DOI QR코드

DOI QR Code

Extraction of Series Arc Signals Based on Wavelet Transform in an Indoor Wiring System

  • Ji, Hong-Keun (National Forensic Service Busan Institute, Forensic Safety Section) ;
  • Cho, Young-Jin (National Forensic Service Busan Institute, Forensic Safety Section) ;
  • Wang, Guoming (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) ;
  • Hwang, Seong-Cheol (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) ;
  • Kil, Gyung-Suk (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University)
  • Received : 2017.01.21
  • Accepted : 2017.06.08
  • Published : 2017.08.25

Abstract

This paper dealt with the extraction of series arc signals based on wavelet transform in order to improve the accuracy of arc detection in indoor wiring systems. Three types of arc sources including a cord-cord, a terminal-cord, and an outlet-plug were fabricated to simulate typical arc defects. An arc generator fabricated according to UL 1699 was used to generate arcs. The optimal mother wavelet was selected as bior1.5 by calculating the correlation coefficients between the detected single current pulse and the wavelet. The detected arc current signals were then decomposed into eight levels using the discrete wavelet transform that implements the multi-resolution analysis method. By analyzing the decomposed components, the detail components D6, D7, and D8 were associated with arc signals, which were used for signal reconstruction. From the result, it was verified that the proposed method can be used for the extraction of the series arc signal from the AC mains, which is expected to be applied to further analysis of arc signals in indoor wiring systems.

Keywords

References

  1. UL 1699, Arc-Fault Circuit Interrupters, 2006.
  2. I. K . Kim, D. W. Park, S. Y. Choi, C. Y. Park, H. K. Kim, and G. S. Kil, J. Korean Inst. Electr. Electron. Mater. Eng., 21, 182 (2008).
  3. G. S. Kil, K. S. Jung, D. W. Park, S. J. Kim, and J. S. Han, J. Korean Inst. Electr. Electron. Mater. Eng., 23, 554 (2010). [DOI: http://dx.doi.org/10.4313/JKEM.2010.23.7.554]
  4. C. E. Restrego, Proc. Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts (IEEE, Pittsburgh, PA, USA, 2007) p. 115. [DOI: http://dx.doi.org/10.1109/HOLM.2007.4318203]
  5. D. W. Park, I. K. Kim, S. Y. Choi, and G. S. Kil, Proc. the International Conference on Condition Monitoring and Diagnosis (Beijing, China 2009) [DOI: http://dx.doi.org/10.1109/CMD.2008.4580385]
  6. G. D. Gregory and G. W. Scott, IEEE Trans. Ind. Appl., 34, 928 (2002). [DOI: http://dx.doi.org/10.1109/28.720431]
  7. G. D. Gregory, K. Wong, and R. F. Dvorak, IEEE Trans. Ind. Appl., 40, 1006 (2004). [DOI: http://dx.doi.org/10.1109/TIA.2004.831287]
  8. S. Song, F. Wang, and G. Cheng, Trans. Electr. Electron. Mater., 15, 182 (2014). [DOI: http://dx.doi.org/10.4313/TEEM.2014.15.4.182]
  9. X. Ma, C. Zhou, and I. J. Kemp, IEEE Trans. Dielectr. Electr. Insul., 9, 446 (2002). [DOI: http://dx.doi.org/10.1109/TDEI.2002.1007709]
  10. X. Zhou, C. Zhou, and I. J. Kemp, IEEE Trans. Dielectr. Electr. Insul., 12, 586(2005). [DOI: http://dx.doi.org/10.1109/TDEI.2005.1453464]
  11. G. M. Wang, S. J. Kim, G. S. Kil, and S. W. Kim, IEEE Trans. Dielectr. Electr. Insul., 24, 200 (2017). [DOI: http://dx.doi.org/10.1109/TDEI.2016.005969]
  12. X. Ma, C. Zhou, and I. J. Kemp, IEEE Electr. Insul. Mag., 18, 37 (2002). [DOI: http://dx.doi.org/10.1109/57.995398]
  13. A. T. Carvalho, A.C.S. Lima, C.F.F.C. Cunha, and M. Petraglia, Measurement, 77, 122 (2015). [DOI: http://dx.doi.org/10.1016/j.measurement.2015.07.050]
  14. I. Shim, J. J. Soraghan, and W. H. Siew, IEEE Electr. Insul. Mag., 17, 6 (2001). [DOI: http://dx.doi.org/10.1109/57.901611]
  15. C. S. Chang, J. Jin, C. Chang, T. Hoshino, M. Hanai, and N. Kobayashi, IEEE Trans. Power Del., 20, 1363 (2005). [DOI: http://dx.doi.org/10.1109/TPWRD.2004.839187]
  16. L. Satish and B. Nazneen, IEEE Trans. Dielectr. Electr. Insul., 10, 354 (2003). [DOI: http://dx.doi.org/10.1109/TDEI.2003.1194122]
  17. J. Li, T. Jiang, S. Grzybowski, and C. Cheng, IEEE Trans. Dielectr. Electr. Insul., 17, 1705 (2010). [DOI: http://dx.doi.org/10.1109/TDEI.2010.5658220]
  18. L. Yang, M. D. Judd, and C. J. Bennoch, The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004 (IEEE, Boulder, CO, USA, 2004) p. 166. [DOI: http://dx.doi.org/10.1109/CEIDP.2004.1364215]