• Bulletin of the Korean Chemical Society
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• 제32권11호
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• pp.3991-3995
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• 2011

$TiO_2-SiO_2-In_2O_3$ nanocomposite thin film was deposited on the glass substrates using a dip coating technique. The morphology, surface composition, surface hydroxyl groups, photocatalytic activity and hydrophilic properties of the thin film were investigated by AFM, XPS, methyl orange decoloring rate and water contact angle measurements. The hydroxyl content for $TiO_2$, $TiO_2-SiO_2$ and $TiO_2-SiO_2-In_2O_3$ nanocomposite films was calculated to be 11.6, 17.1 and 20.7%, respectively. $TiO_2-SiO_2-In_2O_3$ film turned superhydrophilic after 180-min irradiation with respect to pure $TiO_2$ and $TiO_2-SiO_2$ thin films. The photocatalytic decomposition of methyl orange for $TiO_2$, $TiO_2-SiO_2$ and $TiO_2-SiO_2-In_2O_3$ thin films was measured as 38.19, 58.71 and 68.02%, respectively. The results indicated that $SiO_2$ and $In_2O_3$ had a significant effect on the hydrophilic, photocatalytic and self-cleaning properties of $TiO_2$ thin film.

• 한국환경과학회지
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• 제16권6호
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• pp.683-688
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• 2007

In this study, N doped $TiO_2$ (TiO-N) thin film was prepared by DC magnetron sputtering method to show the photocatalytic activity in a visible range. Various gases (Ar, $O_2\;and\;N_2$) were used and Ti target was impressed by 1.2 kW -5.8 kW power range. The hysteresis of TiO-N thin film as a function of discharge voltage wasn't observed in 1.2 and 2.9kW of applied power. Cross sections and surfaces of thin films by FE-SEM were tiny and dense particle sizes of both films with normal cylindrical structures. XRD pattern of $TiO_2$ and TiO-N thin films was appeared by only anatase peak. Red shift in UV-Vis adsorption spectra was investigated TiO-N thin film. Photoactivity was evaluated by removal rate measurement of suncion yellow among reactive dyes. The photodegradation rate of $TiO_2$ thin film on visible radiation was shown little efficiency but TiO-N was about 18%.

• 폴리머
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• 제38권4호
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• pp.525-529
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• 2014

반도체 특성을 가지는 금속산화물이 포함된 poly(3,4-ethylenedioxythiophene)(PEDOT)-$TiO_2$ 하이브리드 전도성 박막을 동시-기상중합법을 이용하여 성공적으로 제조하였다. PEDOT-$TiO_2$ 박막은 PEDOT 박막에 비하여 내스크래치성, 연필경도와 같은 기계적 물성과 전기/광학적 특성을 향상시킬 수 있었다. 동시-기상중합으로 제조된 하이브리드 박막은 FTS 산화제에 의한 졸-젤 반응으로 물리화학적으로 안정한 가교구조의 $TiO_2$ 층이 균일하게 형성되어 PEDOT 박막자체의 전기/광학적 손실을 수반하지 않고 기계적 물성을 높일 수 있었다. 동시-기상중합을 통하여 제조된 하이브리드 박막은 PEDOT 박막에 비하여 평탄한 표면구조를 가졌으며, 이로 인하여 상대적으로 높은 전기전도도를 가진다.

• 태양에너지
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• 제10권2호
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• pp.69-76
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• 1990

[ $TiO_2$ ] 박막을 물에 담그고 빛을 조사하였을때의 물의 광전기화학적 분해현상을 관찰하였다. $TiO_2$ 박막은 스프레이법에 의해 $SnO_2$ 네사글라스를 만들고 이 네사글라스 위에 딥-코오팅법을 이용하여 $TiO_2$ 박막을 코오팅하였다. 다양한 두께의 $TiO_2$ 박막의 I-V 특성을 조사하였고 SEM에 의해 그 표면 상태를 알아 보았다. 필름의 두께가 $1.8{\mu}m$ 일때 광전기 전류가 최대로 나타남을 볼 수 있었다. $TiO_2$ 박막을 산성 수용액(pH=1)에 담그고 Xe-램프를 광원으로 하여 광전기 화학반응에 의한 물의 광 분해에 의해 산소 및 수소 가스가 발생함을 볼 수 있었다.

• 한국표면공학회지
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• 제50권5호
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• pp.345-351
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• 2017

A double-layered anti-reflective coating with hydrophilic/abrasion-resistant properties was studied using anatase titanium dioxide($TiO_2$) and silicon oxycarbide($SiO_xC_y$) thin film. $TiO_2$ and $SiO_xC_y$ thin films were sequentially deposited on a glass substrate by DC sputtering and PECVD, respectively. The optical properties were measured by UV-Vis-NIR spectrophotometer. The abrasion-resistance and the hydrophilicity were observed by a taber abrasion tester and a contact angle analyzer, respectively. The $TiO_2/SiO_xC_y$ double-layer thin film had an average transmittance of 91.3%, which was improved by 10% in the visible light region (400 to 800 nm) than that of the $TiO_2$ single-layer thin film. The contact angle of $TiO_2/SiO_xC_y$ film was $6.9^{\circ}$ right after UV exposure. After 9 days from the exposure, the contact angle was $10.2^{\circ}$, which was $33^{\circ}$ lower than that of the $TiO_2$ single-layer film. By the abrasion test, $SiO_xC_y$ film showed a superior abrasion-resistance to the $TiO_2$ film. Consequently, the $TiO_2/SiO_xC_y$ double-layer film has achieved superior anti-reflection, hydrophilicity, and abrasion resistance over the $TiO_2$ or $SiO_xC_y$ single-layer film.

• 대한환경공학회지
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• 제27권1호
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• pp.59-66
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• 2005

[ $TiO_2$ ]박막은 DC 마그네트론 스퍼터링법을 이용하여 다양한 스퍼터링 파라미터(전력 $0.6{\sim}5.2\;kw$, 기판온도 실온${\sim}350^{\circ}C$, 산소량 $0{\sim}50\;sccm$($O_2+Ar$ 90 sccm, 압력은 약 1 mtorr))를 통하여 증착되었다. TiO-N박막도 가스의 유량비를 제외하고는 $TiO_2$박막과 같은 스퍼터링 조건하에서 증착되었다. 이러한 스퍼터링 파라미터에서 증착된 박막의 전기적 특성을 분석하기 위하여 시트저항을 측정하였고, 박막의 두께(${\alpha}$-step), 표면 거칠기(AFM), 형성 조직(FE-SEM, XRD)을 분석하여 최적 스퍼터링 파라미터를 도출하였다. 최적 스퍼터링 파라미터에서 제조된($TiO_2$, TiO-N)박막을 이용하여 광활성도를 평가하기 위하여 VOCs물질 중 toluene, 반응성 염료인 Suncion Yellow를 대상 물질로 선정하여 적용성 연구를 수행하였다. 실험에서 광촉매 박막은 적용물질에 대해서 광활성을 양호하게 보였으며, 특히 TiO-N광촉매 박막은 가시광 영역에서도 최대 33%의 톨루엔(5 ppm) 제거 효율을 나타내었다.

• 한국전기전자재료학회논문지
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• 제11권10호
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• pp.826-832
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• 1998

In this study the thin films with the structure of Si+SiO$_2$+TiN are made by RF supttering method. TiN, which has small diffusion coefficient and low resistivity, is evaporated between SiO$_2$ and Al layers. It investigates the V-R characteristics depending on the thickness of SiO$_2$ which is used as insulation layer and researches its effects on voltage stability of thin film and varistor. These films show very small resistance valus in negative(-) voltage and large and large value in positive voltage band, and with the increase of voltage, resistance value is rapidly reduced and the satisfactory characteristic of varistor is shown at +1[V]. It is found that resistance value of TiN thin film is small and also TiN thin film has more current than the thin film which is not evaporated by TiN thin film. When Al electrode is evaporated of SiO$_2$ thin film, spiking occurs, but the spiking can be prevented with evaporation of TiN between SiO$_2$ and Al layers and this thin films in made easily because of its good attachment. With the increase of voltage, the resistance is changed into non-linear pattern and the bidirectional varistor characteristic is shown and then its theory can be verified by this experiment. Accordingly, when TiN is evaporated of Si Wafer(n-100), it obtains better voltage-resistance than thin film which is not evaporated and also when varistor character is used electrically to automatic control element such as elimination of flame, power distribution arrestor and constant voltage compensation, satisfactory reproducibilities are expected.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 하계학술대회 논문집
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• pp.290-294
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• 2001

In this study, ZnO is evaporated to be coated on n-type Si wafer substrate. Refractive coefficient of thin film that is evaporating TiO$_2$ onto ZnO increases linearly as thickness is getting thinner to have high value and high angle and it satisfies theoretical equation I(x)=Io exp (-$\alpha$x) theory that represents the strength of photon energy advancing through ZnO thin film. And dielectric constant of TiO$_2$ thin film evaporated onto ZnO is high and $\varepsilon$$_2$ is smaller than $\varepsilon$$_1$. The specimen TiO$_2$ thin film evaporated onto ZnO has much higher dielectric constant when photon energy is increased.

• Bulletin of the Korean Chemical Society
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• 제22권11호
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• pp.1183-1191
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• 2001

The metallorganic chemical vapor deposition (MOCVD) method has been used to prepare TiO2 thin films for the degradation of hazardous organic compounds, such as 2-chlorophenol (2-CP). The effect of supporting materials and metal doping on the photocatalytic activity of TiO2 thin films also has been studied. TiO2 thin films were coated onto various supporting materials, including stainless steel cloth(SS), quartz glass tube (QGT), and silica gel (SG). Transition metals, such as Pd(II), Pt(IV), Nd(III) and Fe(III), were doped onto TiO2 thin film. The results indicate that Nd(Ⅲ) doping improves the photodegradation of 2-CP. Among all supporting materials studied, SS(37 ${\mu}m)$ appears to be the best support. An optimal amount of doping material at 1.0 percent (w/w) of TiO2-substrate thin film gives the best photodegration of 2-CP.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 추계학술대회 논문집 Vol.18
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• pp.68-69
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• 2005

BTO ($BaTiO_3$) thin film is one of the high dielectric materials for high-density dynamic random access memories (DRAMs) due to its relatively high dielectric constant. It is generally known that BTO film is difficult to be etched by plasma etching, but high etch rate with good selectivity to pattern mask was required. The problem of sidewall angle also still remained to be solved in plasma etching of BTO thin film. In this study, we first examined the patterning possibility of BTO film by chemical mechanical polishing (CMP) process instead of plasma etching. The sputtered BTO film on TEOS film as a stopper layer was polished by CMP process with the self-developed $BaTiO_3$- and $TiO_2$-mixed abrasives slurries (MAS), respectively. The removal rate of BTO thin film using the$ BaTiO_3$-mixed abrasive slurry ($BaTiO_3$-MAS) was higher than that using the $TiO_2$-mixed abrasive slurry ($TiO_2$-MAS) in the same concentrations. The maximum removal rate of BTO thin film was 848 nm/min with an addition of $BaTiO_3$ abrasive at the concentration of 3 wt%. The sufficient within-wafer non-uniformity (WIWNU%)below 5% was obtained in each abrasive at all concentrations. The surface morphology of polished BTO thin film was investigated by atomic force microscopy (AFM).