• Title/Summary/Keyword: $AFM_1$

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Determination of Aflatoxin M1 and Heavy Metals in Infant Formula Milk Brands Available in Pakistani Markets

  • Akhtar, Saeed;Shahzad, Muhammad Arif;Yoo, Sang-Ho;Ismail, Amir;Hameed, Aneela;Ismail, Tariq;Riaz, Muhammad
    • Food Science of Animal Resources
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    • v.37 no.1
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    • pp.79-86
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    • 2017
  • Aflatoxin $M_1$ ($AFM_1$) after its bioconversion from aflatoxin $B_1$ in animal liver becomes the part of milk while heavy metals get entry into milk and milk products during handling in the supply chain. Aflatoxin $M_1$ and heavy metals being toxic compounds are needed to be monitored continuously to avoid any ailments among consumers of foods contaminated with such toxicants. Thirteen commercially available infant formula milk (IFM) brands available in Pakistani markets were analyzed for the quantitative determination of $AFM_1$ and heavy metals through ELISA and atomic absorption spectrophotometer, respectively. $AFM_1$ was found positive in 53.84% samples while 30.76% samples were found exceeding the maximum EU limit i.e. $0.025 {\mu}g/kg$ for $AFM_1$ in IFM. Heavy metals lead (Pb) and cadmium (Cd) were found below the detection limits in any of the sample, whereas the concentrations of iron (Fe), zinc (Zn) and nickel (Ni) ranged between 45.40-97.10, 29.72-113.50 and <$0.001-50.90 {\mu}g/kg$, respectively. The concentration of Fe in all the tested brands was found in normal ranges while the concentrations of Zn and Ni were found exceeding the standard norms. Elevated levels of $AFM_1$, Zn and Ni in some of the tested IFM brands indicated that a diet completely based on these IFM brands might pose sever health implications in the most vulnerable community i.e., infants.

Modification and Repair of a Carbon Nanotube-based Device Using an Atomic Force Microscope (원자힘현미경을 이용한 탄소나노튜브소자의 턴형 및 수리)

  • Park, Ji-Yong;Kim, Yong-Sun;Oh, Young-Mu
    • Journal of the Korean Vacuum Society
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    • v.16 no.1
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    • pp.33-39
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    • 2007
  • Electrical and mechanical modifications of devices based on carbon nanotubes(CNTs) using an atomic force microscope(AFM) in the forms of cutting and reconnection of CNTs are demonstrated. In addition to the modifications, electrostatic force microscopy is used to visualize the cutting and reconnection of CNTs. In this way, AFM is shown to be a useful tool in local modifications and manipulations of CNT-based devices.

Simulations of Optical Characteristics according to the Silicon Oxide Pattern Distance Variation using an Atomic Force Microscopy (AFM) (AFM을 이용한 나노 패턴 형성과 크기에 따른 광특성 시뮬레이션)

  • Hwang, Min-Young;Moon, Kyoung-Sook;Koo, Sang-Mo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.23 no.6
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    • pp.440-443
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    • 2010
  • We report a top-down approach based on atomic force microscopy (AFM) local anodic oxidation for the fabrication of the nano-pattern field effect transistors (FETs). AFM anodic oxidation is relatively a simple process in atmosphere at room temperature but it still can result in patterns with a high spatial resolution, and compatibility with conventional silicon CMOS process. In this work, we study nano-pattern FETs for various cross-bar distance value D, from ${\sim}0.5\;{\mu}m$ to $1\;{\mu}m$. We compare the optical characteristics of the patterned FETs and of the reference FETs based on both 2-dimensional simulation and experimental results for the wavelength from 100 nm to 900 nm. The simulated the drain current of the nano-patterned FETs shows significantly higher value incident the reference FETs from ${\sim}1.7\;{\times}\;10^{-6}A$ to ${\sim}2.3\;{\times}\;10^{-6}A$ in the infrared range. The fabricated surface texturing of photo-transistors may be applied for high-efficiency photovoltaic devices.

A Conversion of AFm Phases by Addition of CaCO3, CaCl2 and CaSO4 · 2H2O (CaCO3, CaCl2 및 CaSO4 · 2H2O 첨가에 의한 AFm상의 변화)

  • 이종규;추용식
    • Journal of the Korean Ceramic Society
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    • v.40 no.1
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    • pp.24-30
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    • 2003
  • A formation and conversion of AFm phases decisively play role in the hydration, hardening and corrosion processes of various cement. In this study, the conversion of Alumino-Ferrite Monohydrates(AFm) phases under the addition of $CaCO_3,;CaCl_2;and;CaSO_4{cdot}2H_2O$was investigated by the XRD quantitative analysis. The thypical AFm phases are $M_S(monosulfoaluminate),;M_C(monocarboaluminate);and;M_{Cl}(monochloroaluminate and also Called Friedel's salts)$in this cementitious system, The conversion reaction were not occurred in $M_C-CaCO_3,;M_{Cl}-CaCO_3$ and $M_{Cl}-CaCl_2$system. However, in $M_S-CaCO_3$ system, ettringite and $monocarboaluminate(M_C)$ were formed. In $M_S-CaCl_2;system;M_S$ was transformed to Friedel's $salts(M_{Cl})$ and ettringite was formed. In the case of $CaSO_4{cdot}2H_2O$ addition, all AFm $phases(M_S,;M_C;and;M_{Cl})$ were transformed to ettringite. The order of stabilization of AFm phases under $CaCO_3,;CaCl_2;and;CaSO_4{cdot}2H_2O$ was as follows : $M_S< M_C

THE EFFECTS OF THE DEGREE OF SATURATION OF ACIDULATED BUFFER SOLUTIONS IN ENAMEL AND DENTIN REMINERALIZATION AND AFM OBSERVATION OF HYDROXYAPATITE CRYSTALS (유기산 완충용액의 포화도가 법랑질 및 상아질의 재광화에 미치는 영향과 수산화인회석의 AFM 관찰)

  • Park, Jeong-Won;Hur, Buck;Lee, Chan-Young
    • Restorative Dentistry and Endodontics
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    • v.25 no.3
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    • pp.459-473
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    • 2000
  • Dental caries is the most common disease in the maxillofacial area. There are many factors contributing to its development, but complete understanding and prevention is not fully known. Since the structure of the coronal and root portion of the tooth is different, the remineralization and demineralization process is also known to be different. In this study, by using a partially saturated buffer solution, we created artificial enamel and dentin caries and evaluated mineral loss. A remineralization solution with four different degrees of saturation (degree of saturation ; group 1, 0.268, group 2, 0.309, group 3, 0.339, group 4, 0.390, PH 4.3, F-2ppm) was used on a demineralized specimen. The mineral precipitating quantity and depth was evaluated by using microradiography. Using an atomic force microscope (AFM), hydroxyapatite crystals of normal, demineralized, and remineralized enamel and dentin were evaluated. The results were as follows: 1. As the degree of saturation of the remineralizing solution increased, the mineral precipitation in the enamel was increased. In group 4, mineral precipitation was limited near the surface. 2. As the degree of saturation of the remineralizing solution increased, the mineral precipitation in the dentin was decreased and it occurred in a deeper portion. In group 4, however, mineral precipitation occurred on the surface and its quantity increased. 3. There was a statistically significant interaction between enamel and dentin mineral content changes on specimens treated with remineralization and demineralization solution (demineralization r=0.44, remineralization r=0.44, p<0.05). 4. Demineralized hydroxyapatite crystals showed central and peripheral dissolving and widening of intercrystal spaces under the AFM. 5. In dentin remineralization small crystal precipitation occurred between the large crystals. We conclude that by adjusting acidulated buffer solution's degree of saturation, we can control enamel and dentin remineralization. In addition, the AFM is highly useful in evaluating changes in remineralized and demineralized hydroxyapatite crystals.

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Nanotribology of PMMA thin film using the AFM (AFM을 이용한 PMMA (Poly Methy1 Methacrylate) 박막의 나노트라이볼로지 연구)

  • 김승현;김용석
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2003.10a
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    • pp.89-92
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    • 2003
  • Nano-scratch tests were performed on PMMA thin films spin-coated on a Si substrate using an atomic force microscopy (AFM) with loads ranging from 10nN to 100nN. At low applied loads, a ridge pattern was formed on the PMMA surface. No wear particles were observed during the pattern-forming mild wear. At high applied loads, severe wear occurred accompanied by wear particles. The film with the highest hardness showed the highest wear resistance. Friction force generated during the Scratching was closely related with surface deformation of the film.

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Development of Measurement System for Quantitative Measurement of Cantilever in Atomic Force Microscopy (원자간격 현미경의 캔틸레버의 정량적 특성평가를 위한 계측 시스템 개발)

  • Kweon, Hyun-Kyu;Nam, Ki-Ho
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.6 no.2
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    • pp.22-27
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    • 2007
  • In this study, the two methods of stiffness measurement(Spring constant) of cantilever were proposed for quantitative measurement in Atomic Force Microscopy(AFM). As the 1st method for the measurement of stiffness, the probe method, which is used in the measurement of the semiconductor mechanical and electrical properties, was applied to the measurement of the cantilever. Experiments by the probe method were performed finding the resistance value of cantilever. As the results, the resistance was measured differently along with the dimension and the thickness of cantilever that determined the stiffness(spring constant) of the lever. As the 2nd method, the vibration characteristics(Dunkerley expression) is used to obtain the stiffness of the complex structure which is combined by AFM cantilever and the standard cantilever. We measured the resonant frequency from the complex structure using the micro stages and stereo microscope. As the results, we confirmed that the vibration characteristics(Dunkerley expression) is effected the micro complex structure of AFM cantilever.

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Wear Characteristics of Atomic force Microscope Tip (Atomic Force Microscope Tip 의 마멸특성에 관한 연구)

  • 정구현;김대은
    • Journal of the Korean Society for Precision Engineering
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    • v.20 no.5
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    • pp.189-195
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    • 2003
  • Atomic Force Microscope (AFM) has been widely used in micro/nano-scale studies and applications for. the last few decade. In this work, wear characteristics of silicon-based AFM tip was investigated. AFM tip shape was observed using a high resolution SEM and the wear coefficient was approximately calculated based on Archard's wear equation. It was shown that the wear coefficient of silicon and silicon nitride were in the range of ${10}^{-1}$~${10}^{-3}$ and ${10}^{-3}$~${10}^{-4}$, respectively. Also, the effect of relative humidity and sliding distance on adhesion-induced tip wear was discussed. It was found that the tip wear has more severe for harder test materials. Finally, the probable wear mechanism was analyzed from the adhesive and abrasive interaction point of view.

A Study on Characteristics of the Precision Machined Surfaces by AFM Measurement (AFM 측정법에 의한 초정밀 가공면의 특성 평가 연구)

  • Kim, Jong-Kwan;Lee, Gab-Jo;Jung, Jong-Soo
    • Transactions of the Korean Society of Machine Tool Engineers
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    • v.16 no.1
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    • pp.80-85
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    • 2007
  • High speed cutting is a machining process which cuts materials with the fast movement and rotation of a spindle in a machine tool. High speed cutting leaves a plastically deformed layer on the machined surface. This deformed layer affects in various forms to the surface roughness of machined parts such as the dimensional instability, the micro crack. The surface roughness is called surface integrity which is very important in precision cutting. This paper aims to study on the machined surfaces characteristics of aluminum alloy and brass by AFM(Atomic force microscope) measurement. The objective is contribution to ultra- precision cutting by exhibit foundation data of surface roughness and tool wear when parts are cutting with diamond tool at the factory.

Wear Characteristics of Atomic Force Microscope Tip

  • Chung, Koo-Hyun;Kim, Dae-Eun
    • International Journal of Precision Engineering and Manufacturing
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    • v.5 no.2
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    • pp.39-45
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    • 2004
  • Atomic Force Microscope (AFM) has been widely used in micro/nano-scale studies and applications for the last few decades. In this work, wear characteristics of silicon-based AFM tip was investigated. AFM tip shape was observed using a high resolution SEM and the wear coefficient was approximately calculated based on Archard's wear equation. It was shown that the wear coefficient of Si and ${Si}_3$$N_4$ tips were in the range of ${10}^{-1}$~${10}^{-3}$and ${10}^{-3}$~${10}^{-4}$, respectively. Also, the effect of relative humidity and sliding distance on adhesion-induced tip wear was investigated. It was found that the tip wear has more severe for harder counter surface materials. Finally, the probable wear mechanism was analyzed from the adhesive and abrasive interaction point of view.