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http://dx.doi.org/10.5695/JKISE.2011.44.4.165

A Study on the Holding of LED Sapphire Substrate Using Alumina Electrostatic Chuck with Fine Electrode Pattern  

Kim, Hyung-Ju (Department of Advanced Materials Engineering, Kyonggi University)
Shin, Yong-Gun (Department of Advanced Materials Engineering, Kyonggi University)
Ahn, Ho-Kap (Aegisco Co. Ltd.)
Kim, Dong-Won (Department of Advanced Materials Engineering, Kyonggi University)
Publication Information
Journal of the Korean institute of surface engineering / v.44, no.4, 2011 , pp. 165-171 More about this Journal
Abstract
In this work, handling of sapphire substrate for LED by using an electrostatic chuck was studied. The electrostatic chuck consisted of alumina dielectric, which was doped with 1.2 wt% $TiO_2$. As the volume resistivity of alumina dielectric was decreased, the electrostatic force was increased by Johnsen-Rahbek effect. The narrower width and gap size of electrode led to the stronger electrostatic force. When alumina dielectric with $3.20{\times}10^{11}{\Omega}{\cdot}cm$ resistivity and 3 mm width/1.5 mm gap sized electrode was used, the strongest electrostatic force in this work was obtained, which value reached to ~14.46 gf/$cm^2$ at 2.5 kV for 4-inch sapphire substrate. This results show that alumina electrostatic chuck with low resistivity and fine electrode pattern is suitable for handling of sapphire substrate for LED.
Keywords
Electrostatic chuck; Electrostatic force; Dielectric; Sapphire substrate; Volume resistivity; Electrode pattern;
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