반도체디스플레이기술학회지 (Journal of the Semiconductor & Display Technology)

한국반도체디스플레이기술학회 (The Korean Society Of Semiconductor & Display Technology)
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자동외관검사를 위한 검출위치 클러스터링 알고리즘

Detected Point Clustering Algorithm For Automatic Visual Inspection

  • 유선중 (동양미래대학교 기계과)
  • Ryu, Sun Joong (Dept. of Mechanical Engineering, Dongyang Mirae University)
  • 투고 : 2014.07.03
  • 심사 : 2014.08.29
  • 발행 : 2014.09.30
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초록

Visual defect inspection for electronics parts manufacturing processes is comprised of 2 steps - automatic visual inspection by machine and inspection by human inspectors. It is necessary that spatial points which were detected by the machine should be adequately clustered for subsequent human inspection. This research deals with the spatial clustering algorithm for the purpose of process productivity improvement. Distribution based clustering is newly developed and experimentally confirmed to show better clustering efficiency than existing algorithm - area based clustering.

키워드

참고문헌

  1. S. P. Cunningham and S. MacKinnon "Statistical Methods for Visual Defect Metrology," IEEE Trans. On Semiconductor Manufacturing, Vol. 11, No. 1, pp. 48-53, 1998. https://doi.org/10.1109/66.661284
  2. S. Banerjee and A. Rosenfeld, "Model-based cluster analysis," Pattern Recognit., Vol. 26, pp. 963-974, 1993. https://doi.org/10.1016/0031-3203(93)90061-Z
  3. K. W. Ko, Y. J. Lee, B.-W. Choi and J.-H. Kim, "Development of Automatic Visual Inspection for the Defect of Compact Camera Module," ICCAS2005, pp. 2414-2417, 2005.