• BMB Reports
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• 제28권6호
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• pp.533-537
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• 1995

The detection with lucigenin under physiological conditions is selective for ${\cdot} O_{2}^{-}$, for it can be accepted that lucigenin indicates actual intramembranal $\cdot O_{2}^{-}- formation$. Lucigenin chemiluminescence (CL) was elicited from the plasma membrane (PM) only by addition of reduced pyridine nucleotide. NADPH was preferred to NADH in PM and hepatocytes. This specificity was masked by $NAD(P)^+$ inhibition. The half maximum rate of CL increase was obtained with 1.5 ${\mu}m$ NADH or 55 ${\mu}m$ NADPH in hepatocytes and 6 ${\mu}m$ NADH or 30 ${\mu}m$ NADPH in plasma membranes. Measurement of these NADPH values required the presence of a NADPH-regenerating system. With NADPH the maximal rate obtained was 10 fold higher than with NADH. NADPH and NADH could produce CL when having access from either side of the membrane. They seemed to react with the identical acceptor because NADH-induced CL was also inhibited by $NADP^+$. The characteristics of ${\cdot}O_{2}^{-}-formation$ produced by pyridine nucleotide will be discussed.

• 한국진공학회지
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• 제19권1호
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• pp.22-27
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• 2010

$TiO_2$의 표면의 친수성을 증가시키기 위하여 dielectric barrier discharge (DBD)에 의해 발생된 대기압 플라즈마 (atmospheric pressure plasma: APP)를 이용 RF power 50~200 W 범위에서 Ar과 $O_2$ 가스를 사용 대기압 플라즈마로 광촉매 표면을 개질하였다. Ar 가스 단독으로 처리한 시료의 접촉각은 20도에서 10도로 감소하였으며, $O_2$ 가스를 반응성 가스로 하여 처리한 경우에는 접촉각이 20도에서 1도 미만으로 감소하였다. 동일한 RF power에서 $O_2$ 플라즈마 처리 시 더 낮은 접촉각을 확인하였는데, 이는 $TiO_2$ 표면과 산소원자의 결합으로 인하여 표면의 polar force의 증가에 의한 것으로 판단되어 대기압 플라즈마로 처리된 시료의 X-ray photoelectron spectroscopy (XPS)의 스펙트럼 분석결과 OH 작용기의 증가로 표면의 친수성이 증가됨을 확인하였다. 대기압 플라즈마로 처리된 시료와 처리하지 않은 시료의 접촉각은 모두 시간이 지남에 따라 증가하지만 플라즈마 처리 된 시료의 접촉각 증가는 플라즈마 처리하지 않은 시료의 접촉각 보다 작은 것을 확인하였다. 또한, 페놀 분해 실험을 통하여 플라즈마 표면처리를 통하여 $TiO_2$ 광촉매의 분해 효율이 크게 향상되는 것을 확인하였다.

• 한국진공학회지
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• 제7권s1호
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• pp.106-117
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• 1998

Fluorocarbonated-SiO2 films were deposited on p-type Si(100) substrate using FSi$(OC_2H_5)_3$ (FTES), and $O_2$ mixture gases by a helicon plasms source. High density $O_2$/FTES/Ar plasma of ~$10^{12} \textrm{cm}^{-3}$ is obtained at low pressure (<3mTorr) with RF power above 900 W in the helicon plasma source. Optical emission spectroscopy (OES) is used to study the relation between the relative densities of the radicals and the film properties. The FTES and $O_2$ gases are greatly dissociated at the helicon mode that is launched at the above threshold plasma density. FTIR and XPS spectra shows that the film has Si-F, and C-F bonds during the formation process of the film which may lower the dielectric constant greatly. The relative dielectric constant, leakage current density, and dielectric breakdown voltage are about 2.8, $8\times10^{-9}\textrm{A/cm}^2$, and > 12 MV/cm, respectively.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2009년도 제38회 동계학술대회 초록집
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• pp.213-213
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• 2010

Magnetic random access memory (MRAM), based on magnetic tunnel junction (MTJ) and CMOS, is one of the best semiconductor memories because it can provide nonvolatility, fast access time, unlimited read/write endurance, low operating voltage and high storage density. For the realization of high density MRAM, the etching of MTJ stack with good properties is one of a key process. Recently, there has been great interest in the MTJ stack using MgO as barrier layer for its huge room temperature MR ratio. The use of MgO barrier layer will undoubtedly accelerate the development of MTJ stack for MRAM. In this study, high-density plasma reactive ion etching of MgO films was investigated in an inductively coupled plasma of $Cl_2$/Ar gas mixes. The etch rate, etch selectivity and etch profile of this magnetic film were examined on vary gas concentration. As the $Cl_2$ gas concentration increased, the etch rate of MgO monotonously decreased and etch slop was slanted. The effective of etch parameters including coil rf power, dc-bais voltage, and gas pressure on the etch profile of MgO thin film was explored, At high coil rf power, high dc-bais voltage, low gas pressure, the etching of MgO displayed better etch profiles. Finally, the clean and vertical etch sidewall of MgO films was achieved using $Cl_2$/Ar plasma at the optimized etch conditions.

• Journal of Welding and Joining
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• 제21권4호
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• pp.39-45
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• 2003

Nano-TiO$_2$ photocatalytic coatings were deposited on the stainless steel 304(50$\times$70$\times$3mm) by the APS(Atmospheric Plasma Spraying). Photocatlytic reaction was tested in MB(methylene blue) aqueous solution. For applying nano-TiO$_2$ powders by thermal spray, the starting nano-TiO$_2$ powder with 100% anatase crystalline was agglomerated by spray drying. Plasma second gas(H$_2$) flow rate and spraying distance were used as principal process parameters which are known to control heat enthalpy(heat input). The relationship between process parameters and the characteristics of microstructure such as the anatase phase fraction and grain size of the TiO$_2$ coatings were investigated. The photo-decomposition efficiency of TiO$_2$ coatings was evaluated by the kinetics of MB aqueous solution decomposition. It was found that the TiO$_2$ coating with a lower heat input condition had a higher anatase fraction, smaller anatase grain size and a better photo-decomposition efficiency.

• 한국결정성장학회지
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• 제13권1호
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• pp.36-40
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• 2003

$CH_4/(C_2H_5O)_4Si/H_2$/Ar가스 혼합물을 출발 반응원료로 하여 플라즈마 화학기상증착법으로 Si 기판 위에 유사 다이아몬드 나노복합체(diamond-like nanocomposite, DLN) 박막을 증착하였다. 성장된 막의 화학구조와 미세구조를 확인하였으며 막의 마모특성을 평가하였다. 증착된 DLN 막은 다이아몬드와 유사한 a-C:H 구조와 실리카와 유사한 a-Si:O 구조가 네트워크 형태로 구성되어 있음을 확인하였으며 극도로 낮은 마모계수와 마모속도를 나타내어 내마모 코팅용 보호막으로 의 응용에 적합한 것으로 나타났다.

• Journal of Korean Vacuum Science & Technology
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• 제2권1호
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• pp.25-31
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• 1998

The reliability of fluorine doped silicon oxide (SiOF) films for intermetal dielectrics in multilevel interconnections of ultra-large scale integrated circuits (ULSIs) is investigated. SiOF films were deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition (ECRPECVD) using H-free source gases, i.e., SiF4 and O2. The effect of post plasma treatment on the moisture absorption and dielectric properties of SiOF films was carried out I terms of air exposure time, The reliability test of Cu/TiN/SiOF/Fi specimen was carried out in terms of temperature by rapid thermal annealing (RTA) in N2 ambient. After O2 plasma treatment,, no appreciable peak directly related to moisture absorption was detected. The capacitance-voltage (C-V) characteristics of the O2 plasma treated SiOF film showed that the film remained to hold the sound dielectric properties even after boiling treatment. The Cu/TiN/SiOF/Si system was found to be reliable up to $600^{\circ}C$.

• 전기전자학회논문지
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• 제18권4호
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• pp.447-455
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• 2014

본 연구에서는 4H-SiC MOSFET의 주요 문제점인 $SiC/SiO_2$ 계면의 특성을 향상시키기 위해 PECVD (plasma enhanced chemical vapor deposition) 공정을 이용하여 n-based 4H-SiC MOS Capacitor를 제작하였다. 건식 산화 공정의 낮은 성장속도, 높은 계면포획 밀도와 $SiO_2$의 낮은 항복전계 등의 문제를 극복하기 위하여 PECVD와 NO어닐링 공정을 사용하여 MOS Capacitor를 제작하였다. 제작이 끝난 후, MOS Capacitor의 계면특성을 hi-lo C-V 측정, I-V 측정 및 SIMS를 이용해 측정하고 평가하였다. 계면의 특성을 건식 산화의 경우와 비교한 결과 20% 감소한 평탄대 전압 변화, 25% 감소한 $SiO_2$ 유효 전하 밀도, 8MV/cm의 증가한 $SiO_2$ 항복전계 및 1.57eV의 유효 에너지 장벽 높이, 전도대 아래로 0.375~0.495eV만큼 떨어져 있는 에너지 영역에서 69.05% 감소한 계면 포획 농도를 확인함으로써 향상된 계면 및 산화막 특성을 얻을 수 있었다.

• 한국수소및신에너지학회논문집
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• 제9권2호
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• pp.77-84
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• 1998

$H_2O/O_2$, $D_2O/H_2O$, $D_2O/H_$2 등의 반응계의 수소동위원소 교환반응용 전기방전을 이용하여 용이하게 일으킬 수 있다. 예를 들어, DC 코로나 방전을 위의 반응혼합물을 통하여 일으키면 여기된 상태의 반응물이 존재하는 플라즈마를 형성하게 된다. 이러한 플라즈마 내에서 반응물들은 양자에너지 준위의 여기, 이온화 그리고 라디칼 형성등을 통하여 매우 큰 반응성을 갖게되므로 실온에서도 용이하게 수소동위원소 교환반응을 일으킨다. 본 연구에서는 $H_2/D_2O$계의 기상에서의 교환반응에 대한 연구를 실시하였다. 위 반응계는 전기방전하에서 수소(H)와 중수소(D)간의 교환반응에 의하여 HDO와 HD를 생성하게 된다. 이러한 반응생성물을 FTIR 분광법을 이용하여 시간의 함수로 측정을 하였다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제44회 동계 정기학술대회 초록집
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• pp.230-230
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• 2013

In amorphous or microcrystalline thin-film silicon solar cells, p-i-n structure is used instead of p/n junction structure as in wafer-based Si solar cells. Hence, these p-i-n structured solar cells inevitably consist of many interfaces and the cell efficiency critically depends on the effective control of these interfaces. In this study, in-situ plasma treatment process of the interfaces was developed to improve the efficiency of a-Si:H solar cell. The p-i-n cell was deposited using a single-chamber VHF-PECVD system, which was driven by a pulsed-RF generator at 80 MHz. In order to solve the cross-contamination problem of p-i layer, high RF power was applied without supplying SiH4 gas after p-layer deposition, which effectively cleaned B contamination inside chamber wall from p-layer deposition. In addition to the p-i interface control, various interface control techniques such as thin layer of TiO2 deposition to prevent H2 plasma reduction of FTO layer, multiple applications of thin i-layer deposition and H2 plasma treatment, H2 plasma treatment of i-layer prior to n-layer deposition, etc. were developed. In order to reduce the reflection at the air-glass interface, anti-reflective SiO2 coating was also adopted. The initial solar cell efficiency over 11% could be achieved for test cell area of 0.2 $cm^2$.