• Title/Summary/Keyword: 밴드갭

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Electrochemical Formation and Characterization of III-V Compound Semiconductor InSb Nanowires (III-V족 화합물 반도체 InSb 나노와이어의 전기화학적 합성 및 특성 평가)

  • Lee, Kwan-Hyi;Lee, Jong-Wook;Park, Ho-Dong;Jeung, Won-Young;Lee, Jong-Yup
    • Journal of the Korean Electrochemical Society
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    • v.8 no.3
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    • pp.130-134
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    • 2005
  • To the best knowledge, the formation and characterization of InSb nanowires have not been reported yet in spite of its good characteristics as a III-V compound semiconductor. The nanowire arrays were potentiostatically electrodeposited in a mixing solution of indium chloride, antimony chloride, citric acid, and potassium citrate according to our previous work on the electrodeposition of the stoichiometric InSb films. The electrical properties of nanowire arrays were measured by semiconductor parameter analyzer, and the microstructural analysis of the nanowires was conducted by employing XRD. Our experimental results indicate that the InSb nanowires have a highly preferred orientation of (220) direction and also exhibit electrical characteristics of n-type semiconductors which we, however, similar to semi-metals mainly due to their narrow band-gap and high electron mobility.

Structural, Optical and Electrical Properties of ZnO Thin Films with Zn Concentration (Zn 농도변화에 따른 ZnO 박막의 구조, 광학 및 전기적 특성 연구)

  • 한호철;김익주;태원필;김진규;심문식;서수정;김용성
    • Journal of the Korean Ceramic Society
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    • v.40 no.11
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    • pp.1113-1119
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    • 2003
  • We used isopropanol which has low boiling point to prepare thin films at low temperature and changed mole concentration of zinc acetate from 0.3 to 1.3 mol/l. The structural, optical and electrical properties of ZnO thin films with Zn content were investigated. ZnO thin films highly oriented along the c-axis were obtained at Zn concentration of 0.7 mol/l. ZnO thin films with Zn concentration of 0.7 mol/l showed a homogeneous surface layer of nano structure. The transmittance of ZnO thin films by UV-vis. measurement was about 87% under the Zn concentration of 0.7 mol/l, but rapidly decreased over the 1.0 mol/l. The optical band gap energy was obtained from 3.07 to 3.22 eV which is very close to the band gap of bulk ZnO (3.2 eV). The electrical resistivity of ZnO thin films was about 150 $\Omega$-cm that shows little difference with Zn concentration. I-V curves of ZnO thin films exhibited typical ohmic contact properties.

A Study on CdS Deposition using Sputtering (Sputtering을 이용한 CdS 증착에 관한 연구)

  • Lee, Dal-Ho;Park, Jung-Cheul
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.13 no.4
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    • pp.293-297
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    • 2020
  • This paper tried to find the best conditions that could be applied to solar cells by deposition of CdS thin film on ITO glass using multiplex displacement sputter system. RF power was changed to 50W, 100W, and 150W and sputtering time was set to 10 minutes. As a result of the measurement of transmittance, the average transmittance in the area of 400 to 800 nm was measured from 60% to 80% and the best characteristic was measured at 150W at 84%. The band gap was also measured at 3.762eV at 50W, 4.037eV at 100W and 4.052eV at 150W. In XRD analysis, even as RF power was increased, it was observed as a structure called Wurtzite (hexagonal) of CdS. And as RF power increased, the particles were large and uniformly deposited, but at 100W the particles were densely composed and dense. And the thickness measurement showed that the RF power increased uniformly.

Design of BiCMOS Signal Conditioning Circuitry for Piezoresistive Pressure Sensor (압저항형 압력센서를 위한 BiCMOS 신호처리회로의 설계)

  • Lee, Bo-Na;Lee, Moon-Key
    • Journal of Sensor Science and Technology
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    • v.5 no.6
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    • pp.25-34
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    • 1996
  • In this paper, we have designed signal conditioning circuitry for piezoresistive pressure sensor. Signal conditioning circuitry consists of voltage reference circuit for sensor driving voltage and instrument amplifier for sensor signal amplification. Signal conditioning circuitry is simulated using HSPICE in a single poly double metal $1.5\;{\mu}m$ BiCMOS technology. Simulation results of band-gap reference circuit showed that temperature coefficient of $21\;ppm/^{\circ}C$ at the temperature range of $0\;{\sim}\;70^{\circ}C$ and PSRR of 80 dB. Simulation results of BiCMOS amplifier showed that dc voltage gain, offset voltage, CMRR, CMR and PSRR are outperformed to CMOS and Bipolar, but power dissipation and noise voltage were more improved in CMOS than BiCMOS and Bipolar. Designed signal conditioning circuitry showed high input impedance, low offset and good CMRR, therefore, it is possible to apply sensor and instrument signal conditioning circuitry.

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LED visible light communication and their application (LED 가시광 통신시스템과 그 응용)

  • Chung, Wan-Young;Kim, Jong-Jin;Kwon, Tae-Ha
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2010.05a
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    • pp.226-229
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    • 2010
  • LED(Light Emitting Diode) is an emitting device which energy is same to the bandgap of p-type and n-type semiconductor junction. Recently high brightness LED is used in fish-luring light and traffic signal light alternative of normal light bulb, and widely used in the area of display pannel. Moreover nowadays LED has been used as a back light of LCD display. Recently, visible light communication(VLC) using LED, that allow two-way serial data communication between LEDs over a distance of sveral centimeters or meters, has been widely studied in the area of digital information transmission along with illumination and display. In this paper, we present LED communication system and their applications.

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Infrared Imaging and a New Interpretation on the Reverse Contrast Images in GaAs Wafer (GaAs 웨이퍼의 적외선 영상기법 및 콘트라스트 반전 영상에 대한 새로운 해석)

  • Kang, Seong-jun
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.20 no.11
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    • pp.2085-2092
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    • 2016
  • One of the most important properties of the IC substrate is that it should be uniform over large areas. Among the various physical approaches of wafer defect characterization, special attention is to be payed to the infrared techniques of inspection. In particular, a high spatial resolution, near infrared absorption method has been adopted to directly observe defects in semi-insulating GaAs. This technique, which relies on the mapping of infrared transmission, is both rapid and non-destructive. This method demonstrates in a direct way that the infrared images of GaAs crystals arise from defect absorption process. A new interpretation is presented for the observed reversal of contrast in the infrared absorption of nonuniformly distributed deep centers, related to EL2, in semi-insulating GaAs. The low temperature photoquenching experiment has demonstrated in a direct way that the contrast inverse images of GaAs wafers arise from both absorption and scattering mechanisms rather than charge re-distribution or local variation of bandgap.

Synthesis of Al-Doped ZnO by Microwave Assisted Hydrothermal Method and its Optical Property (마이크로파 수열합성법을 이용한 알루미늄이 도핑된 산화아연 합성 및 그 광학적 특성)

  • Hyun, Mi-Ho;Kang, Kuk-Hyoun;Lee, Dong-Kyu
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.16 no.2
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    • pp.1555-1562
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    • 2015
  • Metal oxide semiconductors have been applied in several areas, such as solar cells, sensor, optical elements and displays, due to the high surface area, unique electrical and optical characteristics. Zinc oxide among the metal oxide has excellent physicochemical properties. Zinc oxide is a n-type semiconductor with a wide direct transition band gap of 3.37 eV at room temperature and large exciton binding energy of 60 meV. Cation-doped zinc oxide studies were conducted to complement the electrical and optical characteristics. In this paper, Al-doped ZnO was synthesized by hydrothermal synthesis using microwaves. ZnO was synthesized by adjusting the precursor ratio and using different dopants. The optimal ZnO synthesis conditions for crystal shape and optical properties were determined. The optical properties of aluminum doped zinc oxide were then examined by SEM, XRD, PL, UV-vis absorbance spectrum, and EDS.

Growth and temperature dependence of energy band gap for $CuGaSe_2$ Single Crystal Thin Film by Hot Wall Epitaxy (Hot Wall Epitaxy(HWE)법에 의한 $CuGaSe_2$ 단결정 박막의 성장과 에너지 밴드갭의 온도 의존성)

  • Lee, Sang-Youl;Hong, Kwang-Joon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.97-98
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    • 2007
  • A stoichiometric. mixture of evaporating materials for $CuGaSe_2$ single crystal thin films was prepared from horizontal electric furnace. Using extrapolation method of X-ray diffraction patterns for the polycrystal $CuGaSe_2$, it was found tetragonal structure whose lattice constant $a_0$ and $c_0$ were $5.615\;{\AA}$ and $11.025\;{\AA}$, respectively. To obtain the single crystal thin films, $CuGaSe_2$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperatures were $610^{\circ}C$ and $450^{\circ}C$, respectively. The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of $CuGaSe_2$ single crystal thin films measured with Hall effect by van der Pauw method are $4.87{\times}10^{17}\;cm^{-3}$ and $129\;cm^2/V{\cdot}s$ at 293 K, respectively. The temperature dependence of the energy band gap of the $CuGaSe_2$ obtained from the absorption spectra was well described by the Varshni's relation, $E_g(T)\;=\;1.7998\;eV\;-\;(8.7489\;{\times}\;10^{-4}\;eV/K)T^2/(T\;+\;335\;K)$.

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Electrical and optical properties of ZnO thin films grown by MOCVD (MOCVD 법으로 성장한 ZnO 박막의 전기적, 광학적 특성 평가)

  • Kong, Bo-Hyun;Kim, Dong-Chan;Han, Won-Suk;Kim, Young-Yi;Ahn, Cheol-Hyoun;Kang, Si-Woo;Yi, Yu-Jin;Cho, Hyung-Koun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.150-150
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    • 2007
  • ZnO는 3.37eV의 넓은 에너지 밴드갭을 가지고 있으며, 60meV의 큰 엑시톤(exciton) 결합에너지의 특성을 가지고 있어 UV 영역의 소스로서 가장 활용도가 클 것으로 예상된다. 특히 ZnO 박막은 청색과 자외선 발광소자 및 광전자 소자, 화학적 센서로 활용이 가능하다. 최근 ZnO 박막을 이용한 LED 및 LD 소자 제작에 대한 연구가 국내외적으로 매우 활발하게 이루어지고 있다. 이런 소자를 제작할 때 가장 우선시 되는 것이 ZnO 박막의 전기적은 특성(캐리어 밀도, 전도도, 이동도, 비저항)이다. ZnO 박막을 성장하는 방법으로는 sputtering, PLD, MOCVD, sol-gel 법 등 여러방법이 있지만, MOCVD 법은 소스인 DEZn 와 산소의 유량이 조절이 가능하여 박막의 특성 다양하게 변화시킬 수 있는 장정이 있다. 본 연구에서는 MOCVD 법을 이용하여 사파이어 기판위에 ZnO 박막을 성장 시켰다. 성장 시 VI족 소스인 산소가스와 II족 소스인 DEZn 양을 조절함으로써 이때 변화되는 박막의 전기적, 광학적, 구조적 특성에 대해 연구하였다.

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CMP Properties of ITO with the deposition temperature (기판온도에 따른 ITO박막의 CMP특성)

  • Choi, Gwon-Woo;Lee, Young-Kyun;Lee, Woo-Sun;Jun, Young-Kil;Ko, Pil-Ju;Seo, Yong-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.11a
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    • pp.165-165
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    • 2007
  • 투명전도박막은 ITO, $SnO_2$, ZnO, 등이 있으나 $SnO_2$는 자외선 영역까지 투과시키는 우수한 광학적 특성을 나타내지만, 상당히 큰 전기저항으로 인해 현재는 현재 ITO가 널리 이용되고 있다. ITO(Indium Tin Oxide)박막은 자외선 영역에서 반사율이 높으며 가시광선영역에서는 80%이상의 뛰어난 투과율을 가지고 있다. 또한 낮은 전기저항과 넓은 광학적 밴드갭 때문에 가장 유용한 투과전도성 재료 중에 하나이다. 이러한 특성 때문에 여러 가지 문자 표시소자의 투명전극, 태양전지의 창재료, 정전차폐를 위한 반도체 포장재료, 열반사막, 면발열체, 광전변환 소자에 응용되고 있다. 일반적으로 박막의 제작에는 저항가열법과 전자선가열법, 스퍼터링법의 물리적 증착과 화학적 증착으로 나뉜다. 본 논문에서는 증착온도를 달리 하여 RF-sputtering에 의해 ITO박막을 증착한 후 온도증가에 따른 박막의 특성을 연구하였으며 또한 광역평탄화를 위한 CMP공정을 적용하여 증착온도가 연마에 미치는 영향을 연구하였다. 본 실험에서 사용된 ITO박막은 $2{\times}2Cm$의 Corning glass위에 증착되었으며 타겟은 $In_2O_3$$SnO_2$가 9:1로 혼합된 Purity 99.99%이상의 직경 2 inch인 ITO타겟을 사용하였다. 박막 증착시 기판온도는 상온에M $200^{\circ}C$까지 변화시켰으며 RF power는 100W로 일정하게 하였으며 증착압력은 $8{\times}10^{-2}$Torr이였다. CMP공정조건은 헤드속도 60rpm, 플레이튼 속도 60rpm, 슬러리 주입 유량 60mml/min, 압력 $300g/cm^2$이였다. 전기적 특성은 four point probe를 이용하여 측정하였으며 광학적 특성은 UV-Visible Spectrometer를 이용하여 200~900nm의 파장범위에서 광투과도를 측정하였다.

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