• Proceedings of the KWS Conference
• /
• 2002.05a
• /
• pp.266-268
• /
• 2002

• Proceedings of the KWS Conference
• /
• 2007.11a
• /
• pp.48-50
• /
• 2007

• Proceedings of the KWS Conference
• /
• 2003.05a
• /
• pp.199-200
• /
• 2003

• Proceedings of the KWS Conference
• /
• 2004.05a
• /
• pp.81-83
• /
• 2004

최근 대두되고 있는 환경오염문제로 인해 전자산업에서는 전 세계적으로 Pb 솔더에 관한 규제가 진행중에 있다. 이에 Pb free 솔더에 관한 연구가 활발히 진행 중에 있으며 그 중 Sn-Ag계 solder는 유력한 대체 solder로 대두되고 있다. (중략)

• Proceedings of the KWS Conference
• /
• 2006.05a
• /
• pp.329-331
• /
• 2006

• Proceedings of the KWS Conference
• /
• 2010.05a
• /
• pp.76-76
• /
• 2010

무연솔더 재료를 자동차 전장품에 적용하기 위해서는 고온환경에 대한 내구성 및 진동 인자에 대한 영향을 고려해야한다. 특히, ELV(End of Life Vehicles) 지침이 개정됨에 따라 고온용 무연솔더 재료에 대한 재평가가 반드시 필요한 시점이다. 이에 대해 본연구에서는 현재 상용화 된 Pb-free솔더의 재료들 중 총 4종의 Solder을 선정하여 자동차 환경에 부합하는 진동조건하에서 시험해보았다. 그리고 미세조직의 특성, 접합부 형성시의 기계적 강도 및 접합부의 신뢰성을 평가하여 보았다. 각각의 조성에 대한 CHIP type과 QFP type의 실장부품을 준비하였으며, 각각의 조성별로 솔더 페이스트로 Daisy Chain PCB에 접합하여 조성에 따른 비교 데이터를 구축할 수 있었다. 리플로우 공정후 초기의 미세조직 및 전당강도, 저항값을 측정하여 진동시험에 따른 데이터와 비교하였다. 주파수는 10Hz~1,000Hz였으며, 진동가속도는 $29.4m/s^2$, 20시간의 랜덤진동이 적용되는 동안 챔버내의 온도는 상온으로 유지되었다. 진동시험과 이에 따른 저항측정을 통하여 진동 주파수와 시간에 따른 실장 부품이 받는 진동 영향과 실시간 저항값을 측정하였으며, 이때의 미세조직 비교를 통해 진동특성을 평가하였다. 진동 주파수에 따른 저항값의 변화가 있었으며, 진동전후 전단강도에도 영향을 주었다. QFP type에서는 SAC105가 진동에 가장 취약하였으며, CHIP type에서는 SACX0307이 진동에 가장 취약하였다.

• Journal of the Microelectronics and Packaging Society
• /
• v.15 no.4
• /
• pp.65-70
• /
• 2008

The mechanical shear strength of BGA(Ball Grid Array) solder joints under high impact loading was investigated. The Sn-37Pb solder balls with a diameter of $500{\mu}m$ were placed on the pads of FR-4 substrates with ENIG(Electroless Nickel Immersion Gold) surface treatment and reflowed. For the High Temperature Storage(HTS) test, the samples were aged a constant testing temperature of $120^{\circ}C$ for up to 250h. After the HTS test, high speed shear tests with various shear speed of 0.01, 0.1, 1, 3 m/s were conducted. $Ni_3Sn_4$ intermetallic compound(IMC) layer was observed at the solder/Ni-P interface and thickness of IMC was increased with aging process. The shear strength increased with increasing shear speed. The fracture surfaces of solder joints showed various fracture modes dependent on shear speed and aging time. Fracture mode was changed from ductile fracture to brittle fracture with increasing shear speed.

• Journal of the Korean Society for Aeronautical & Space Sciences
• /
• v.46 no.2
• /
• pp.167-174
• /
• 2018

The heater is applied to the lunar lander for securing its survivability under severe lunar thermal environment during 14 days of night time. For this, the heater on/off set-points shall be determined to minimize the power consumption due to the limited power generation of lunar lander during night time. In addition, the temperature changes of the lander according to the heater set-point is also an important factor because it is related to thermo-mechanical reliability on solder joint of on-board electronics. In this study, we investigated thermo-mechanical reliability on solder joint according to the heater set-point by using commercial reliability and a life prediction tool of Sherlock based on the thermal analysis results of lunar lander that is a year of the mission lifetime.

• Journal of the Microelectronics and Packaging Society
• /
• v.8 no.4
• /
• pp.35-41
• /
• 2001

In this paper, several methods to predict the solder joint shape are studied. Although there are various methods to predict the solder joint shape, such as truncated sphere method. force-balanced analytical solution, and energy-based methods like surface evolver developed by Ken Brakke, we calculate solder joint shape of $\mu$BGA by two solder joint shape prediction methods(truncated sphere method and surfaceevolver) and then compare results of each method. The results indicate that two methods can accurately predict the solder Joint shape in an accurate range. After that, we calculate reliability solder joint shape under thermal cycle test by FEA program ANSYS(version 5.62). As a result, it could be found that optimal solder joint shape calculated by solder joint prediction method has best reliability in thermal cycle test.

• Journal of the Microelectronics and Packaging Society
• /
• v.24 no.2
• /
• pp.23-27
• /
• 2017

This paper proposes an approach to predict the reliability of high temperature heaters by identifying their primary failure modes and mechanisms in the field. Test specimens were designed to have the equivalent stress conditions with the high temperature heaters in the field in order to examine the effect of stress conditions on the solder joint failures. There failures often result from cracking due to intermetallic compound (IMC) or void formation within a solder joint. Aging tests have been performed by exposing the test specimens to a temperature of $170^{\circ}C$ in order to reproduce solder joint failures in the field. During the test, changes in IMC formation were investigated by scanning electron microscopy (SEM) on the cross-sections of the test specimens, while changes in void formation were monitored both by resistance spectroscopy and by micro-computed tomography (microCT), alternately. The test results demonstrated the void volume within the solder increased as the time at the high temperature increased. Also, the phase shift of high frequency resistance was found to have high correlation with the void volume. These results implied the failure of high temperature heaters can be non-destructively predicted based on the correlation.