• Proceedings of the Korean Vacuum Society Conference
• /
• 2011.02a
• /
• pp.79-79
• /
• 2011

사파이어 기판에 성장된 ZnO 박막을 급속 열처리 하여 열처리 효과가 박막의 특성에 미치는 영향을 분석하였다. ZnO 박막은 RF 마그네트론 스퍼터 증착법으로 $500^{\circ}C$에서 성장하였고, 성장 된 시료를 산소 분위기에서 $600^{\circ}C{\sim}900^{\circ}C$로 온도 변화를 주어 3분 동안 열처리를 하였다. Hall 효과 분석에 의한 ZnO 박막의 전자 이동도 특성은 열처리 온도가 증가함에 따라 점차 증가하는 경향을 나타내어, $900^{\circ}C$ 열처리의 경우 23 $cm^2$/Vs의 가장 높은 값을 보였다. 한편 X-ray 회절 분광법에 의한 ZnO 박막의 (002) peak를 분석한 결과 열처리 온도가 증가함에 따라 peak의 세기는 증가하고 그 반치폭이 점차 감소함으로써 시료의 결정학적 특성이 향상됨을 확인 할 수 있었다. 이와 같이 열처리 온도에 따라 전기적 결정학적 특성이 향상되는 이유는 ZnO 박막에 존재하는 native defect들이 열적으로 passivation되고, 결정격자들의 배열이 열에너지에 의해 안정화 되면서 나타나는 현상으로 풀이 된다. 이와 함께 본 연구에서는 ZnO 박막의 열처리 온도 변화에 따른 광학적 특성 변화에 대해서도 보고할 예정이다.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2011.08a
• /
• pp.251-251
• /
• 2011

ZnO는 투명전극, 태양전지, 광전소자, 다이오드, 센서, 산화물 TFT 등에 널리 사용되는 재료로서, hexagonal wurtzite 결정구조, 약 3.37eV 정도의 넓은 밴드갭, 60mV의 여기 바인딩 에너지를 가지는 것으로 알려져있다. 순수한 ZnO 박막은 일반적으로 n-형 특성을 나타내고 있지만, ZnO-based 광전소자 분야에서는 p-형 전도의 부족이라는 큰 단점을 가지고 있으며 광전소자로서의 ZnO의 응용에서 n-형과 p-형 전도는 둘다 필수적이다. 또한 ZnO 박막의 억셉터 농도를 증가시키기 위해서 억셉터(N,P)와 도너(Ga,Al,In)를 동시치환시킨 몇몇 연구가 있어왔다.본 연구에서는 Al과 P를 동시치환시킨 Al0.02-XP0.01+xZn0.970 (x=0, 0.005, 0.01) 조성에서 산소 분압을 변화 시켰을때의 박막의 구조적, 전기적 특성에 대해 관찰하였다. 박막의 경우는 c-plane 사파이어 기판에서 PLD 로 증착시켰다.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2012.02a
• /
• pp.393-393
• /
• 2012

본 연구에서는 고결정성을 갖는 ZnO 박막을 제작 후, 큰 일함수를 갖는 AgxO/Ag접촉을 통하여 ZnO 쇼트키 접촉 특성을 분석하였다. ZnO 박막은 사파이어 기판 위에 r.f. 마그네트론 스퍼터링법으로 $400{\sim}600^{\circ}C$의 온도구간에서 Ar과 $O_2$가스의 분압비를 달리하여 성장하였다. 이 때 성장온도 $600^{\circ}C$, 가스 분압비는 Ar : $O_2$ = 15 sccm : 30 sccm 에서 성장된 박막에서 양질의 고결정성 ZnO 박막을 확인하였다. 이 후 성장된 박막에 접촉 면적을 달리하여 dc 마그네트론 스퍼터링법과 lift-off photolithography법으로 AgxO/Ag접촉을 제작하고 쇼트키 접촉특성을 확인하였다. 전류-전압 특성을 확인한 결과 모든 시료에서 정류 특성을 확인하였으며, 접촉면적의 변화에도 쇼트키 장벽의 높이는 일정한 반면 이상지수는 향상되는 경향을 나타내었다. 따라서 본 연구에서는 AgxO/Ag를 이용한 ZnO 쇼트키 접촉면적에 따른 정류특성 및 장벽높이와 이상지수의 상관관계에 대하여 보고한다.

• Journal of the Korean institute of surface engineering
• /
• v.44 no.4
• /
• pp.165-171
• /
• 2011

In this work, handling of sapphire substrate for LED by using an electrostatic chuck was studied. The electrostatic chuck consisted of alumina dielectric, which was doped with 1.2 wt% $TiO_2$. As the volume resistivity of alumina dielectric was decreased, the electrostatic force was increased by Johnsen-Rahbek effect. The narrower width and gap size of electrode led to the stronger electrostatic force. When alumina dielectric with $3.20{\times}10^{11}{\Omega}{\cdot}cm$ resistivity and 3 mm width/1.5 mm gap sized electrode was used, the strongest electrostatic force in this work was obtained, which value reached to ~14.46 gf/$cm^2$ at 2.5 kV for 4-inch sapphire substrate. This results show that alumina electrostatic chuck with low resistivity and fine electrode pattern is suitable for handling of sapphire substrate for LED.

• Proceedings of the Korea Institute of Applied Superconductivity and Cryogenics Conference
• /
• 2003.02a
• /
• pp.88-91
• /
• 2003

The crystal structure and properties of YBa$_2$Cu$_3$$O_{7-x}$(YBCO) and CeO$_2$ thin films deposited on r-plane (1(equation omitted)02) sapphire substrate by pulsed- laser deposition(PLD) have been investigated. C-axis oriented epitaxial YBCO thin films with critical temperature (Tc) of 88 K were routinely grown on (200) oriented CeO$_2$ buffer layers with thickness in the range between 20 to 80 nm. When the thickness of the (200)oriented CeO$_2$ buffer layer increases over than 80 nm, the superconducting properties of YBCO thin films on that were deteriorated. The decrease in Tc of YBCO thin films was explained by the microcrack formation in CeO$_2$ buffer layer. These results indicate that the thickness of the (200) oriented CeO$_2$ buffer layer is critical to the epitaxial YBCO thin nim growth on r-plane (1(equation omitted)02) sapphire substrate.e.

• Korean Journal of Materials Research
• /
• v.17 no.9
• /
• pp.475-479
• /
• 2007

Pulsed laser deposition was utilized to grow MnS thin films on c-sapphire substrate using a KrF excimer laser at growth temperatures that ranged from room temperature to $700^{\circ}C$. The results of X-ray diffraction (XRD) and UV-visible spectroscopy were employed to investigate the structural and optical properties of the MnS films. While the growth rate decreased as $T_s$ increased, the overall quality of the film improved. The highest quality MnS film was obtained at $700^{\circ}C$. Variations in the $T_s$ resulted in the MnS films exhibiting different growth mechanisms. The oriented (200) rocksalt MnS film was grown at room temperature. In the case of higher $T_s,\;200{\sim}500^{\circ}C$, the films consisted of mixed phases of rocksalt and wurtzite. The main structure of the films was altered to (111) rocksalt when the temperature was increased to in excess of $600^{\circ}C$. This behavior may very well be the result of elements such as surface energy and atomic arrangement during the growth process. The optical band gap of the obtained ${\alpha}-MnS$ film was estimated to be 3.32 eV.

• Journal of the Korean Chemical Society
• /
• v.40 no.3
• /
• pp.167-172
• /
• 1996

For the preparation of single-crystalline GaN film, heteroepitaxial growth on a sapphire substrate was carried out by halide vapor phase epitaxy(HVPE) method. The resulting GaN films showed n-type conductivity. The insulator type GaN film was made by doping with Zn(acceptor dopant), which showed emission peaks around 2.64 and 2.43 eV. The result of this study indicates that GaN can be obtained in an epitaxial structure of MIS(metal-insulator-semiconductor) junction. The observed data are regarded as fundamental in developing GaN epitaxial films for light emitting devices of hetero-structure type.

• Korean Journal of Materials Research
• /
• v.14 no.2
• /
• pp.133-140
• /
• 2004

We carried out anodic aluminum oxide (AAO) on a Si and a sapphire substrate. For anodic oxidation of Al two types of specimens prepared were Al(0.5 $\mu\textrm{m}$)!Si and Al(0.5 $\mu\textrm{m}$)/Ti(0.1 $\mu\textrm{m}$)$SiO_2$(0.1 $\mu\textrm{m}$)/GaN(2 $\mu\textrm{m}$)/Sapphire. Surface morphology of Al film was analyzed depending on the deposition methods such as sputtering, thermal evaporation, and electron beam evaporation. Without conventional electron lithography, we obtained ordered nano-pattern of porous alumina by in- situ process. Electropolishing of Al layer was carried out to improve the surface morphology and evaluated. Two step anodizing was adopted for ordered regular array of AAO formation. The applied electric voltage was 40 V and oxalic acid was used as an electrolyte. The reference electrode was graphite. Through the optimization of process parameters such as electrolyte concentration, temperature, and process time, a regular array of AAO was formed on Si and sapphire substrate. In case of Si substrate the diameter of pore and distance between pores was 50 and 100 nm, respectively. In case of sapphire substrate, the diameter of pore and distance between pores was 40 and 80 nm, respectively

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2004.07a
• /
• pp.413-416
• /
• 2004

In this study, zinc oxide(ZnO) having large misfit(18.2%) with sapphire was tried to be grown on very thin nitride buffer layers. For the creation of various kinds of nitride buffer layer, sapphire surface was modified by an irradiation of nitrogen ion beam with low energy generated from stationary plasma thruster(SPT) at room temperature. After the irradiation of ion beam, Al-N and Al-O-N bonding was identified to be formed as nitride buffet layers. Surface morphology was measured by AFM and then ZnO growth was followed by pulsed laser deposition(PLD). Their properties are analyzed by XRD, AFM, TEM, and PL. We observed that surface morphology was improved and deep level emission related to defects was almost vanished in PL spectra from the ZnO grown on nitride buffer layer.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2006.06a
• /
• pp.155-156
• /
• 2006

Single crystalline ZnO fims were successfully grown on r-plane sapphire substrate by plasma-assisted molecular beam epitaxy. Epitaxial relationship between the ZnO film and the-r-plane sapphire was determined to be [-1101]$Al_2O_3\;{\parallel}$ [0001]ZnO, [11-20]$Al_2O_3\;{\parallel}$ [-1100]ZnO based on the in-situ RHEED analysis and confirmed again by HRXRD measurements. Grown (11-20) ZnO films showed faceted structure along the <0001> direction and the RMS roughness was about 4 nm.