References
- I. Chahine, M. Kadi, E. Gaboriaud, A. Louis and B. Mazari, "Characterization and modeling of the susceptibility of integrated circuits to conducted electromagnetic disturbances up to 1 GHz," IEEE Transactions on Electromagnetic Compatibility, vol. 50, no. 2, pp. 285-293, May 2008. https://doi.org/10.1109/TEMC.2008.918983
- IET Electrical Measurement Series 8, A Handbook for EMC Testing and Measurement, London, United Kingdom, 1996.
- ISO 11452-4 Standard - Road Vehicles- Component Test Methods for Electrical Disturbances From Narrowband Radiated Electromagnetic Energy-Part 4: Bulk Current Injection (BCI), Apr. 2005.
- IEC 62132, Ed.1: Integrated Circuit -Measurements of electromagnetic Immunity - 150kHz to 1GHz.
- IEC 62132-3, Ed.1: Integrated Circuit - Measurements of Electromagnetic Immunity - 150kHz to 1GHz, Part 3: Bulk Current Injection (BCI) Method.
- S. B. Dhia, M. Ramdani and E. Sicard, Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility., NY.: Springer, 2006, pp.141.
- A. Boyer, B. Li, S. B. Dhia, B. Vrignon and C. Lemoine, "Development of Immunity Model of a Phase-Locked Loop," 2011 Asia-Pacific Symposium on Electromagnetic Compatibility, 16-19, May 2011.
- B. Vrignon, M. Deobarro, A. Boyer, S. Ben Dhia, "Bulk Current Injection modeling and validation on passive loads and an active circuit," 2011 Asia- Pacific Symposium on Electromagnetic Compatibility, XX-1XX, May 2011.
- M. F. Sultan, "Modeling of a bulk current injection setup for susceptibility threshold measurements," IEEE Int. Symp. on Electromagnetic Compatibility. Proceedings, San Diego, CA, 1986, pp. 188-195.
- F. Grassi, F. Marliani and S. A. Pignari, "Circuit modeling of injection probes for bulk current injection," IEEE Transactions on Electromagnetic Compatibility, vol. 49, no. 3, pp. 563-576, Aug. 2007. https://doi.org/10.1109/TEMC.2007.902385
- F. Grassi, F. Marliani, and S. A. Pignari, "SPICE modeling of BCI probes accounting for the frequency-dependent behavior of the ferrite core," XIXth General Assembly of International Union of Radio Science (U.R.S.I.), Chicago, IL, USA, Aug. 7-16, 2008.
- Weber, Lutz, Dickmann, Stefan, "SPICE simulation method for BCI component tests," 18th International Zurich Symposium on Electromagnetic Compatibility, Volume: Issue: , 24-28, pp. 265-268, Sept. 2007.
- S. Miropolsky, S. Frei, "Modeling of Bulk Current Injection (BCI) Setups for Virtual Automotive IC tests," EMC Europe, 2010.
- F. Lafon, F. de Daran, M. Ramdani, R. Perdriau, M. Drissi, "Immunity Modeling of Integrated Circuits: An Industrial Case," IEICE Transactions on Communications, Volume E93.B, Issue 7, pp. 1723-1730, 2010. https://doi.org/10.1587/transcom.E93.B.1723
- Clayton R. Paul, Introduction to Electromagnetic Compatibility, 2nd Edition, Hoboken, N.J.: Willey, 2006, pp. 518-520, pp.892-895.
- David M. Pozar, Microwave Engineering 3rd edition, Hoboken, N.J.: Willey, 2005, pp. 183-189.
- Stephen H. Hall et al., Advanced Signal Integrity for High-Speed Digital System Design, Hoboken, NJ : John Wiley & Sons, 2009.
- N. Delorme, M. Belleville, J. Chilo, "Inductance and Capacitance Analytic Formulas for VLSI Interconnects," Electronic Letters, 23rd, vol. 32, no. 11, May 1996.
- MIL-STD-461E: Requirements for the Control of Electromagnetic Interference Characteristics of Subsystems and Equipment, August, 1999, pp.23.
- www.mentor.com.
Cited by
- Immunity Test for Semiconductor Integrated Circuits Considering Power Transfer Efficiency of the Bulk Current Injection Method vol.14, pp.2, 2014, https://doi.org/10.5573/JSTS.2014.14.2.202