The Transactions of the Korean Institute of Power Electronics (전력전자학회논문지)

The Korean Institute of Power Electronics (전력전자학회)
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Capacitance Value Analysis of Sub-module Test Circuit for MMC-based HVDC System

MMC 기반 HVDC 시스템용 서브모듈 시험회로의 커패시터 용량 분석

  • Seo, Byuong-Jun (Dept. of Electrical Eng., Pukyong National University) ;
  • Park, Kwon-Sik (Dept. of Electrical Eng., Pukyong National University) ;
  • Jo, Kwang-Rae (Dept. of Electrical Eng., Pukyong National University) ;
  • Nho, Eui-Cheol (Dept. of Electrical Eng., Pukyong National University) ;
  • Kim, Heung-Geun (Dept. of Electrical Eng., Kyungpook National University) ;
  • Chun, Tae-Won (Dept. of Electrical Eng., University of Ulsan) ;
  • Kim, Tae-Jin (Power Conversion & System for Renewable Energy research Center, KERI) ;
  • Lee, Jong-Pil (Power Conversion & System for Renewable Energy research Center, KERI)
  • Received : 2018.09.30
  • Accepted : 2018.11.16
  • Published : 2018.12.20
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Abstract

This study considers the design of a submodule test circuit for the modular multi-level converter (MMC)-based HVDC systems. A novel submodule test circuit is proposed to provide not only an AC but also a DC component to the submodule current. However, the current waveforms depend on the capacitor voltages. Therefore, determining the capacitance value of the test circuit is important. Finding a proper capacitance value is easy when the proposed analysis method is used. Simulation and experimental results show the usefulness of the proposed method.

Keywords

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Fig. 1. HVDC station using modular multi-level converter.

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Fig. 2. SM test circuit providing both AC and DC current component.

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Fig. 3. Switching state and current waveforms of SM test circuit.

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Fig. 4. Waveforms of iI, iR, iCEN and vCEN.

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Fig. 5. Relation between Ccen and vSM,error with simulation parameter.

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Fig. 6. Waveforms with the variation of Ccen.

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Fig. 7. Relation between Ccen and vSM,error with experimental parameter.

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Fig. 8. Experimental waveforms of vcen, iI, iR and icen (vcen: 20 [V/div], iI, iR: 50 [A/div], icen: 100 [A/div]).

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Fig. 9. Experimental waveforms of vCI , iIU, iID and iI (vCI :20 [V/div], iIU, iID, iI: 50 [A/div]).

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Fig. 10. Experimental waveforms of vCR , iRU, iRD and iR (vCR :20 [V/div], iRU, iRD, iR: 50 [A/div]).

TABLE I SIMULATION PARAMETERS

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TABLE II EXPERIMENTAL PARAMETERS

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TABLE III EXPERIMENTAL RESULTS

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References

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