Journal of Korea Society of Industrial Information Systems (한국산업정보학회논문지)

Korea Society of Industrial Information Systems (한국산업정보학회)
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Development of a ROM Writer for Shmoo Test of a Flash Memory Integrated into the MCU

MCU에 내장된 플레쉬 메모리 오동작 테스트 가능한 ROM Writer 개발

  • 김태선 (경운대학교 항공전자공학과) ;
  • 박차훈 (경운대학교 항공전자공학과)
  • Received : 2015.08.03
  • Accepted : 2015.08.20
  • Published : 2015.08.30
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Abstract

This paper presents the development of a ROM writer for shmoo test of a flash memory integrated into the MCU(Micro Controller Unit). A shmoo test is a graphical display of the response of a component or system varying over a range of conditions and inputs. Often used to represent the results of the testing of complex electronic systems such as computers or integrated circuits such as DRAMs, ASICs or microprocessors. A shmoo test and data write time(32k) of the development ROM writer is 6.4 seconds, which was improved by about 20% compared to the rate of the currently used ROM writer.

본 논문은 MCU에 내장된 플레쉬 메모리의 오동작 테스트를 shmoo 테스트 기법을 사용하고, 이 기능을 내장한 롬라이트 개발에 관한 논문이다. shmoo 테스트는 다양한 입력조건에 대한 응답을 도표로 나타내고 분석하는 기법으로, 마이크로프로세서, ASIC 및 메모리와 같은 집적회로 또는 컴퓨터 시스템의 성능분석의 기법으로 사용된다. 개발된 롬라이터는 Shmoo 검사를 수행하고 Flash 32K의 쓰기를 수행하였을 때 6.4s 정도의 시간이 소요되었으며, 이는 현재 사용하고 있는 ROM Writer의 속도에 비해 약 20% 정도 향상되었다.

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References

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