolar junction transistor) of one type of semiconductor elements are received radiation damage by low energy X-ray. BJT were used to the NXP semiconductor company's BC817-25 (NPN type), and Used the X-ray generator for the irradiation. Radiation damage of BJT was evaluated that confirm to analyse change of collector-emitter voltage of before and after X-ray irradiation when current gain fixed to 10. X-ray generator of tube voltage was setting 40 kVp, 60 kVp, 80 kVp, 100 kVp, 120 kVp and irradiation time was setting 180s, 360s, 540s into 180s intervals. As the result, We confirmed radiation damage in BJT by low energy X-ray under 120 keV energy, and Especially the biggest radiation damage was appeared at the 80 kVp. It is expected that ELDRS (enhanced low dose rate sensitivity) phenomenon occurs on the basis of 80 kVp. This studies expect to contribute effective dose administration of semiconductor inspection equipment using low energy X-ray, Also Research and Development of X-ray filter.

Inspection of electronic components using dual X-ray energy (이중 엑스선 에너지를 이용한 전자부품 검사)

  • Chon, Kwon Su;Seo, Seung Jun;Lim, Jae Hong
    • Journal of the Korean Society of Radiology
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    • v.9 no.5
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    • pp.301-306
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    • 2015
  • X-ray can be applied to obtain a projection image of an object. It is not easy to obtain an high quality image for the object composed of low and high density materials. For the object with large difference in density, it is possible to realize high contrast image using images of low and high tube voltages and image processing. The plastic and metalic parts of the electronic components can be imaged by the dual energy technique which use low and high tube voltages and by processing pixel-by-pixel using visual C++. The contrast-enhanced image can be used to detect and observe defects within the electronic components.

Monte Carlo Simulation of Transmission-Type X-ray Tube with Dual-Structured Target (이중 적층 구조 표적을 갖는 투과형 엑스선관의 몬테카를로 전산모사)

  • Kwon Su, Chon
    • Journal of the Korean Society of Radiology
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    • v.17 no.1
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    • pp.107-114
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    • 2023
  • X-ray fluorescence analysis has been widely used in the field of science and industry because it gives information about elements and their concentrations without destruction of samples. To increase analysis accuracy of fluorescence generated by photons of the transmission-type X-ray tube for mixture and compound samples would be recommend to have strong energy near 10 keV and 20 keV simultaneously. Tungsten of 9.65 keV and molybdenum of 17.48 keV were considered as targets with dual deposition structure for obtaining two strong characteristic X-rays, and the transmission-type X-ray tube was analyzed using Geant4 Monte Carlo simulation. The W-Mo structure resulted in strong characteristic X-ray near 10 keV and 20 keV simultaneously. A structure with Mo-W multilayers of 5 ㎛ thick also gave optimal spectrum. Various material combination and thickness optimization for the dual-structured target can give X-ray spectrum with strong characteristic X-ray of specific energies.

High-Resolution X-Ray Photoelectron Spectroscopy Study of a Sb2Te3 Thin Film with the Polycrystalline Phase (고해상도 엑스선 광전자 분광법을 이용한 다결정구조의 안티몬-테레니움 박막 연구)

  • Lee, Y.M.;Kim, K.;Shin, H.J.;Jung, M.C.;Qi, Y.
    • Journal of the Korean Vacuum Society
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    • v.21 no.6
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    • pp.348-353
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    • 2012
  • We investigated chemical states of a $Sb_2Te_3$ thin film with the polycrystalline phase by using high-resolution x-ray photoelectron spectroscopy with synchrotron radiation. The $Sb_2Te_3$ thin film was formed by sputtering. The rhombohedral phase was confirmed by x-ray diffraction. To remove the surface oxide, we performed $Ne^+$ ion sputtering for 1 hour with the beam energy of 1 kV and post-annealing at $100^{\circ}C$ for 5 min in ultra-high vacuum. We obtained the Te and Sb 4d core-levels spectra with the peaks at the binding energies of 40.4 and 33.0 eV, respectively. The full-width of half maximum of both the Te and Sb $4d_{5/2}$ core-levels is 0.9 eV. The Te and Sb core-levels only show a single chemical state, and we also confirmed the stoichiometry of approximately 2 : 3.

Measuring Absorbed Dose from Medical X-ray Equipment Using Optically Stimulated Luminescence Dots (광자극선량계의 저에너지 엑스선 특성비교)

  • Jung, Sook Jin;Jin, Gye Hwan
    • Journal of the Korean Society of Radiology
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    • v.12 no.1
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    • pp.79-83
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    • 2018
  • In this paper, we measured and analyzed the dose correction factor, absorbed dose linearity, peak voltage X-ray response, angular dependence. Exposure dose correction factor, absorbed dose linearity, and peak voltage linearity using the medical X-ray generator were all in accordance with IEC-62387-1 (2007). The reference to the dosimetry direction at 0, 30, and 60 degrees relative to baseline radiation exposure was -29% (${\pm}30^{\circ}$) and + 67% (${\pm}60^{\circ}$). The values measured at $30^{\circ}$ were -8% lower than the standard and -18% lower than the standard at $60^{\circ}$. Therefore, the effect of direction should be corrected when using OSL dot dosimeter.

Shielding Capability Evaluation of Slit-shaped Structure for Scattered X-ray using Monte Carlo Method (몬테카를로 방법을 이용한 슬릿형태 구조물의 차폐능력 평가)

  • Kim, Sangrok;Heo, Jaeseung
    • Journal of the Korean Society of Radiology
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    • v.14 no.6
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    • pp.733-740
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    • 2020
  • As the use of radiation for medical purposes increases, the exposure dose of medical workers is also increasing. To reduce this dose, various studies on changing the shielding material have been conducted. Recently, a new method to reduce the dose at the entrance of the radiation treatment room was proposed by using the photoelectric effect that occurs when the radiation is scattered. Because this method is particularly effective for low-energy photons, in this study, a slit-type structure was proposed as a excellent shielding structure against scattered x-ray in a general photography room, and was evaluated the shielding effect by Monte Carlo simulation. As a result of the calculation, this study found that in the case of a structure in which steel plates with a thickness of 2 mm and a width of 5 cm are stacked at 2 mm intervals, a shielding effect was approximately 99.9% or more, excluding the heights of the floor and the patient where scattering occurs directly.

The Study on Interpretation of the Scatter Degradation Factor using an additional Filter in a Medical Imaging System (의료 영상 시스템에서 부가 필터를 이용한 산란 열화 인자의 해석에 관한 연구)

  • Kang, Sang Sik;Kim, Kyo Tae;Park, Ji Koon
    • Journal of the Korean Society of Radiology
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    • v.13 no.4
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    • pp.589-596
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    • 2019
  • X-rays used for diagnosis have a continuous energy distribution. However, photons with low energy not only reduce image contrast, but also contribute to the patient's radiation exposure. Therefore, clinics currently use filters made of aluminum. Such filters are advantageous because they can reduce the exposure of the patient to radiation. However, they may have negative effects on imaging quality, as they lead to increases in the scattered dose. In this study, we investigated the effects of the scattered dose generated by an aluminum filter on medical image quality. We used the relative standard deviation and the scatter degradation factor as evaluation indices, as they can be used to quantitatively express the decrease in the degree of contrast in imaging. We verified that the scattered dose generated by the increase in the thickness of the aluminum filter causes degradation of the quality of medical images.

개인선량계의 국제상호비교연구

  • 윤석철;김장열;하정우
    • Proceedings of the Korean Nuclear Society Conference
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    • 1995.05b
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    • pp.875-881
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    • 1995
  • 원자력 연구소는 국제원자력기구(IAEA/RCA) 주관하에 1990년부터 1993년 사이 3차에 걸쳐 실시한 개인선량계에 대한 국제상호비교에 참여하였다. 국제 상호비교에 참여하여 사용된 개인선량계는 방사선작업종사자에 대한 외부방사선으로부터 피폭관리를 위하여 기 사용중인 Taedyne Isotope 사의 PB-3타입의 열형광선량계이며 선량계판독용으로 Tdedyne 9150자동판독기를 사용하였다. 본 논문에는 3차에 걸쳐 국제상호비교결과를 요약하였으며 저 에너지의 엑스선에 경우를 제외하고 모든 조사방사선에 대해 0.78에서 1.07사이에 상대비율로 결과를 나타내었다. 또한 미국기준 ANSI Nl 3.11에 의해 성능을 시험한 결과 모든 조사방사선장에 대해서 허용기준 0.5이하를 나타내었다.

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