• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.11a
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• pp.260-261
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• 2005

The heterolayered thick/thin structure consisting of $Pb(Zr_{0.52}Ti_{0.48})O_3$ and $BaTiO_3(BT)$ were fabricated by a sol-gel process. PZT powders, prepared by the sol-gel method, were mixed with an organic vehicle and the PZT thick films were fabricated by the screen printing techniques on alumina substrate with Pt electrodes. The microstructural and dielectric characteristics of the stacked heterolayered PZT/BT/PZT films were investigated by varying the number of coating $BaTiO_3$ layers. The existence of a $BaTiO_3$ layer between the PZT thick films of the tri-layer $Pb(Zr_xTi_{1-x})O_3/BaTiO_3/Pb(Zr_xTi_{1-x})O_3$thick/thin/thick film can greatly improve the leakage current properties of the PZT thick films. The average thickness of a PZT(5248)/$BaTiO_3$ heterolayered thick/thin film was 25$\mu$m. The relative dielectric constant and dielectric loss of the PZT(5248)/$BaTiO_3$-3 heterolayered thin film coated three times were 1087 and 1.00% at 1[MHz].

• Journal of the Korean Ceramic Society
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• v.40 no.12
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• pp.1183-1188
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• 2003

LCP (Liquid Crystal Polymer)/BT(BaTiO$_3$) composite was prepared by mixing LCP varnish and BT slurry. And the effect of the composition of LCP/BT composites and the size of BT powder on dielectric properties of LCP/BT composite were investigated. The dispersion properties of BT slurries were also studied as a function of volume fraction of dispersant, GLYMO (3-glycidyloxypropyltrimethoxysilane) added to various sized BT powders. The quantity of optimum dispersant in BT slurry decreased with an increase of BT powder size because of the decrease of specific surface area of BT powder. LCP/BT composite sheet was prepared by tape-casting method with mixing BT slurry and LCP varnish. The dielectric constant of the composites increased from 34.3 to 44.1 and their dielectric loss increased from 0.05 to 0.063 as the size of BT powder increased from 100 nm to 500 nm.

• Journal of the Korean Ceramic Society
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• v.32 no.8
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• pp.938-944
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• 1995

Dielectric properties and the stabilization of perovskite phase for the (1-y)Pb(Mg(1-x)/3Znx/3Znx/3Nb2/3)O3-yBaTiO3 ((1-y)PM1-xZxN-yBT) ceramics have been investigated as a function of amount of x and y. In the (1-y)PM0.6Z0.4N-yBT ceramics, the amount of pyrochlore phae was decreased by the addition of 2 mol% BT and the dielectric constant was increased. However, the dielectric constant decreased with further addition of BT even though pyrochlore phase was decreased. Dielectric prooperties in (1-y)PM0.6Z0.4N-yBT ceracmis were affected by the character of the BT rather than the amount of pyrochlore phase. The phase transitions were broadened and phase transition temperatures were lowered by the increase of BT contents.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.27 no.6
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• pp.367-371
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• 2014

We investigated dielectric relaxation properties of $0.95(Na_{0.5}K_{0.5})NbO_3-0.05BaTiO_3$ ceramics by addition (0~0.3 wt%) of $(Ba,Ca)SiO_3$ glass frit. All composition of $0.95(Na_{0.5}K_{0.5})NbO_3-0.05BaTiO_3$ added $(Ba,Ca)SiO_3$ glass frit showed the same crystallographic properties, coexistence of orthorhombic and tetragonal phase. By increasing addition of $(Ba,Ca)SiO_3$ glass frit, the Curie temperatures of $0.95(Na_{0.5}K_{0.5})NbO_3-0.05BaTiO_3$ ceramics were decreased, whereas maximum dielectric constants of $0.95(Na_{0.5}K_{0.5})NbO_3-0.05BaTiO_3$ ceramics were dramatically increased. Especially the deviations of Curie temperature $0.95(Na_{0.5}K_{0.5})NbO_3-0.05BaTiO_3$ ceramics were increased by increasing amount of $(Ba,Ca)SiO_3$ glass frit, and it indicated that $0.95(Na_{0.5}K_{0.5})NbO_3-0.05BaTiO_3$ ceramics added $(Ba,Ca)SiO_3$ glass frit have relaxor characteristics.

• Proceedings of the KIEE Conference
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• 2009.07a
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• pp.1324_1325
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• 2009

The heterolayered $BaTiO_3/(Bi_{0.5}Na_{0.5})TiO_3$ thick films were fabricated by screen printing techniques on alumina substrates electrodes with Pt. We report the improved ferroelectric properties in the heterolayered teteragonal/rhombohedral structure composed of the $BaTiO_3$ and the $(Bi_{0.5}Na_{0.5})TiO_3$ thick films. We investigated the effects of deposition conditions on the structural and electrical properties of the heterolayered BNT/BT thick films. The structural and electrical properties of the heterolayered BNT/BT thick films were studied. All PZT heterolayered thin films show dense and homogeneous structure without the presence of the rosette structure. The dielectric constant, loss and remanent polarization oft heheterolayered BNT/BT thick films were superior to those of single composition $BaTiO_3$ and $(Bi_{1/2}Na_{1/2})TiO_3$, and those values for the heterolayered BNT/BT thick films sintered at $1100^{\circ}C$ were 916, 0.79 and $12.63{\mu}C/cm^2$.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.11 no.12
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• pp.1108-1114
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• 1998

$BaTiO_3$ thin films preferred c-axis orientation for the potential application of ferroelectric memory devices were deposited on silicon substrates(100) by RF sputtering and annealed at 800 and 900[$^{\circ}C$] in air. The BT(100)/BT(110) peak ratio of the sputtered sample was decreased with post-annealing in air. According to increasing with annealing temperature and time, the peak ratio of BT(100)/BT(110) was decreased and the surface density of thin film was high. Dielectric characteristics of $BaTiO_3$ thin film was measured as a function of annealing temperature and frequency. The dielectric constants were increased with annealing and decreased with frequency by space charge polarization and dipole polarization below 600[kHz]. The remanent polarization and coercive field in P-E hysteresis loop of $BaTiO_3$thin film were increased with the annealing temperature in air. The remanent polarization and coercive filed annealed at 800[$^{\circ}C$] for 1hr were 1.2[$\mu$C/$cm^2$] and 200[kV/cm]

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.05b
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• pp.57-59
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• 2005

Ploycrystalline $Pb(Zr_{0.5},Ti_{0.5})O_3$ and $BaTiO_3$ powder were prepared by sol-gel process. The alumina substrate were sintered at $1400^{\circ}C$ with bottom electrode of Pt for 2 hours. The Pb(Zr0.5,Ti0.5)O3 / BaTiO3 multilayered thick films with laminating times were fabricated on alumina substrate by screening printing method. The obtained thick films were sintered at $800^{\circ}C$ with upper electrode of Ag paste for 1 hour. Structural properties of Pb(Zr0.5,Ti0.5)O3 / BaTiO3 multilayered thick films were investigated. As a result of the Differential Thermal Analysis(DTA) of Pb(Zr0.5,Ti0.5)O3, exothermic peak was observed at around $650^{\circ}C$. The X-ray diffraction (XRD) patterns indicated that BaTi03 and Pb(Zr0.5,Ti0.5)O3 phases and porosities were formed in the interface of Pb(Zr0.5,Ti0.5)O3 / BaTiO3 multilayered thick films.

• Proceedings of the KIEE Conference
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• 2004.11a
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• pp.180-182
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• 2004

Polycrystalline $BaTiO_3/SrTiO_3$ powder was prepared by sol-gel process and the multilayered thick films were prepared on the $Al_2O_3$ substrates by screen printing method. The films were sintered at $1400^{\circ}C$ for 2 hours in the air. The structural and dielectric properties were investigated, The X-ray diffraction (XRD) patterns indicate that the BST phase and porocity were formed in the interface of $BaTiO_3/SrTiO_3$ multilayered thick films. The dielectric constant and the dielectric loss of the BT/ST/BT/ST multilayered thick films were about 247 and 0.84% at 1MHz.

• Journal of Powder Materials
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• v.13 no.2 s.55
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• pp.119-123
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• 2006

The grain growth behavior of $0.95Na_{1/2}Bi_{1/2}TiO_{3}-0.05BaTiO_{3}$ (NBT-5BT) has been investigated with respect to the grain shape. The powder compacts of NBT-5BT were sintered at 1200 for various times. The corresponding equilibrium shape was a round-edged cube with flat {100}-faces. Abnormal grains were not observed in the specimens sintered for 1 to 12 h but abnormal grains appeared when sintered for 24 h. Before the formation of abnormal grains, a valley was observed in the measured grain size distribution of NBT-5BT, showing that the grain size distribution was a combination of two unimodal distributions. The present result suggests that the grain growth in NBT-5BT was governed by the growth of facet planes which would occur via 2-dimansional nucleation and growth.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2005.07a
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• pp.365-366
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• 2005

PZT films are the most intensively investigated because PZT has advantages such as low processing temperature and large remnant values. In this paper, the microstructure and electric properties of $Pb(Zr_x,Ti_{(1-x)})O_3/BaTiO_3$ heterolayered thick films with Zr mole ranging from 30 to 70 % screen printed onto a alumina substrate were studied. $Pb(Zr_x,Ti_{(1-x)})O_3$ and $BaTiO_3$ powders were prepared by the sol-gel method. The $BaTiO_3$ powders were calcined at $700^{\circ}C$ for 2 hours. Structural properties of $Pb(Zr_x,Ti_{(1-x)})O_3/BaTiO_3$ multilayered thick films were investigated. As a result of the X-ray diffraction (XRD) analysis, $Pb(Zr_x,Ti_{(1-x)})O_3/BaTiO_3$ exhibited a perovskite polycrystalline phase without pyrochlore phase or any preferred orientation.