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Development of The M-PHY AFE Block Using Universal Components  

Choi, Byung Sun (SFU Co.)
Oh, Ho Hyung (Depart of Electronic Eng, Dankook University)
Publication Information
Journal of the Semiconductor & Display Technology / v.14, no.2, 2015 , pp. 67-72 More about this Journal
Abstract
For the development of UFS device test system, M-PHY specifications should be matched with MIPI-standard which is analog signal protocol. In this paper, the implementation methodology and hardware structure for the M-PHY AFE (Analog Front End) Block was suggested that it can be implemented using universal components without ASIC process. The testing procedure has a jitter problem so to solve the problems we using ASIC process, normally but the ASIC process needs a lot of developing cost making the UFS device test system. In is paper, the suggestion was verified by the output signal which was compared to the MIPI-standard on the Prototype-board using universal components. The board was reduced the jitter on the condition of HS-TX and 5.824 Gbps Mode in SerDes (Serialize-deserializer). Finally, the suggestion and developed AFE block have a useful better than ASIC process on developing costs of the industrial UFS device test system.
Keywords
MIPI; UFS; M-PHY; UniPro; HIBERNATE; DIF-Z; PWM-MODE; HS-MODE; GEAR;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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