• Journal of the Korea Computer Graphics Society
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• v.9 no.3
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• pp.7-13
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• 2003

본 논문은 사람의 실제 얼굴에서 캡쳐된 얼굴 모션 데이터를 새로운 얼굴에 재적용하는 리타켓팅 기법을 제안한다. 본 기법은 형태가 매우 상이한 얼굴 모델에도 적용이 가능하며 특히 주름같은 세밀한 모션의 리타켓팅에 적합하다. 본 기법은 다중해상도 메쉬 즉 노말메쉬(normal mesh)를 사용함으로써 소스와 타켓의 계층적으로 대응관계를 결정하고 계층적으로 리타켓팅한다. 노말 메쉬는 주어진 메쉬를 베이스 메쉬 (base mesh)와 일련의 노말 오프셋 (normal offsets)을 이용하여 근사시킨 계층적 메쉬이다. 본 리타켓팅 기법은 우선 베이스 모션을 소스 모델에서 타겟 모델로 리타켓팅한 후 그 모션 위에 노말 오프셋의 모션을 계층적으로 더해준다. 이 기법은 형태가 매우 세밀한 모션에 대하여 안정적이면서도 정교한 리타켓팅 결과를 생성한다.

• Korean Journal of Computational Design and Engineering
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• v.8 no.4
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• pp.270-277
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• 2003

In two dimensional mechanical design analysis, quadrilateral element mesh is preferred because it provides more accurate result than triangular element mesh. However, automation of quadrilateral element mesh generation is much more complex because of its geometrical complexities. In this study, an automatic quadrilateral element mesh generation algorithm based on the boundary normal offsetting method and the boundary decomposition method is developed. In so doing, nodes are automatically placed using the boundary normal offsetting method and the decomposition method is applied to decompose the designed domain into a set of convex subdomains. The generated elements are improved by relocation of the existing nodes based on the four criteria - uniformity, aspect ratio, skewness and taper degree. The developed algorithm requires minimal user inputs such as boundary data and the distance between nodes.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.1
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• pp.44-54
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• 2001

In this paper, a novel test method is proposed to detect the hard and soft fault in analog circuits. The proposed test method makes use of the offset voltage, which is one of the op-amps characteristics. During the test mode, CUT is modified to unit gain op-amps with feedback loop. When the input of the op-amp is grounded, a good circuit has a small offset voltage, but a faulty circuit has a large offset voltage. Faults in the op-amp which cause the offset voltage exceeding predefined range of tolerance can be detected. In the proposed method, no test vector is required to be applied. Therefore the test vector generation problem is eliminated and the test time and cost is reduced. In this note, the validity of the proposed test method has been verified through the example of the dual slope A/D converter. The HSPICE simulations results affirm that the presented method assures a high fault coverage.

• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.507-510
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• 1998

In this paper, a novel test method is proposed to detect hard and soft fault in CMOS operational amplifiers. Proposed test method mark use of the offset character, which is one of the op-amps characteristics. During the test mode, CUT is implemented to unit gain op-amps with feedback loop. When the input is grounded, a good circuit has a small offset voltage, but a faulty circuit has a large offset voltage exceeding predefined range of tolerance. Using the proposed method, no test vector is required to be applied. Therefore the test vector generation problem is eliminated and the test time is reduced. The accuracy and effectiveness of the method is verified through HSPICE simulation.