DOI QR코드

DOI QR Code

Analysis of Effective Optic Axis and Equivalent Retardation of Composite Optically Anisotropic Film by Using Transmission Ellipsometry

투과형 타원법을 이용한 중첩된 광학이방성 막의 유효 광축 및 등가 리타데이션 해석

  • Ryu, Jang-Wi (Department of Molecular Science and Technology, Ajou University) ;
  • Kim, Sang-Youl (Department of Molecular Science and Technology, Ajou University)
  • 류장위 (아주대학교 분자과학기술학과) ;
  • 김상열 (아주대학교 분자과학기술학과)
  • Published : 2009.10.25

Abstract

Polarization characteristics of a composite film composed of two optically anisotropic films are analyzed. The procedure to determine the effective optics axis and the equivalent retardation of the composite film is suggested in conjuction with the related ellipsometric expressions. The explicit expressions of the effective optic axis and the equivalent retardation of a non-uniform anisotropic film are derived when all optic axes are parallel. Those expressions of the composite film where optic axes of two constituting anisotropic films are not parallel are also derived. Dependence of those expressions on the polarization state of the incident light or the azimuth angle of the linearly polarized light and their limit when applied to practical use are discussed.

두개 이상의 광학이방성 막이 중첩된 복합막의 편광특성을 분석하였다. 투과형 타원법에서 사용되는 타원상수의 표현을 이용하여 복합 위상지연막의 유효 광축과 등가 리타데이션을 결정하는 방법을 제시하였다. 막 평면 방향으로 광축은 나란하지만 위상지연의 정도가 균일하지 않은 불균일 위상지연판의 등가 리타데이션 및 유효 광축 방향을 나타내는 수학적 표현을 유도하였다. 또한 두개의 광학 이방성막이 광축이 나란하지 않게 중첩되어 있는 복합막의 등가 리타데이션 및 유효 광축 표현을 제시하고 입사광이 직선편광일 때 방위각 의존성 검토를 통해 이들을 실제로 적용할 때 마주치는 한계를 논의하였다.

Keywords

References

  1. D.-K. Yang and S.-T. Wu, Fundamentals of Liquid Crystal Devices (John Wiley & Sons, Chichester, UK, 2006), Chapter 1, pp. 8-9.
  2. S. S. Kim, H. J. Kim, and S. D. Lee, Display Engineering (Chungbum Publishing Co., Ltd., Korea, 2005), Chapter 3-5.
  3. P. Yeh and C. Gu, Optics of Liquid Crystal Displays (John Wiley & Sons, New York, USA, 1999), Chapter 1.
  4. 佐藤 勇介, Technology information association, LCD/polarization of optical material.control of birefringence.measurement and application (Technology Information Association, 2008), Chapter 5.
  5. H. Murai, K. Egawa, J. Takashima, H. Naito, and N. Nakatsuka, “Useful inspection method of rubbing polyimide film with optical anisotropy using reflection ellipsometry,” SID 06 Digest, 490-493 (2006).
  6. H. Murai, K. Egawa, J. Takashima, H. Naito, and N. Nakatsuka, “Mura-detection method by using a slit-beam ellipsometer,” J. SID 15, 281-286 (2007).
  7. I. Hirosawa, “Method of characterizing rubbed polyimide film for liquid crystal display devices using reflection ellipsometry,” Jpn. J. Appl. Phys. 35, 5873-5875 (1996). https://doi.org/10.1143/JJAP.35.5873
  8. I. Hirosawa, “Relation between molecular orientation and rubbing strength observed by reflection ellipsometry,” Jpn. J. Appl. Phys. 36, 5192-5196 (1997). https://doi.org/10.1143/JJAP.36.5192
  9. B. F. Macdonald, W. Zheng, and R. J. Cole, “Reflection anisotropy spectroscopy: a probe of rubbed polyimide liquid crystal alignment layers,” J. Appl. Phys. 93, 4442-4446 (2003). https://doi.org/10.1063/1.1559423
  10. S. Y. Kim, Ellipsometry (Ajou University Press, Korea, 2000), Chapter 3-4.
  11. H. R. Kim and S. Y. Kim, “Precise measurement of optical anisotropy of rubbed PI on patterned glass and its nanoscale variation,” J. Opt. Soc. Korea, to be submitted.

Cited by

  1. Ellipsometric Expressions of Multilayered Substrate Coated with a Uniaxially Anisotropic Alignment Layer vol.24, pp.5, 2013, https://doi.org/10.3807/KJOP.2013.24.5.271
  2. Tunable Quarter-wave Plate Consisting of Two Phase Retarders and the Design of a Circular Polarizer vol.25, pp.3, 2014, https://doi.org/10.3807/KJOP.2014.25.3.150
  3. Precise Measurement of Ultra Small Retardation of Rubbed Polyimide Alignment Layer Using an Improved Transmission Ellipsometer vol.24, pp.2, 2013, https://doi.org/10.3807/KJOP.2013.24.2.077