• Title/Summary/Keyword: 모아레

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Vibration Analysis and Design of CRT for Reduction of Moire Phenomena (CRT 모아레 현상의 억제를 위한 진동 해석 및 설계)

  • 이규헌;유홍희
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2001.11a
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    • pp.413-418
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    • 2001
  • The moire phenomena, which are induced by mask vibration due to the excitation of speakers, degrades the color purity of CRT. So it is important to eliminate this phenomena to obtain a good CRT design. In this study we analyze the mask vibration by experiment as well as finite element method. To obtain the finite element solutions efficiently, an equivalent model was employed. The experimental and analysis results show reasonable agreements. An enhanced design configuration of mask welding points are suggested through this study.

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Measurement of POF Refractive Index Profile by using Phase-Shifting Moire Deflectometry (위상천이 모아레 간섭방법을 이용한 POF의 굴절률 분포 측정)

  • 우세윤;이현호;박승한
    • Proceedings of the Optical Society of Korea Conference
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    • 2003.07a
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    • pp.274-275
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    • 2003
  • 광통신 분야의 연구 중 근거리 광통신 분야에 적용하기 위한 Plastic Optical Fiber(POF)에 관한 연구와 개발이 활발히 이루어지고 있다. POF의 광전송 특성을 결정짓는 요소 중 가장 중요한 특성이 바로 굴절률 분포이다. 이에 따라 그동안 다양한 형태의 POF 굴절률 측정 방법이 연구되어 왔다. 기존 Glass Optical Fiber의 굴절률 분포 측정 방법 중 가장 일반적이고 효과적인 방법 중 하나는 coherent 빛의 간섭을 이용한 transverse interferograms을 분석하는 방법으로 Fizeau 간섭계와 같은 간섭계를 이용하여 위상변화를 측정하고 측정한 위상을 tomography적인 해석방법을 통해 굴절률 분포를 계산하는 방법이다. (중략)

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Halftone Noise Removal in Scanned Images using HOG based Adaptive Smoothing Filter (HOG 기반의 적응적 평활화를 이용한 스캔된 영상의 하프톤 잡음 제거)

  • Hur, Kyu-Sung;Baek, Yeul-Min;Kim, Whoi-Yul
    • Journal of Broadcast Engineering
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    • v.17 no.2
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    • pp.316-324
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    • 2012
  • In this paper, a novel descreening method using HOG(histogram of gradient)-based adaptive smoothing filter is proposed. Conventional edge-oriented smoothing methods does not provide enough smoothing to the halftone image due to the edge-like characteristic of the halftone noise. Moreover, clustered-dot halftoning method, which is commonly used in printing tends to create Moire pattern because of the intereference in color channels. Therefore, the proposed method uses HOG to distinguish edges and the amount of smoothing to be performed on the halftone image is then calculated according to the magnitude of the HOG in the edge and edge normal orientation. The proposed method was tested on various scanned halftone materials, and the results show that it effectively removes halftone noises as well as Moire pattern while preserving image details.

Study on Inverse Approach to Validation of Viscoplastic Model of Sn37Pb Solder and Identification of Model Parameters (Sn37Pb 솔더의 점소성 모델 검증 및 파라메터 추정을 위한 역접근법에 관한 연구)

  • Gang, Jin-Hyuk;Lee, Bong-Hee;Choi, Joo-Ho;Joo, Jin-Won
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.34 no.10
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    • pp.1377-1384
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    • 2010
  • The objective of this study is to determine the best material model that represents the deformation behavior of the Sn37Pb solder alloy accurately. First, a specimen is fabricated and subjected to a thermal cycle with temperatures ranging from the room temperature to $125^{\circ}C$. An experiment is conducted to examine deformation by Moire interferometry. Three different constitutive equation models are used in the finite element analysis (FEA) of the thermal cycle. In order to minimize the difference between the FEA results and the experimental results, the material parameters of the solder alloy are considered to be unknown and are determined by conducting optimization. As a result of the study, the Anand model is found to represent the deformation behavior of the solder most accurately.

Application of DMD for Phase Shifting in Moire Topology (DMD를 이용한 위상천이 모아레 3차원 형상 측정)

  • Jeong, Kyung-Seok;Jung, Yong-Sang
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.12 no.6
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    • pp.2457-2462
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    • 2011
  • The need for rapid and accurate measurement of 3-dimensional objects is increasing due to the paradigmatic shift in manufacturing from mass production to small batch production. A three dimensional measurement technique which can provide the dimensional information of the object manufactured or to be manufactured has been developed. This method is based on phase shifting moire topology. Digital-Micromirror-Device (DMD) has been used in generating phase shifting moire fringes. And the mechanically moving optical components used for phase shifting, which might result in measurement errors, have been replaced by the DMD. Inherent $2\pi$-ambiguity problem, occurring in the calculation of phase from the light intensity distribution due to the nature of arctangent function, has been overcome by adapting the phase unwrapping method. The advantage of this technique is the easy change of the range and the resolution of the measurement by simply changing the computer generated grid pattern with the appropriate combination of projection lens of various focal length.

Thermo-mechanical Behavior of Wire Bonding PBGA Packages with Different Solder Ball Grid Patterns (Wire Bonding PBGA 패키지의 솔더볼 그리드 패턴에 따른 열-기계적 거동)

  • Joo, Jin-Won
    • Journal of the Microelectronics and Packaging Society
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    • v.16 no.2
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    • pp.11-19
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    • 2009
  • Thermo-mechanical behaviors of wire-bond plastic ball grid array (WB-PBGA) package assemblies are characterized by high-sensitivity moire interferometry. Using the real-time moire setup, fringe patterns are recorded and analyzed for several temperatures. Experiments are conducted for three types of WB-PBGA package that have full grid pattern and perimeter pattern with/without central connections. Bending deformations of the assemblies and average strains of the solder balls are investigated, with an emphasis on the effect of solder interconnection grid patterns, Thermal strain distributions and the location of the critical solder ball in package assemblies are quite different with the form of solder ball grid pattern. For the WB-PBGA-PC, The largest of effective strain occurred in the inner solder ball of perimeter closest to the chip solder balls. The critical solder ball is located at the edge of the chip for the WB-PBGA-FG, at the most outer solder ball of central connections for the WB-PBGA-P/C, and at the inner solder ball closest to the chip for the WB-PBGA-P.

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Studies on the theory of Oriental Medicine Diagnosis and applicatin of Moire topography (한의학적(韓醫學的) 진단원리(診斷原理)와 모아레 토포그래피의 응용(應用))

  • Lee, Jae-Won
    • Korean Journal of Oriental Medicine
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    • v.1 no.1
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    • pp.273-287
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    • 1995
  • Moire topography, a simple technique for three-dimensional quantitation, was used to provide interference fringe photographs of the human back with sufficient accuracy to be used for detecting patient with asymmetry due to scoliosis, the disease of cervix and lumbar, muscle dysfunction. Contour lines are a suitable and widely accepted method of describing a three-dimensional surface. In the moire technique, contour lines of an object are produced as interference fringes while the object is illuminated by a spotlight through a special grating. The fringe pattern is produced by the interference of the grating and its shadow on the object. A photograph of a moire pattern on the human back will permit an assessment of the overall body shape and the symmetry of the back. This study uses shadow moire topography. Moire topography provides a non-invasive technique for quantifying the shape of the human body. In the use of moire topography for the Oriental Medicine Diagnosis, the strength of moire lies in the ablility to detect change due to deformity of human body.

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Aligning Method using Concentric $Moir\'{e}$ in Nanoimprint Lithography (나노 임프린트 리소그라피에서 동심원 모아레를 이용한 정렬방법)

  • Kim, Gee-Hong;Lee, Jae-Jong;Choi, Kee-Bong;Park, Soo-Yeon;Cho, Hyun-Taek;Lee, Jong-Hyun
    • Journal of the Korean Society for Precision Engineering
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    • v.23 no.11 s.188
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    • pp.34-41
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    • 2006
  • Nanoimprint lithography is an emerging technology which has an ability to make patterns under 100nm width. Recently many researches have been focused to develop multilayer patterning function in nanoimprint lithography and aligning method is attracting attention as a key technology. $Moir\'{e}$ has been used widely to measure dislocation or deformation of objects and considered one of the best solutions to detect aligning error in nanoimprint lithography. Concentric circular patterns are used to generate a $moir\'{e}$ fringe in this paper and aligning offset and direction are extracted from it. Especially this paper shows the difference of fringe equation of $moir\'{e}$ which can be obtained in nanoimprint process atmosphere from normal one.

Tow-dimensional Strain Analysis by Fourier Transform Moire Interferometry (Fourier 변환 모아레 간섭에 의한 이차원적 변형률 해석)

  • Park, T.W.;Shimada, T.;Morimoto, Y.;Han, E.K.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.12 no.1
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    • pp.16-24
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    • 1992
  • Moire interferometry using a diffraction grating and a laser is a powerful technique for analizing small deformation of a specimen. In the method, the x and y-directional fringe patterns are obtained by using the x and y-directional sets of two beams. If the both sets of two beams are simultaneously incident to the specimen, the x and y-directional fringe patterns are super imposed. In this case, it is difficult to separate each directional fringe pattern. Therefore each fringe pattern has been separately recorded by selecting each set of two beams. In order to analyze a two-dimensional strain changing with time, Moire interferometry using the two-dimensional fourier transform method is proposed and the x and y-directional fringes are separated. By this method, the thermal deformation of a glass plate is analyzed.

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A New Error Compensation Method in Linear Encoder Using a Phase-Modulated Grating (위상 변환 격자를 이용한 선형 엔코더의 오차 보상법)

  • Song, Ju-Ho;Kim, Gyeong-Chan;Kim, Su-Hyeon;Gwak, Yun-Geun
    • Journal of the Korean Society for Precision Engineering
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    • v.17 no.10
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    • pp.147-154
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    • 2000
  • A new hardware compensation method reducing displacement measurement errors, caused by tilt of index scale in moire linear encoders, has been developed. In conventional moire linear encoders, the detectors are aligned perpendicular to the line of moire fringes this structure is very sensitive to an unwanted tilt of the gratings. In this paper, a newly designed grating, called a phase-modulated grating, is developed to compensate for non-orthogonal errors. By using the phase-modulated grating instead of a conventional index, it is possible to reduce non-orthogonal errors of moire linear encoders.

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