• Proceedings of the Korean Vacuum Society Conference
• /
• 2014.02a
• /
• pp.414-414
• /
• 2014

박막 태양전지의 광흡수를 증가시키기 위한 방법으로 나노 사이즈의 구조체를 이용하는 방법들이 주목받고 있다. 나노 구조체로 인한 광 산란 효과는 광 흡수층에서 빛의 흡수를 높여 태양전지의 변환효율을 높일 수 있다. 3차원 구조체를 제작하는 기존의 방법들은 대면적 기판에 적용이 어렵고, 비용적 측면 등의 문제점들이 있다. 본 연구에서는 대면적화가 가능한 나노 임프린트 리소그래피 방법을 이용하여 Ag nano rod 패턴을 제작하였다. 임프린트 공정 중 UV 조사시간, 가해지는 하중, 기판온도 등의 변수들과, 건식 이온 식각 시 변수들을 조절하여 최적화된 3차원 rod 패턴을 형성할 수 있었다. 그림 1은 형성된 Ag rod 패턴의 SEM 측정 사진이다. 전극 폭 300 nm, 간격 300 nm로 제조된 rod는 Ag의 두께를 조절함으로써 전기, 광학적 특성을 조절할 수 있었다. 3차원 Ag nano rod를 박막 태양전지의 전, 후면 전극으로 사용하여 태양전지의 특성변화를 분석하였다.

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2006.05a
• /
• pp.145-146
• /
• 2006

A fluorine-doped diamond-like carbon (F-DLC) stamp which has high contact angle, high UV-transmittance and sufficient hardness, was fabricated using the following direct etching method: F-DLC is deposited on a quartz substrate using DC and RF magnetron sputtering, PMMA is spin coated and patterned using e-beam lithography and finally, O2 plasma etching is performed to transfer the line patterns having 100 nm line width, 100 nm line space and 70 nm line depth on F-DLC. The optimum fluorine concentration was determined after performing several pre-experiments. The stamp was applied successfully to UV-NIL without being coated with an anti-adhesion layer.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.13 no.9
• /
• pp.3835-3840
• /
• 2012

Nanoimprint lithography (NIL) is an emerging technology enabling cost-effective and high-throughput nanofabrication. Recently a lot of research for the nanoimprint have been carried out, but almost are about merely experimental result relating to the material operation and the imprint fabrication, and numerical analysis relating to the understanding of the imprint process with R&D level. In this paper, the viscoelasticity analysis model is developed using the finite element method. With this model, the filling process and residual layer formation in nanoimprint are analyzed, which is evaluated by a nanoimprint experiment.

• Journal of the Microelectronics and Packaging Society
• /
• v.14 no.4
• /
• pp.1-7
• /
• 2007

Nanoimprint lithography (NIL) is an emerging technology enabling cost-effective and high-throughput nanofabrication. To successfully imprint a nano-sized pattern, the process conditions such as temperature, pressure, and time should be appropriately selected. This starts with a clear understanding of polymer material behavior during the NIL process. In this work, the squeezing of thin polymer films into nanocavities during the thermal NIL has been investigated based upon a two-dimensional viscoelastic finite element analysis in order to understand how the process conditions affect a pattern quality. The simulations have been performed within the viscoelastic plateau region and the stress relaxation effect has been taken into account.

• Journal of the Korean Society of Manufacturing Technology Engineers
• /
• v.20 no.3
• /
• pp.245-250
• /
• 2011

An UV/thermal hybrid nanoimprint lithography system was designed and implemented for the pattern transfer to flexible substrates. This system can utilize a plate stamp, roll stamp, and film stamp. For all cases of using those stamps, this system is also switchable an UV or thermal nanoimprint lithography mode. This paper shows how to design the heating and UV curing plates and proposes how to change them easily. Because the pressure condition and the speed of the press roller varies by the characteristics of the stamp and substrate, all the parameters related to the nanoimprint lithography have to adjustable. Some transferred patterns are shown in this paper to verify the performance of the hybrid nanoimprint lithography system. The flexible substrates with nano-scale patterns on them will be key components for next generation technologies such as flexible displays, bendable semi-conductors, and solar cells.

• Proceedings of the Korean Society of Rheology Conference
• /
• 2002.11a
• /
• pp.59-62
• /
• 2002

No Abstract, See Full Text

• Proceedings of the KSME Conference
• /
• 2003.04a
• /
• pp.1069-1072
• /
• 2003

Ultraviolet-nanoimprint lithography (UV-NIL) is a promising nanoimprint method for cost-effectively defining nanometer scale structures at room temperature and low pressure. Nanostamp fabrication technology is a key technology for UV-NIL because fabricating a high resolution nanostamp is the first step for defining high resolution nanostructures in a substrate. We used quartz as an UV transparent stamp material for the UVNIL. A $5{\times}5{\times}0.09$ inch stamp was fabricated using the quartz etch process in which Cr film was used as a hard mask for transferring nanostructures into the quartz. In this paper, we describe the quartz etching process and discuss the results including SEM images.

• Proceedings of the KSME Conference
• /
• 2008.11a
• /
• pp.827-831
• /
• 2008

In this paper, kinematic analysis for a planar 3-DOF redundant stage which has four actuators is presented by using SimMechanics software package. SimMechanics is a block sets of the Matlab/Simulink package. The SimMechanics enables a simplified model for a complex kinematic mechanism, since kinematic relationship between joints and linkages for the kinematic chains are expressed as line vectors and block diagrams. Here, positional error and limit values of movement ranges of the stage are evaluated by using the SimMechanics. The validity of the kinematic characteristics model was compared with theoretical kinematic analyses for the 3-DOF stage.

• Proceedings of the KSME Conference
• /
• 2005.11a
• /
• pp.238.1-238.1
• /
• 2005

• Proceedings of the Korean Society for Technology of Plasticity Conference
• /
• 2008.10a
• /
• pp.325-328
• /
• 2008

With intensive research and development to mass particular nanostructure of 10nm, Nanoimprint lithography will soon be put to practical use. This paper reviews latest research and application trend and also covers technical articles about Nanoimprint lithography technology Published since 1998, including statistical analysis of collected data(Web of Science DB) and related technical trend.