Extraction of Series Arc Signals Based on Wavelet Transform in an Indoor Wiring System |
Ji, Hong-Keun
(National Forensic Service Busan Institute, Forensic Safety Section)
Cho, Young-Jin (National Forensic Service Busan Institute, Forensic Safety Section) Wang, Guoming (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) Hwang, Seong-Cheol (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) Kil, Gyung-Suk (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) |
1 | UL 1699, Arc-Fault Circuit Interrupters, 2006. |
2 | I. K . Kim, D. W. Park, S. Y. Choi, C. Y. Park, H. K. Kim, and G. S. Kil, J. Korean Inst. Electr. Electron. Mater. Eng., 21, 182 (2008). |
3 | G. S. Kil, K. S. Jung, D. W. Park, S. J. Kim, and J. S. Han, J. Korean Inst. Electr. Electron. Mater. Eng., 23, 554 (2010). [DOI: http://dx.doi.org/10.4313/JKEM.2010.23.7.554] |
4 | C. E. Restrego, Proc. Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts (IEEE, Pittsburgh, PA, USA, 2007) p. 115. [DOI: http://dx.doi.org/10.1109/HOLM.2007.4318203] |
5 | D. W. Park, I. K. Kim, S. Y. Choi, and G. S. Kil, Proc. the International Conference on Condition Monitoring and Diagnosis (Beijing, China 2009) [DOI: http://dx.doi.org/10.1109/CMD.2008.4580385] |
6 | G. D. Gregory and G. W. Scott, IEEE Trans. Ind. Appl., 34, 928 (2002). [DOI: http://dx.doi.org/10.1109/28.720431] |
7 | G. D. Gregory, K. Wong, and R. F. Dvorak, IEEE Trans. Ind. Appl., 40, 1006 (2004). [DOI: http://dx.doi.org/10.1109/TIA.2004.831287] DOI |
8 | S. Song, F. Wang, and G. Cheng, Trans. Electr. Electron. Mater., 15, 182 (2014). [DOI: http://dx.doi.org/10.4313/TEEM.2014.15.4.182] DOI |
9 | X. Ma, C. Zhou, and I. J. Kemp, IEEE Trans. Dielectr. Electr. Insul., 9, 446 (2002). [DOI: http://dx.doi.org/10.1109/TDEI.2002.1007709] DOI |
10 | X. Zhou, C. Zhou, and I. J. Kemp, IEEE Trans. Dielectr. Electr. Insul., 12, 586(2005). [DOI: http://dx.doi.org/10.1109/TDEI.2005.1453464] DOI |
11 | G. M. Wang, S. J. Kim, G. S. Kil, and S. W. Kim, IEEE Trans. Dielectr. Electr. Insul., 24, 200 (2017). [DOI: http://dx.doi.org/10.1109/TDEI.2016.005969] DOI |
12 | X. Ma, C. Zhou, and I. J. Kemp, IEEE Electr. Insul. Mag., 18, 37 (2002). [DOI: http://dx.doi.org/10.1109/57.995398] DOI |
13 | A. T. Carvalho, A.C.S. Lima, C.F.F.C. Cunha, and M. Petraglia, Measurement, 77, 122 (2015). [DOI: http://dx.doi.org/10.1016/j.measurement.2015.07.050] |
14 | I. Shim, J. J. Soraghan, and W. H. Siew, IEEE Electr. Insul. Mag., 17, 6 (2001). [DOI: http://dx.doi.org/10.1109/57.901611] |
15 | C. S. Chang, J. Jin, C. Chang, T. Hoshino, M. Hanai, and N. Kobayashi, IEEE Trans. Power Del., 20, 1363 (2005). [DOI: http://dx.doi.org/10.1109/TPWRD.2004.839187] DOI |
16 | L. Satish and B. Nazneen, IEEE Trans. Dielectr. Electr. Insul., 10, 354 (2003). [DOI: http://dx.doi.org/10.1109/TDEI.2003.1194122] DOI |
17 | J. Li, T. Jiang, S. Grzybowski, and C. Cheng, IEEE Trans. Dielectr. Electr. Insul., 17, 1705 (2010). [DOI: http://dx.doi.org/10.1109/TDEI.2010.5658220] DOI |
18 | L. Yang, M. D. Judd, and C. J. Bennoch, The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. LEOS 2004 (IEEE, Boulder, CO, USA, 2004) p. 166. [DOI: http://dx.doi.org/10.1109/CEIDP.2004.1364215] |