Transactions of the Korean Society of Machine Tool Engineers (한국공작기계학회논문집)

The Korean Society of Manufacturing Technology Engineers (한국생산제조학회)
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Performance Advancement of Evaluation Algorithm for Inner Defects in Semiconductor Packages

반도체 패키지 내부결함 평가 알고리즘의 성능 향상

  • 김창현 (조선대학교 공과대학 메카트로닉스공학과) ;
  • 홍성훈 (조선대학교 공과대학 메카트로닉스공학과) ;
  • 김재열 (전남대학교 전자컴퓨터공학부)
  • Published : 2006.12.15
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Abstract

Availability of defect test algorithm that recognizes exact and standardized defect information in order to fundamentally resolve generated defects in industrial sites by giving artificial intelligence to SAT(Scanning Acoustic Tomograph), which previously depended on operator's decision, to find various defect information in a semiconductor package, to decide defect pattern, to reduce personal errors and then to standardize the test process was verified. In order to apply the algorithm to the lately emerging Neural Network theory, various weights were used to derive results for performance advancement plans of the defect test algorithm that promises excellent field applicability.

Keywords

References

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