• Title/Summary/Keyword: 저속 에너지 양전자소멸

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The Characterization of Nb3Ge by Slow Positron Annihilation Spectroscopy (저에너지 양전자 소멸 분광법을 이용한 Nb3Ge 박막 특성)

  • Lee, C.Y.;Bae, S.H.
    • Journal of the Korean Vacuum Society
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    • v.19 no.6
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    • pp.489-494
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    • 2010
  • Enhance signal-to-noise ratio, slow positron coincidence Doppler Broadening method has been applied to study of characteristics of $Nb_3Ge$ superconductor film, which were performed from 20 K to 300 K sample temperature near Tc of it. In this investigation the numerical analysis of the Doppler spectra was employed to the determination of the shape parameter, S, defined as the ratio between the amount of counts in a central portion of the spectrum and the total counts of whole spectrum. The S-parameter values between 0.598 and 0.594 were decreased while the temperature were decreasing, that indicated the voids into the samples. The temperature dependence came from specific positron trapping rate into the vacancy-type defects. It is believed that the positrons annihilate with normal-electrons instead of super-electrons in the Nb3Ge superconductor.

The Characterization of MgB2 Thin Film by Slow Positron Annihilation Spectroscopy (저에너지 양전자 소멸 분광법을 이용한 MgB2 박막 구조 특성)

  • Lee, C.Y.;Kang, W.N.;Nagai, Y.;Inoue, K.;Hasegawa, M.
    • Journal of the Korean Vacuum Society
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    • v.17 no.2
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    • pp.160-164
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    • 2008
  • The Characterization of $MgB_2$ Thin Film by Slow Positron Annihilation Spectroscopy Enhance signal-to-noise ratio, slow positron coincidence Doppler Broadening method has been applied to study of characteristics of $MgB_2$ superconductor film, which were performed at 30 K and 50 K sample temperature near Tc of it. In this investigation the numerical analysis of the Doppler spectra was employed to the determination of the shape parameter, S, defined as the ratio between the amount of counts in a central portion of the spectrum and the total counts of whole spectrum. The S-parameter values were increased then decreased while the positron implantation energies were increasing, that indicated the diffusion into the samples. The S-parameters of the anisotropic 1 ${\mu}m$ $MgB_2$ thin film which were implanted by positrons at 10 keV are 0.567 at 30 K and 0.570 at 50 K. It is believed that the positrons annihilate with normal-electrons instead of super-electrons in the $MgB_2$ superconductor.