• 반도체디스플레이기술학회지
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• 제5권1호
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• pp.5-11
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• 2006

One of the most important is to insure that a new circuit design is qualified far release before it is scheduled for manufacturing, test, assembly and delivery. Due to various causes, there happens to be a low yield in the wafer process. Wafer test is a critical process in analyzing the chip characteristics in the EDS(electric die sorting) using analytic tools -wafer map, wafer summary and datalog. In this paper, we propose new analytic map algorithms for DDI chip test data. Using the proposed analytic map algorithms, we expect to improve the yield, quality and analysis time.

• 한국공작기계학회논문집
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• 제15권6호
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• pp.82-87
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• 2006

Availability of defect test algorithm that recognizes exact and standardized defect information in order to fundamentally resolve generated defects in industrial sites by giving artificial intelligence to SAT(Scanning Acoustic Tomograph), which previously depended on operator's decision, to find various defect information in a semiconductor package, to decide defect pattern, to reduce personal errors and then to standardize the test process was verified. In order to apply the algorithm to the lately emerging Neural Network theory, various weights were used to derive results for performance advancement plans of the defect test algorithm that promises excellent field applicability.

• 기술혁신연구
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• 제26권3호
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• pp.37-68
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• 2018

본 논문에서는 차량용 반도체가 제품 출하 후 사용 환경에 따라 발생되는 불량률을 데이터 마이닝 기법을 이용하여 분석하였다. 20세기 이후 가장 보편적인 이동수단인 자동차는 전자 컨트롤 장치와 자동차용 반도체의 사용량이 급격히 증가하면서 매우 빠른 속도로 진화하고 있다. 자동차용 반도체는 차량용 전자 컨트롤 장치 중 핵심 부품으로 소비자들에게 안정성, 연료 사용의 효율성, 운전의 안정감을 제공하기 위해 사용되고 있다. 자동차용 반도체는 가솔린엔진, 디젤 엔진, 전기 모터를 컨트롤하는 기술, 헤드업 디스플레이, 차선 유지 시스템 등 많은 부분에 적용되고 있다. 이와 같이 반도체는 자동차를 구성하는 거의 모든 전자 컨트롤 장치에 적용되고 있으며 기계적인 장치를 단순히 조합한 이상의 효과를 만들어 내고 있다. 자동차용 반도체는 10년 이상의 자동차 사용 기간을 고려하여 높은 신뢰성, 내구성, 장기공급 등의 특성을 요구하고 있다. 자동차용 반도체의 신뢰성은 자동차의 안전성과 직접적으로 연결되기 때문이다. 반도체업계에서는 JEDEC과 AEC 등의 산업 표준 규격을 이용하여 자동차용 반도체의 신뢰성을 평가하고 있다. 또한 자동차 산업에서 표준으로 제시한 신뢰성 실험 방법과 그 결과를 이용하여 개발 초기 단계 및 제품 양산 초기단계에서 제품의 수명을 예측 하고 있다. 하지만 고객의 다양한 사용 조건 및 사용 시간 등 여러 변수들에 의해 발생되는 불량률을 예측하는 데는 한계가 있다. 이러한 한계점을 극복하기 위하여 학계와 산업계에서 많은 연구가 있어왔다. 그 중 데이터 마이닝 기법을 이용한 연구가 다수의 반도체 분야에서 진행되고 있지만, 아직 자동차용 반도체에 대한 적용 및 연구는 미비한 상태이다. 이러한 관점에서 본 연구는 데이터 마이닝 기법을 이용하여 반도체 조립(Assembly)과 패키지 테스트(Package test) 공정 중 발생 된 데이터들간의 연관성을 규명하고, 고객 불량 데이터를 이용하여 잠재 불량률 예측에 적합한 데이터 마이닝 기법을 검증하였다.

• 반도체디스플레이기술학회지
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• 제22권3호
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• pp.62-66
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• 2023

With the advancement in technology and rapid increase in the demand for microelectromechanical systems (MEMS) based inertial measurement units (IMUs), high-volume production and test system remain a major challenge for the MEMS industry. To compete with the challenging market of Industry 4.0, here we developed an automatic test system to evaluate the performance of the ovenized IMU sensors as well as analyze the data. The automatic test system was developed by interfacing a commercial MEMS IMU (BMI 088) using LabVIEW. The BMI 088 was tested experimentally for long-term bias stability, ON/OFF bias repeatability, and root mean square (rms) noise. Furthermore, the data was analyzed through the developed test system. The results show that the automatic test system has improved the test time and reduced human effort. The developed automatic test system is a significant approach to MEMS research and development (R&D) to increase and improve the mass production of IMUs.

• 한국항공우주학회지
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• 제34권11호
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• pp.84-91
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• 2006

최근에 인공위성용 전자소자는 우주방사선에 좀 더 강한 소자를 요구되어진다. 왜냐하면, 인공위성의 수명과 기능은 우주방사선으로부터 영향을 받기 때문이다. 또한, 과거에는 부품단위의 우주방사선 시험을 수행하지 않고 유닛 또는 서브시스템 단위의 우주방사선 시험을 수행하였다. 게다가, 발사된 인공위성이 작동오류 상태에 있을 때 그 이유를 분석하기에는 그다지 쉬운 일은 아니다. 따라서, 발사 전 부품 단위 우주방사선 시험을 수행하여 주요 소자에 대한 우주방사선에 의한 영향을 분석 할 필요가 있으며, 지상에서 데이터를 확보할 필요가 있다. 그러므로, 본 논문에서는 모든 전자소자의 기본이라 할 수 있는 금속-산화막 반도체 전계효과 트랜지스터의 총이온화선량에 대한 영향 시험을 수행하기 위한 테스트 베드를 제안한다.

• 반도체디스플레이기술학회지
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• 제12권4호
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• pp.45-48
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• 2013

The electronic device, such as flat panel display (FPD), is very important in our life as a means of communication between humans. Liquid crystal display (LCD), which is categorized as a flat panel display, has been used in many display products, especially in TV industry. An LED TV is composed of several electrical components, such as liquid critical module (LCM), analog to digital convertor (AD), power supplier, and inverter board. These modules are very vulnerable to particulate contamination, and causing malfunction or visibility degradation. In this study, we developed a test method for prediction of LCM's lifetime. The test system consists of carbon particle generation flame, dilution system, test chamber, and particle concentration monitoring instrument. Since the carbon particles are the most abundant in the atmosphere and easily absorb light, soot particles are used as a challenging material for this test. The concentration of generated soot particles is set around 4,000,000 #/cc, which is 400 times higher than that of usual atmospheric particles. Through this experiment, we deduced the relationship between the dust concentration and life time of the test specimen.

• 반도체디스플레이기술학회지
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• 제2권2호
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• pp.31-37
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• 2003

This paper presents a measurement system of mechanical property using dual servo system. There are many kinds of method to measure material properties such as tensile test, indention and bending test. It is highly required to measure the properties of nano-sized material and structure. However, It is need more accurate measurement system, more stable and frequency response than conventional test. In this paper, we designed the dual servo system for a measuring instrument The dual servo system consisting of a coarse stage and a fine motion stage with VCM and PZT is proposed. Mechanical mechanism is designed with the leaf spring type of flexure hinge joint. Lead compensator is applied to this control system, and is designed by PQ method.

• 반도체디스플레이기술학회지
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• 제14권2호
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• pp.67-72
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• 2015

For the development of UFS device test system, M-PHY specifications should be matched with MIPI-standard which is analog signal protocol. In this paper, the implementation methodology and hardware structure for the M-PHY AFE (Analog Front End) Block was suggested that it can be implemented using universal components without ASIC process. The testing procedure has a jitter problem so to solve the problems we using ASIC process, normally but the ASIC process needs a lot of developing cost making the UFS device test system. In is paper, the suggestion was verified by the output signal which was compared to the MIPI-standard on the Prototype-board using universal components. The board was reduced the jitter on the condition of HS-TX and 5.824 Gbps Mode in SerDes (Serialize-deserializer). Finally, the suggestion and developed AFE block have a useful better than ASIC process on developing costs of the industrial UFS device test system.

• 반도체디스플레이기술학회지
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• 제9권3호
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• pp.71-74
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• 2010

In this study the optical properties, such as relative transmittance and reflectance of PDP were analyzed with 3D optical code. Because of the electrode structure, the reference model shows 21.3 % higher transmittance than the test model and the reference model shows 16.6 % higher reflectance than the test model. The calculated reflectance of reference and test models is compared to the measured reflectance and the difference between calculation and measurement is 4.9 %.

• 반도체디스플레이기술학회지
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• 제18권2호
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• pp.82-86
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• 2019

The reliability of 3D NAND flash memory cell is affected by the charge migration which can be divided into the vertical migration and the lateral migration. To clarify the difference of two migrations, the activation energy of the charge loss is extracted and compared in a conventional square device pattern and a new test pattern where the perimeter of the gate is exaggerated but the area is same. The charge loss is larger in the suggested test pattern and the activation energy is extracted to be 0.058 eV while the activation energy is 0.28 eV in the square pattern.