JSTS:Journal of Semiconductor Technology and Science

  • 제13권2호
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  • Pages.114-126
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  • 2013
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  • 1598-1657(pISSN)
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  • 2233-4866(eISSN)
대한전자공학회 (The Institute of Electronics and Information Engineers)
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Electromagnetic Susceptibility Analysis of I/O Buffers Using the Bulk Current Injection Method

  • Kwak, SangKeun (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Nah, Wansoo (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Kim, SoYoung (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University)
  • 투고 : 2012.05.14
  • 심사 : 2012.10.30
  • 발행 : 2013.04.30
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초록

In this paper, we present a set of methodologies to model the electromagnetic susceptibility (EMS) testing of I/O buffers for mobile system memory based on the bulk current injection (BCI) method. An efficient equivalent circuit model is developed for the current injection probe, line impedance stabilization network (LISN), printed circuit board (PCB), and package. The simulation results show good correlation with the measurements and thus, the work presented here will enable electromagnetic susceptibility analysis at the integrated circuit (IC) design stage.

키워드

참고문헌

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피인용 문헌

  1. Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method vol.14, pp.2, 2014, https://doi.org/10.5573/JSTS.2014.14.2.202